Abstract

We have developed a simple, wide-optical-bandwidth, high-resolution system for performing rapid optical frequency domain reflectometry measurements and applied it to multidimensional tomographic imaging. The source is a grating-tuned external cavity semiconductor laser with a tuning capability of 25  nm in 100  ms. We discuss system performance and show a two-dimensional optical coherence tomography image of a thin glass sandwich structure as a preliminary demonstration of the systems depth and resolution capabilities.

© 1997 Optical Society of America

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