Abstract

We have developed a simple, wide-optical-bandwidth, high-resolution system for performing rapid optical frequency domain reflectometry measurements and applied it to multidimensional tomographic imaging. The source is a grating-tuned external cavity semiconductor laser with a tuning capability of 25  nm in 100  ms. We discuss system performance and show a two-dimensional optical coherence tomography image of a thin glass sandwich structure as a preliminary demonstration of the systems depth and resolution capabilities.

© 1997 Optical Society of America

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  1. U. Haberland, W. Rutten, V. Blazek, and H. J. Schmitt, Proc. SPIE 2389, 503 (1995).
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  7. G. Mussi, N. Gisin, R. Passy, and J. P. von der Weid, Electron. Lett. 32, 926 (1996).
    [CrossRef]
  8. J. P. von der Weid, R. Passy, and N. Gisin, J. Lightwave Technol. 13, 954 (1995).
    [CrossRef]
  9. R. Passy, N. Gisin, and J. P. von der Weid, IEEE Photon. Technol. Lett. 7, 667 (1995).
    [CrossRef]
  10. W. V. Sorin, IEEE Photon. Technol. Lett. 2, 902 (1990).
    [CrossRef]
  11. K. Takada, IEEE Photon. Technol. Lett. 4, 1069 (1992).
    [CrossRef]
  12. D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
    [CrossRef] [PubMed]
  13. G. A. Coquin and K. W. Cheung, Electron. Lett. 24, 599 (1988).
    [CrossRef]
  14. W. R. Trutna and L. F. Stokes, J. Lightwave Technol. 11, 1279 (1993).
    [CrossRef]

1996

G. Mussi, N. Gisin, R. Passy, and J. P. von der Weid, Electron. Lett. 32, 926 (1996).
[CrossRef]

1995

J. P. von der Weid, R. Passy, and N. Gisin, J. Lightwave Technol. 13, 954 (1995).
[CrossRef]

R. Passy, N. Gisin, and J. P. von der Weid, IEEE Photon. Technol. Lett. 7, 667 (1995).
[CrossRef]

U. Haberland, W. Rutten, V. Blazek, and H. J. Schmitt, Proc. SPIE 2389, 503 (1995).
[CrossRef]

1994

R. Passy, N. Gisin, J. P. von der Weid, and H. H. Gilgen, J. Lightwave Technol. 12, 1622 (1994).
[CrossRef]

1993

U. Glombitza and E. Brinkmeyer, J. Lightwave Technol. 11, 1377 (1993).
[CrossRef]

S. Venkatesh and W. V. Sorin, J. Lightwave Technol. 11, 1694 (1993).
[CrossRef]

W. R. Trutna and L. F. Stokes, J. Lightwave Technol. 11, 1279 (1993).
[CrossRef]

1992

K. Takada, IEEE Photon. Technol. Lett. 4, 1069 (1992).
[CrossRef]

1991

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

1990

W. V. Sorin, IEEE Photon. Technol. Lett. 2, 902 (1990).
[CrossRef]

1989

H. Barfuss and E. Brinkmeyer, J. Lightwave Technol. 7, 3 (1989).
[CrossRef]

1988

G. A. Coquin and K. W. Cheung, Electron. Lett. 24, 599 (1988).
[CrossRef]

1985

D. Uttam and B. Culshaw, J. Lightwave Technol. 3, 971 (1985).
[CrossRef]

Barfuss, H.

H. Barfuss and E. Brinkmeyer, J. Lightwave Technol. 7, 3 (1989).
[CrossRef]

Blazek, V.

U. Haberland, W. Rutten, V. Blazek, and H. J. Schmitt, Proc. SPIE 2389, 503 (1995).
[CrossRef]

Brinkmeyer, E.

U. Glombitza and E. Brinkmeyer, J. Lightwave Technol. 11, 1377 (1993).
[CrossRef]

H. Barfuss and E. Brinkmeyer, J. Lightwave Technol. 7, 3 (1989).
[CrossRef]

Chang, W.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Cheung, K. W.

G. A. Coquin and K. W. Cheung, Electron. Lett. 24, 599 (1988).
[CrossRef]

Coquin, G. A.

G. A. Coquin and K. W. Cheung, Electron. Lett. 24, 599 (1988).
[CrossRef]

Culshaw, B.

D. Uttam and B. Culshaw, J. Lightwave Technol. 3, 971 (1985).
[CrossRef]

Flotte, T.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Fujimoto, J. G.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Gilgen, H. H.

R. Passy, N. Gisin, J. P. von der Weid, and H. H. Gilgen, J. Lightwave Technol. 12, 1622 (1994).
[CrossRef]

Gisin, N.

G. Mussi, N. Gisin, R. Passy, and J. P. von der Weid, Electron. Lett. 32, 926 (1996).
[CrossRef]

J. P. von der Weid, R. Passy, and N. Gisin, J. Lightwave Technol. 13, 954 (1995).
[CrossRef]

R. Passy, N. Gisin, and J. P. von der Weid, IEEE Photon. Technol. Lett. 7, 667 (1995).
[CrossRef]

R. Passy, N. Gisin, J. P. von der Weid, and H. H. Gilgen, J. Lightwave Technol. 12, 1622 (1994).
[CrossRef]

Glombitza, U.

U. Glombitza and E. Brinkmeyer, J. Lightwave Technol. 11, 1377 (1993).
[CrossRef]

Gregory, K.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Haberland, U.

U. Haberland, W. Rutten, V. Blazek, and H. J. Schmitt, Proc. SPIE 2389, 503 (1995).
[CrossRef]

Hee, M. R.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Huang, D.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Lin, C. P.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Mussi, G.

