Abstract

We measure the cross-phase modulation (XPM) nonlinear indices of optical materials resulting from the interaction of an ultrashort pump pulse at 800  nm with a weak ultrashort probe pulse at 400  nm through the direct measurement of the optical phase change, using frequency-resolved optical gating. The materials studied include fused silica SiO2, borosilicate glass (BK-7), βBBO, and KD*P. This method results in a XPM nonlinear index that is in agreement with calculations based on nonlinear indices from previous self-phase modulation measurements.

© 1998 Optical Society of America

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