Abstract

An autocorrelation measurement of femtosecond laser pulse duration using the Kerr-lens mechanism is demonstrated. This technique can also be used as a sensitive and absolutely calibratable method for measuring ultrafast optical nonlinearities. A method that uses an electronic spectral-filtering scheme is proposed for determining the frequency chirp of pulses by interferometric autocorrelation.

© 1997 Optical Society of America

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References

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  1. See, for example, J. L. A. Chilla and O. E. Martinez, Opt. Lett. 16, 39 (1991); D. J. Kane and R. Trebino, Opt. Lett. 18, 823 (1993).
    [CrossRef] [PubMed]
  2. J. A. Armstrong, Appl. Phys. Lett. 10, 16 (1967).
    [CrossRef]
  3. J. I. Dadap, G. B. Focht, D. H. Reitze, and M. C. Downer, Opt. Lett. 16, 499 (1991).
    [CrossRef] [PubMed]
  4. P. P. Ho and R. R. Alfano, Phys. Rev. A 20, 2170 (1979).
    [CrossRef]
  5. H. S. Albercht, P. Heist, J. Kleinschmidt, D. van Lap, and T. Schroeder, Meas. Sci. Technol. 4, 1 (1993); P. Heist and J. Kleinschmidt, Opt. Lett. 19, 1961 (1994).
    [CrossRef] [PubMed]
  6. M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
    [CrossRef]
  7. T. Xia, M. Sheik-Bahae, D. J. Hagan, and E. W. Van Stryland, Opt. Lett. 18, 317 (1994).
    [CrossRef]
  8. M. Sheik-Bahae, A. A. Said, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland, Opt. Eng. 30, 1228 (1991).
    [CrossRef]
  9. M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
    [CrossRef]
  10. J.-C. Diels and W. Rudolph, Ultrashort Laser Pulse Phenomena (Academic, San Diego, Calif., 1996).
  11. J.-C. Diels, J. J. Fontaine, I. C. McMichael, and F. Simoni, Appl. Opt. 24, 1270 (1985).
    [CrossRef]
  12. K. Mogi, K. Naganuma, and H. Yamada, Jpn. J. Appl. Phys. 27, 2078 (1988).
    [CrossRef]

1994 (1)

1993 (1)

H. S. Albercht, P. Heist, J. Kleinschmidt, D. van Lap, and T. Schroeder, Meas. Sci. Technol. 4, 1 (1993); P. Heist and J. Kleinschmidt, Opt. Lett. 19, 1961 (1994).
[CrossRef] [PubMed]

1991 (4)

M. Sheik-Bahae, A. A. Said, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland, Opt. Eng. 30, 1228 (1991).
[CrossRef]

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

See, for example, J. L. A. Chilla and O. E. Martinez, Opt. Lett. 16, 39 (1991); D. J. Kane and R. Trebino, Opt. Lett. 18, 823 (1993).
[CrossRef] [PubMed]

J. I. Dadap, G. B. Focht, D. H. Reitze, and M. C. Downer, Opt. Lett. 16, 499 (1991).
[CrossRef] [PubMed]

1990 (1)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

1988 (1)

K. Mogi, K. Naganuma, and H. Yamada, Jpn. J. Appl. Phys. 27, 2078 (1988).
[CrossRef]

1985 (1)

1979 (1)

P. P. Ho and R. R. Alfano, Phys. Rev. A 20, 2170 (1979).
[CrossRef]

1967 (1)

J. A. Armstrong, Appl. Phys. Lett. 10, 16 (1967).
[CrossRef]

Albercht, H. S.

H. S. Albercht, P. Heist, J. Kleinschmidt, D. van Lap, and T. Schroeder, Meas. Sci. Technol. 4, 1 (1993); P. Heist and J. Kleinschmidt, Opt. Lett. 19, 1961 (1994).
[CrossRef] [PubMed]

Alfano, R. R.

P. P. Ho and R. R. Alfano, Phys. Rev. A 20, 2170 (1979).
[CrossRef]

Armstrong, J. A.

J. A. Armstrong, Appl. Phys. Lett. 10, 16 (1967).
[CrossRef]

Chilla, J. L. A.

Dadap, J. I.

Diels, J.-C.

J.-C. Diels, J. J. Fontaine, I. C. McMichael, and F. Simoni, Appl. Opt. 24, 1270 (1985).
[CrossRef]

J.-C. Diels and W. Rudolph, Ultrashort Laser Pulse Phenomena (Academic, San Diego, Calif., 1996).

Downer, M. C.

Focht, G. B.

Fontaine, J. J.

Hagan, D. J.

T. Xia, M. Sheik-Bahae, D. J. Hagan, and E. W. Van Stryland, Opt. Lett. 18, 317 (1994).
[CrossRef]

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

M. Sheik-Bahae, A. A. Said, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland, Opt. Eng. 30, 1228 (1991).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Heist, P.

H. S. Albercht, P. Heist, J. Kleinschmidt, D. van Lap, and T. Schroeder, Meas. Sci. Technol. 4, 1 (1993); P. Heist and J. Kleinschmidt, Opt. Lett. 19, 1961 (1994).
[CrossRef] [PubMed]

Ho, P. P.

P. P. Ho and R. R. Alfano, Phys. Rev. A 20, 2170 (1979).
[CrossRef]

Hutchings, D. C.

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

Kleinschmidt, J.

