Abstract

Fractional Talbot images of optical gratings acting as periodic phase objects have been obtained by use of x rays of 0.069-nm wavelength from a third-generation synchrotron radiation source. Quantitative evaluation of the data obtained as a function of defocusing distance provides information on the lateral coherence of the beam as well as on the phase modulation in the object.

© 1997 Optical Society of America

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  1. H. F. Talbot, Phil. Mag., third series 9, 401 (1836).
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  3. V. Arrizón and E. López-Olazagasti, J. Opt. Soc. Am. A 12, 801 (1995).
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  6. R. Coïsson, Appl. Opt. 34, 904 (1995).
  7. A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, Rev. Sci. Instrum. 66, 5486 (1995).
  8. P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).
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  12. V. Arrizón and J. Ojeda-Castañeda, J. Opt. Soc. Am. A 9, 1801 (1992).
  13. H. Fujiwara, Opt. Acta 21, 861 (1974).
  14. J. P. Guigay, Optik 49, 121 (1977).
  15. K. Fezzaa, F. Comin, S. Marchesini, R. Coïsson, and M. Belakhovsky, “X-ray interferometry at ESRF using two coherent beams from Fresnel mirrors,” J. X-Ray Sci. Technol. (to be published).

1996

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

1995

1994

Ya.M. Hartman and A. Snigirev, in X-ray Microscopy IV (Bogorodskii Pechatnik, Moscow, 1994), pp. 429–432.

1992

1989

1985

A. I. Erko, V. V. Aristov, and B. Vidal, Diffraction X-ray Optics (IOP Publishing, Bristol, UK, 1996); V. V. Aristov, A. I. Erko, V. V. Martynov, Opt. Commun. 53, 159 (1985); Opt. Spectrosc. (USSR) 64, 376 (1988).

1980

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980).

Aristov, V. V.

A. I. Erko, V. V. Aristov, and B. Vidal, Diffraction X-ray Optics (IOP Publishing, Bristol, UK, 1996); V. V. Aristov, A. I. Erko, V. V. Martynov, Opt. Commun. 53, 159 (1985); Opt. Spectrosc. (USSR) 64, 376 (1988).

Arrizón, V.

Barrett, R.

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

Baruchel, J.

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

Belakhovsky, M.

K. Fezzaa, F. Comin, S. Marchesini, R. Coïsson, and M. Belakhovsky, “X-ray interferometry at ESRF using two coherent beams from Fresnel mirrors,” J. X-Ray Sci. Technol. (to be published).

Born, M.

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980).

Buffière, J. Y.

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

Cloetens, P.

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

Coïsson, R.

R. Coïsson, Appl. Opt. 34, 904 (1995).

K. Fezzaa, F. Comin, S. Marchesini, R. Coïsson, and M. Belakhovsky, “X-ray interferometry at ESRF using two coherent beams from Fresnel mirrors,” J. X-Ray Sci. Technol. (to be published).

Comin, F.

K. Fezzaa, F. Comin, S. Marchesini, R. Coïsson, and M. Belakhovsky, “X-ray interferometry at ESRF using two coherent beams from Fresnel mirrors,” J. X-Ray Sci. Technol. (to be published).

De Bougrenet de la Tocnaye, J. L.

Erko, A. I.

A. I. Erko, V. V. Aristov, and B. Vidal, Diffraction X-ray Optics (IOP Publishing, Bristol, UK, 1996); V. V. Aristov, A. I. Erko, V. V. Martynov, Opt. Commun. 53, 159 (1985); Opt. Spectrosc. (USSR) 64, 376 (1988).

Fezzaa, K.

K. Fezzaa, F. Comin, S. Marchesini, R. Coïsson, and M. Belakhovsky, “X-ray interferometry at ESRF using two coherent beams from Fresnel mirrors,” J. X-Ray Sci. Technol. (to be published).

Fujiwara, H.

H. Fujiwara, Opt. Acta 21, 861 (1974).

Guigay, J. P.

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

J. P. Guigay, Opt. Acta 18, 677 (1971).

J. P. Guigay, Optik 49, 121 (1977).

Hamam, H.

Hartman, Ya.M.

Ya.M. Hartman and A. Snigirev, in X-ray Microscopy IV (Bogorodskii Pechatnik, Moscow, 1994), pp. 429–432.

Kohn, V.

A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, Rev. Sci. Instrum. 66, 5486 (1995).

Kuznetsov, S.

A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, Rev. Sci. Instrum. 66, 5486 (1995).

Liu, L.

López-Olazagasti, E.

Marchesini, S.

K. Fezzaa, F. Comin, S. Marchesini, R. Coïsson, and M. Belakhovsky, “X-ray interferometry at ESRF using two coherent beams from Fresnel mirrors,” J. X-Ray Sci. Technol. (to be published).

Ojeda-Castañeda, J.

Pateyron-Salomé, M.

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

Peix, G.

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

Peyrin, F.

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

Schelokov, I.

A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, Rev. Sci. Instrum. 66, 5486 (1995).

Schlenker, M.

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

Snigirev, A.

A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, Rev. Sci. Instrum. 66, 5486 (1995).

Ya.M. Hartman and A. Snigirev, in X-ray Microscopy IV (Bogorodskii Pechatnik, Moscow, 1994), pp. 429–432.

Snigireva, I.

A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, Rev. Sci. Instrum. 66, 5486 (1995).

Talbot, H. F.

H. F. Talbot, Phil. Mag., third series 9, 401 (1836).

Vidal, B.

A. I. Erko, V. V. Aristov, and B. Vidal, Diffraction X-ray Optics (IOP Publishing, Bristol, UK, 1996); V. V. Aristov, A. I. Erko, V. V. Martynov, Opt. Commun. 53, 159 (1985); Opt. Spectrosc. (USSR) 64, 376 (1988).

Wolf, E.

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980).

Appl. Opt.

J. Opt. Soc. Am. A

J. Phys. D

P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996) ; P. Cloetens, M. Pateyron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, J. Appl. Phys. 81, 5878 (1997).

J. X-Ray Sci. Technol.

K. Fezzaa, F. Comin, S. Marchesini, R. Coïsson, and M. Belakhovsky, “X-ray interferometry at ESRF using two coherent beams from Fresnel mirrors,” J. X-Ray Sci. Technol. (to be published).

Opt. Acta

J. P. Guigay, Opt. Acta 18, 677 (1971).

H. Fujiwara, Opt. Acta 21, 861 (1974).

Opt. Commun.

A. I. Erko, V. V. Aristov, and B. Vidal, Diffraction X-ray Optics (IOP Publishing, Bristol, UK, 1996); V. V. Aristov, A. I. Erko, V. V. Martynov, Opt. Commun. 53, 159 (1985); Opt. Spectrosc. (USSR) 64, 376 (1988).

Optik

J. P. Guigay, Optik 49, 121 (1977).

Phil. Mag.

H. F. Talbot, Phil. Mag., third series 9, 401 (1836).

Rev. Sci. Instrum.

A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, Rev. Sci. Instrum. 66, 5486 (1995).

Other

Ya.M. Hartman and A. Snigirev, in X-ray Microscopy IV (Bogorodskii Pechatnik, Moscow, 1994), pp. 429–432.

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980).

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