Abstract

The differential modulation of the attenuation bands in a long-period grating is used for simultaneous sensing of axial strain and temperature. A grating fabricated in a conventional optical fiber is demonstrated for concurrent measurements of strain over a range of 2100 µ and temperature over a range of 125  °C, with maximum errors of 58 µ and 1  °C, respectively.

© 1997 Optical Society of America

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References

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  1. F. Farahi, D. J. Webb, J. D. C. Jones, and D. A. Jackson, J. Lightwave Technol. 8, 138 (1990).
    [Crossref]
  2. S. Y. Huang, J. N. Blake, and B. Y. Kim, J. Lightwave Technol. 8, 23 (1990).
    [Crossref]
  3. A. M. Vengsarkar, W. C. Michie, L. Jankovic, B. Culshaw, and R. O. Claus, J. Lightwave Technol. 12, 170 (1994).
    [Crossref]
  4. M. G. Xu, J. L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
    [Crossref]
  5. H. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
    [Crossref]
  6. A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, J. E. Sipe, and T. E. Ergodan, J. Lightwave Technol. 14, 58 (1996).
    [Crossref]
  7. A. M. Vengsarkar, Laser Focus World 32(6) , 243 (1996).
  8. V. Bhatia and A. M. Vengsarkar, Opt. Lett. 21, 692 (1996).
    [Crossref] [PubMed]

1996 (4)

H. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[Crossref]

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, J. E. Sipe, and T. E. Ergodan, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

A. M. Vengsarkar, Laser Focus World 32(6) , 243 (1996).

V. Bhatia and A. M. Vengsarkar, Opt. Lett. 21, 692 (1996).
[Crossref] [PubMed]

1994 (2)

A. M. Vengsarkar, W. C. Michie, L. Jankovic, B. Culshaw, and R. O. Claus, J. Lightwave Technol. 12, 170 (1994).
[Crossref]

M. G. Xu, J. L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[Crossref]

1990 (2)

F. Farahi, D. J. Webb, J. D. C. Jones, and D. A. Jackson, J. Lightwave Technol. 8, 138 (1990).
[Crossref]

S. Y. Huang, J. N. Blake, and B. Y. Kim, J. Lightwave Technol. 8, 23 (1990).
[Crossref]

Archambault, J. L.

M. G. Xu, J. L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[Crossref]

Bhatia, V.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, J. E. Sipe, and T. E. Ergodan, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

V. Bhatia and A. M. Vengsarkar, Opt. Lett. 21, 692 (1996).
[Crossref] [PubMed]

Blake, J. N.

S. Y. Huang, J. N. Blake, and B. Y. Kim, J. Lightwave Technol. 8, 23 (1990).
[Crossref]

Claus, R. O.

A. M. Vengsarkar, W. C. Michie, L. Jankovic, B. Culshaw, and R. O. Claus, J. Lightwave Technol. 12, 170 (1994).
[Crossref]

Culshaw, B.

A. M. Vengsarkar, W. C. Michie, L. Jankovic, B. Culshaw, and R. O. Claus, J. Lightwave Technol. 12, 170 (1994).
[Crossref]

Dakin, J. P.

M. G. Xu, J. L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[Crossref]

Ergodan, T. E.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, J. E. Sipe, and T. E. Ergodan, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Farahi, F.

F. Farahi, D. J. Webb, J. D. C. Jones, and D. A. Jackson, J. Lightwave Technol. 8, 138 (1990).
[Crossref]

Huang, S. Y.

S. Y. Huang, J. N. Blake, and B. Y. Kim, J. Lightwave Technol. 8, 23 (1990).
[Crossref]

Jackson, D. A.

F. Farahi, D. J. Webb, J. D. C. Jones, and D. A. Jackson, J. Lightwave Technol. 8, 138 (1990).
[Crossref]

Jankovic, L.

A. M. Vengsarkar, W. C. Michie, L. Jankovic, B. Culshaw, and R. O. Claus, J. Lightwave Technol. 12, 170 (1994).
[Crossref]

Jones, J. D. C.

F. Farahi, D. J. Webb, J. D. C. Jones, and D. A. Jackson, J. Lightwave Technol. 8, 138 (1990).
[Crossref]

Judkins, J. B.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, J. E. Sipe, and T. E. Ergodan, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Kersey, A. D.

H. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[Crossref]

Kim, B. Y.

S. Y. Huang, J. N. Blake, and B. Y. Kim, J. Lightwave Technol. 8, 23 (1990).
[Crossref]

Lemaire, P. J.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, J. E. Sipe, and T. E. Ergodan, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Michie, W. C.

A. M. Vengsarkar, W. C. Michie, L. Jankovic, B. Culshaw, and R. O. Claus, J. Lightwave Technol. 12, 170 (1994).
[Crossref]

Patrick, H.

H. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[Crossref]

Pedrazzani, J. R.

H. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[Crossref]

Reekie, L.

M. G. Xu, J. L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[Crossref]

Sipe, J. E.

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, J. E. Sipe, and T. E. Ergodan, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

Vengsarkar, A. M.

H. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[Crossref]

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, J. E. Sipe, and T. E. Ergodan, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

A. M. Vengsarkar, Laser Focus World 32(6) , 243 (1996).

V. Bhatia and A. M. Vengsarkar, Opt. Lett. 21, 692 (1996).
[Crossref] [PubMed]

A. M. Vengsarkar, W. C. Michie, L. Jankovic, B. Culshaw, and R. O. Claus, J. Lightwave Technol. 12, 170 (1994).
[Crossref]

Webb, D. J.

F. Farahi, D. J. Webb, J. D. C. Jones, and D. A. Jackson, J. Lightwave Technol. 8, 138 (1990).
[Crossref]

Williams, G. M.

H. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[Crossref]

Xu, M. G.

M. G. Xu, J. L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[Crossref]

Electron. Lett. (1)

M. G. Xu, J. L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[Crossref]

IEEE Photon. Technol. Lett. (1)

H. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[Crossref]

J. Lightwave Technol. (4)

A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, J. E. Sipe, and T. E. Ergodan, J. Lightwave Technol. 14, 58 (1996).
[Crossref]

F. Farahi, D. J. Webb, J. D. C. Jones, and D. A. Jackson, J. Lightwave Technol. 8, 138 (1990).
[Crossref]

S. Y. Huang, J. N. Blake, and B. Y. Kim, J. Lightwave Technol. 8, 23 (1990).
[Crossref]

A. M. Vengsarkar, W. C. Michie, L. Jankovic, B. Culshaw, and R. O. Claus, J. Lightwave Technol. 12, 170 (1994).
[Crossref]

Laser Focus World (1)

A. M. Vengsarkar, Laser Focus World 32(6) , 243 (1996).

Opt. Lett. (1)

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Figures (3)

Fig. 1
Fig. 1

Experimental setup for simultaneous measurement of strain and temperature with a long-period grating.

Fig. 2
Fig. 2

Comparison between measured (symbols) and actual (curves) values of temperature (top) and strain (bottom) with the conventional grating. The strain magnitude was varied only after the completion of a measurement cycle.

Fig. 3
Fig. 3

Comparison between measured (symbols) and actual (curves) values of temperature (top) and strain (bottom) with the strain-insensitive grating. The strain magnitude was varied only after the completion of a measurement cycle.

Equations (2)

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AΔT+BΔ=Δλ1,
CΔT+DΔ=Δλ2,

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