G. Mussi, N. Gisin, R. Passy, and J. P. von der Weid, Electron. Lett. 32, 926 (1996).
[CrossRef]

Passy, R.

G. Mussi, N. Gisin, R. Passy, and J. P. von der Weid, Electron. Lett. 32, 926 (1996).
[CrossRef]

J. P. von der Weid, R. Passy, and N. Gisin, J. Lightwave Technol. 13, 954 (1995).
[CrossRef]

R. Passy, N. Gisin, and J. P. von der Weid, IEEE Photon. Technol. Lett. 7, 667 (1995).
[CrossRef]

R. Passy, N. Gisin, J. P. von der Weid, and H. H. Gilgen, J. Lightwave Technol. 12, 1622 (1994).
[CrossRef]

Puliafito, C. A.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Rutten, W.

U. Haberland, W. Rutten, V. Blazek, and H. J. Schmitt, Proc. SPIE 2389, 503 (1995).
[CrossRef]

Schmitt, H. J.

U. Haberland, W. Rutten, V. Blazek, and H. J. Schmitt, Proc. SPIE 2389, 503 (1995).
[CrossRef]

Schuman, J. S.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Sorin, W. V.

S. Venkatesh and W. V. Sorin, J. Lightwave Technol. 11, 1694 (1993).
[CrossRef]

W. V. Sorin, IEEE Photon. Technol. Lett. 2, 902 (1990).
[CrossRef]

Stinson, W. G.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Stokes, L. F.

W. R. Trutna and L. F. Stokes, J. Lightwave Technol. 11, 1279 (1993).
[CrossRef]

Swanson, E. A.

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

Takada, K.

K. Takada, IEEE Photon. Technol. Lett. 4, 1069 (1992).
[CrossRef]

Trutna, W. R.

W. R. Trutna and L. F. Stokes, J. Lightwave Technol. 11, 1279 (1993).
[CrossRef]

Uttam, D.

D. Uttam and B. Culshaw, J. Lightwave Technol. 3, 971 (1985).
[CrossRef]

Venkatesh, S.

S. Venkatesh and W. V. Sorin, J. Lightwave Technol. 11, 1694 (1993).
[CrossRef]

von der Weid, J. P.

G. Mussi, N. Gisin, R. Passy, and J. P. von der Weid, Electron. Lett. 32, 926 (1996).
[CrossRef]

J. P. von der Weid, R. Passy, and N. Gisin, J. Lightwave Technol. 13, 954 (1995).
[CrossRef]

R. Passy, N. Gisin, and J. P. von der Weid, IEEE Photon. Technol. Lett. 7, 667 (1995).
[CrossRef]

R. Passy, N. Gisin, J. P. von der Weid, and H. H. Gilgen, J. Lightwave Technol. 12, 1622 (1994).
[CrossRef]

Electron. Lett.

G. Mussi, N. Gisin, R. Passy, and J. P. von der Weid, Electron. Lett. 32, 926 (1996).
[CrossRef]

G. A. Coquin and K. W. Cheung, Electron. Lett. 24, 599 (1988).
[CrossRef]

IEEE Photon. Technol. Lett.

R. Passy, N. Gisin, and J. P. von der Weid, IEEE Photon. Technol. Lett. 7, 667 (1995).
[CrossRef]

W. V. Sorin, IEEE Photon. Technol. Lett. 2, 902 (1990).
[CrossRef]

K. Takada, IEEE Photon. Technol. Lett. 4, 1069 (1992).
[CrossRef]

J. Lightwave Technol.

D. Uttam and B. Culshaw, J. Lightwave Technol. 3, 971 (1985).
[CrossRef]

R. Passy, N. Gisin, J. P. von der Weid, and H. H. Gilgen, J. Lightwave Technol. 12, 1622 (1994).
[CrossRef]

U. Glombitza and E. Brinkmeyer, J. Lightwave Technol. 11, 1377 (1993).
[CrossRef]

S. Venkatesh and W. V. Sorin, J. Lightwave Technol. 11, 1694 (1993).
[CrossRef]

H. Barfuss and E. Brinkmeyer, J. Lightwave Technol. 7, 3 (1989).
[CrossRef]

W. R. Trutna and L. F. Stokes, J. Lightwave Technol. 11, 1279 (1993).
[CrossRef]

J. P. von der Weid, R. Passy, and N. Gisin, J. Lightwave Technol. 13, 954 (1995).
[CrossRef]

Proc. SPIE

U. Haberland, W. Rutten, V. Blazek, and H. J. Schmitt, Proc. SPIE 2389, 503 (1995).
[CrossRef]

Science

D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
[CrossRef] [PubMed]

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Figures (4)

Fig. 1
Fig. 1

Schematic diagram of the experimental apparatus.

Fig. 2
Fig. 2

Optical spectra of tunable laser output with 0.1-nm resolution. Upper curve (upper scale), maximum (peak-hold) averaged spectrum under rapid scanning conditions; lower curve (lower scale), typical expanded 5× spectrum with no scanning.

Fig. 3
Fig. 3

Peak frequency (solid curve) and peak signal voltage (dotted curve) as a function of signal path mirror position. The frequency curve has a superposed linear fit curve (dashed curve) with slope 0.655 Hz/µm.

Fig. 4
Fig. 4

Logarithmic gray-scale image of the glass microslip sandwich structure. The gray scale has been calibrated to the 4% air–glass reflectivity of the surfaces at the top and bottom of the figure.

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