Abstract

The second-order nonlinear optical coefficients d33, d31, and d15 of KTa0.52Nb0.48O3 epitaxial thin films grown upon MgO were studied by the standard Maker fringe method of an anisotropic medium. The measured d33=-84 pm/V is 2.8 times the d33 of LiNbO3. The refractive indices ne and no at several wavelengths were determined by TE and TM waveguide mode measurements. The data presented here point out the excellent qualities of KTa1-xNbxO3 films for use in integrated optics applications.

© 1997 Optical Society of America

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1996 (1)

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W. N. Herman and L. M. Hayden, J. Opt. Soc. Am. B 12, 1 (1995).
[CrossRef]

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J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

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S. Yilmaz, T. Venkatesan, and A. Gerhard-Multhaupt, Appl. Phys. Lett. 56, 2479 (1991).
[CrossRef]

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J. Hulliger, R. Gutmann, and P. Wagli, Thin Solid Films 175, 201 (1989).
[CrossRef]

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P. Gunter, Phys. Rep. 93, 199 (1982).
[CrossRef]

1970 (1)

J. Jerphagnon and S. K. Kurtz, J. Appl. Phys. 41, 1667 (1970).
[CrossRef]

1967 (1)

Feng, Z. C.

Gerhard-Multhaupt, A.

S. Yilmaz, T. Venkatesan, and A. Gerhard-Multhaupt, Appl. Phys. Lett. 56, 2479 (1991).
[CrossRef]

Guan, Q.

J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

Gunter, P.

P. Gunter, Phys. Rep. 93, 199 (1982).
[CrossRef]

Gutmann, R.

J. Hulliger, R. Gutmann, and P. Wagli, Thin Solid Films 175, 201 (1989).
[CrossRef]

Haas, W.

Hayden, L. M.

W. N. Herman and L. M. Hayden, J. Opt. Soc. Am. B 12, 1 (1995).
[CrossRef]

He, X. H.

Herman, W. N.

W. N. Herman and L. M. Hayden, J. Opt. Soc. Am. B 12, 1 (1995).
[CrossRef]

Hulliger, J.

J. Hulliger, R. Gutmann, and P. Wagli, Thin Solid Films 175, 201 (1989).
[CrossRef]

Jerphagnon, J.

J. Jerphagnon and S. K. Kurtz, J. Appl. Phys. 41, 1667 (1970).
[CrossRef]

Johannes, R.

Kurtz, S. K.

J. Jerphagnon and S. K. Kurtz, J. Appl. Phys. 41, 1667 (1970).
[CrossRef]

Lian, Y.

J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

Liu, Y.

J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

Schurman, M.

Shih, Y. H.

Stall, R. A.

Venkatesan, T.

S. Yilmaz, T. Venkatesan, and A. Gerhard-Multhaupt, Appl. Phys. Lett. 56, 2479 (1991).
[CrossRef]

Wagli, P.

J. Hulliger, R. Gutmann, and P. Wagli, Thin Solid Films 175, 201 (1989).
[CrossRef]

Wang, D.

J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

Wang, J.

J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

Wei, J.

J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

Yang, H.

J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

Ye, P.

J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

Yilmaz, S.

S. Yilmaz, T. Venkatesan, and A. Gerhard-Multhaupt, Appl. Phys. Lett. 56, 2479 (1991).
[CrossRef]

Zhang, H. Y.

Appl. Opt. (1)

Appl. Phys. Lett. (2)

J. Wang, Q. Guan, Y. Liu, J. Wei, D. Wang, Y. Lian, H. Yang, and P. Ye, Appl. Phys. Lett. 61, 2761 (1992).
[CrossRef]

S. Yilmaz, T. Venkatesan, and A. Gerhard-Multhaupt, Appl. Phys. Lett. 56, 2479 (1991).
[CrossRef]

J. Appl. Phys. (1)

J. Jerphagnon and S. K. Kurtz, J. Appl. Phys. 41, 1667 (1970).
[CrossRef]

J. Opt. Soc. Am. B (1)

W. N. Herman and L. M. Hayden, J. Opt. Soc. Am. B 12, 1 (1995).
[CrossRef]

Opt. Lett. (1)

Phys. Rep. (1)

P. Gunter, Phys. Rep. 93, 199 (1982).
[CrossRef]

Thin Solid Films (1)

J. Hulliger, R. Gutmann, and P. Wagli, Thin Solid Films 175, 201 (1989).
[CrossRef]

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