H. S. Albercht, P. Heist, J. Kleinschmidt, D. van Lap, and T. Schroeder, Meas. Sci. Technol. 4, 1 (1993); P. Heist and J. Kleinschmidt, Opt. Lett. 19, 1961 (1994).
[CrossRef] [PubMed]

Martinez, O. E.

McMichael, I. C.

Mogi, K.

K. Mogi, K. Naganuma, and H. Yamada, Jpn. J. Appl. Phys. 27, 2078 (1988).
[CrossRef]

Naganuma, K.

K. Mogi, K. Naganuma, and H. Yamada, Jpn. J. Appl. Phys. 27, 2078 (1988).
[CrossRef]

Reitze, D. H.

Rudolph, W.

J.-C. Diels and W. Rudolph, Ultrashort Laser Pulse Phenomena (Academic, San Diego, Calif., 1996).

Said, A. A.

M. Sheik-Bahae, A. A. Said, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland, Opt. Eng. 30, 1228 (1991).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Schroeder, T.

H. S. Albercht, P. Heist, J. Kleinschmidt, D. van Lap, and T. Schroeder, Meas. Sci. Technol. 4, 1 (1993); P. Heist and J. Kleinschmidt, Opt. Lett. 19, 1961 (1994).
[CrossRef] [PubMed]

Sheik-Bahae, M.

T. Xia, M. Sheik-Bahae, D. J. Hagan, and E. W. Van Stryland, Opt. Lett. 18, 317 (1994).
[CrossRef]

M. Sheik-Bahae, A. A. Said, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland, Opt. Eng. 30, 1228 (1991).
[CrossRef]

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Simoni, F.

Soileau, M. J.

M. Sheik-Bahae, A. A. Said, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland, Opt. Eng. 30, 1228 (1991).
[CrossRef]

van Lap, D.

H. S. Albercht, P. Heist, J. Kleinschmidt, D. van Lap, and T. Schroeder, Meas. Sci. Technol. 4, 1 (1993); P. Heist and J. Kleinschmidt, Opt. Lett. 19, 1961 (1994).
[CrossRef] [PubMed]

Van Stryland, E. W.

T. Xia, M. Sheik-Bahae, D. J. Hagan, and E. W. Van Stryland, Opt. Lett. 18, 317 (1994).
[CrossRef]

M. Sheik-Bahae, A. A. Said, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland, Opt. Eng. 30, 1228 (1991).
[CrossRef]

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Wei, T. H.

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Xia, T.

Yamada, H.

K. Mogi, K. Naganuma, and H. Yamada, Jpn. J. Appl. Phys. 27, 2078 (1988).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. Lett. (1)

J. A. Armstrong, Appl. Phys. Lett. 10, 16 (1967).
[CrossRef]

IEEE J. Quantum Electron. (2)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

Jpn. J. Appl. Phys. (1)

K. Mogi, K. Naganuma, and H. Yamada, Jpn. J. Appl. Phys. 27, 2078 (1988).
[CrossRef]

Meas. Sci. Technol. (1)

H. S. Albercht, P. Heist, J. Kleinschmidt, D. van Lap, and T. Schroeder, Meas. Sci. Technol. 4, 1 (1993); P. Heist and J. Kleinschmidt, Opt. Lett. 19, 1961 (1994).
[CrossRef] [PubMed]

Opt. Eng. (1)

M. Sheik-Bahae, A. A. Said, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland, Opt. Eng. 30, 1228 (1991).
[CrossRef]

Opt. Lett. (3)

Phys. Rev. A (1)

P. P. Ho and R. R. Alfano, Phys. Rev. A 20, 2170 (1979).
[CrossRef]

Other (1)

J.-C. Diels and W. Rudolph, Ultrashort Laser Pulse Phenomena (Academic, San Diego, Calif., 1996).

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Figures (4)

Fig. 1
Fig. 1

Calculated transmittance change as a function of average nonlinear phase shift ΔΦ0 assuming a 2% transmittance aperture with nonlinear sample position at z=±0.85z0. Also shown is calculation for a 2% transmitting on-axis disk with the sample at z=±0.5z0. The dashed curves are linear fits to the calculated curves. For comparison, the change of transmittance for a two-photon absorber placed at the focus is also plotted.

Fig. 2
Fig. 2

Typical arrangement for a collinear Kerr-lens autocorrelator.

Fig. 3
Fig. 3

Measured Kerr-lens autocorrelations of 100-fs Ti:sapphire laser pulses. (a) Comparison of measured data with calculated autocorrelation of a sech2 pulse. (b) Two autocorrelation traces measured at average powers of 80 and 40  mW, indicating the dynamic linearity of the scheme.

Fig. 4
Fig. 4

Interferometric autocorrelation of 10-fs pulses calculated assuming that G=2 for (a) unchirped and (b) chirped sech2 pulses.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

Iout=AIin+BIin2,
SNL(τ)=1+2f(t)f(t+τ)dt+f(t)f(t+τ)×cos(2ωτ+2Δϕ)dt+2f1/2(t)×f3/2(t+τ)cos(ωτ+Δϕ)dt+2f3/2(t)f1/2(t+τ)cos(ωτ+Δϕ)dt,
Slin(τ)=1+[f(t)f(t+τ)]1/2cos(ωτ+Δϕ)dt.
S(τ)=1+2f(t)f(t+τ)dt+Gf(t)f(t+τ)cos(2ωτ+2Δϕ)dt.

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