Abstract

Ultrashort-pulse lasers are now commonly used for multiphoton microscopy, and optimizing the performance of such systems requires careful characterization of the pulses at the tight focus of the microscope objective. We solve this problem by use of a collinear geometry in frequency-resolved optical gating that uses type II second-harmonic generation and that allows the full N.A. of the microscope objective to be used. We then demonstrate the technique by measuring the intensity and the phase of a 22-fs pulse focused by a 20×, 0.4-N.A. air objective.

© 1998 Optical Society of America

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