Abstract

A division-of-amplitude photopolarimeter (DOAP) is described that uses a dielectric parallel-slab (PS) beam splitter that is coated with a high-reflectance metal on one side at oblique incidence. The instrument matrix of the PS DOAP is nonsingular, hence all four Stokes parameters can be measured simultaneously over a broad (UV–visible–IR) spectral range. The parallel, evenly spaced, reflected beams simplify interfacing of the PS DOAP with linear photodetector arrays for both single-wavelength and spectroscopic polarimetry. The PS DOAP has several degrees of freedom that can be controlled for optimum performance.

© 1996 Optical Society of America

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References

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  1. R. M. A. Azzam, Thin Solid Films 234, 371 (1993).
    [CrossRef]
  2. E. Collett, Surf. Sci. 96, 156 (1980).
    [CrossRef]
  3. R. A. Chipman, in Handbook of Optics, 2nd ed., M. Bass, ed. (McGraw-Hill, New York, 1995), Vol. 2, Chap. 22.
  4. R. M. A. Azzam, Opt. Acta. 29, 685 (1982); R. M. A. Azzam, Opt. Acta. 32, 1407 (1985).
    [CrossRef]
  5. K. Brudzewski, J. Mod. Opt. 38, 889 (1991).
    [CrossRef]
  6. S. Krishnan, J. Opt. Soc. Am. A 9, 1615 (1992).
    [CrossRef]
  7. H. Schwiecker, D. B. Dang, H. P. T. Thanh, J. Zilian, U. Schneider, J. Heland, Proc. SPIE 1746, 222 (1992).
    [CrossRef]
  8. R. M. A. Azzam, Opt. Lett. 10, 309 (1985).
    [CrossRef] [PubMed]
  9. R. M. A. Azzam, I. M. Elminyawi, A. M. El-Saba, J. Opt. Soc. Am. A 5, 681 (1988).
    [CrossRef]
  10. R. M. A. Azzam, E. Masetti, I. M. Elminyawi, F. G. Grosz, Rev. Sci. Instrum. 59, 84 (1988).
    [CrossRef]
  11. R. M. A. Azzam, Appl. Opt. 31, 3574 (1992).
    [CrossRef] [PubMed]
  12. T. Todorov, L. Nikolova, Opt. Lett. 17, 358 (1992).
    [CrossRef] [PubMed]
  13. R. M. A. Azzam, K. A. Giardina, J. Opt. Soc. Am. A 10, 1190 (1993).
    [CrossRef]
  14. Y. Cui, R. M. A. Azzam, Rev. Sci. Instrum. 66, 5552 (1995); Opt. Lett. 21, 89 (1996).
    [CrossRef] [PubMed]
  15. R. M. A. Azzam, A. G. Lopez, J. Opt. Soc. Am. A 6, 1513 (1989).
    [CrossRef]
  16. E. D. Palik, ed., Handbook of Optical Constants of Soilds (Academic, New York, 1985).

1995 (1)

Y. Cui, R. M. A. Azzam, Rev. Sci. Instrum. 66, 5552 (1995); Opt. Lett. 21, 89 (1996).
[CrossRef] [PubMed]

1993 (2)

1992 (4)

1991 (1)

K. Brudzewski, J. Mod. Opt. 38, 889 (1991).
[CrossRef]

1989 (1)

1988 (2)

R. M. A. Azzam, E. Masetti, I. M. Elminyawi, F. G. Grosz, Rev. Sci. Instrum. 59, 84 (1988).
[CrossRef]

R. M. A. Azzam, I. M. Elminyawi, A. M. El-Saba, J. Opt. Soc. Am. A 5, 681 (1988).
[CrossRef]

1985 (1)

1982 (1)

R. M. A. Azzam, Opt. Acta. 29, 685 (1982); R. M. A. Azzam, Opt. Acta. 32, 1407 (1985).
[CrossRef]

1980 (1)

E. Collett, Surf. Sci. 96, 156 (1980).
[CrossRef]

Azzam, R. M. A.

Y. Cui, R. M. A. Azzam, Rev. Sci. Instrum. 66, 5552 (1995); Opt. Lett. 21, 89 (1996).
[CrossRef] [PubMed]

R. M. A. Azzam, Thin Solid Films 234, 371 (1993).
[CrossRef]

R. M. A. Azzam, K. A. Giardina, J. Opt. Soc. Am. A 10, 1190 (1993).
[CrossRef]

R. M. A. Azzam, Appl. Opt. 31, 3574 (1992).
[CrossRef] [PubMed]

R. M. A. Azzam, A. G. Lopez, J. Opt. Soc. Am. A 6, 1513 (1989).
[CrossRef]

R. M. A. Azzam, I. M. Elminyawi, A. M. El-Saba, J. Opt. Soc. Am. A 5, 681 (1988).
[CrossRef]

R. M. A. Azzam, E. Masetti, I. M. Elminyawi, F. G. Grosz, Rev. Sci. Instrum. 59, 84 (1988).
[CrossRef]

R. M. A. Azzam, Opt. Lett. 10, 309 (1985).
[CrossRef] [PubMed]

R. M. A. Azzam, Opt. Acta. 29, 685 (1982); R. M. A. Azzam, Opt. Acta. 32, 1407 (1985).
[CrossRef]

Brudzewski, K.

K. Brudzewski, J. Mod. Opt. 38, 889 (1991).
[CrossRef]

Chipman, R. A.

R. A. Chipman, in Handbook of Optics, 2nd ed., M. Bass, ed. (McGraw-Hill, New York, 1995), Vol. 2, Chap. 22.

Collett, E.

E. Collett, Surf. Sci. 96, 156 (1980).
[CrossRef]

Cui, Y.

Y. Cui, R. M. A. Azzam, Rev. Sci. Instrum. 66, 5552 (1995); Opt. Lett. 21, 89 (1996).
[CrossRef] [PubMed]

Dang, D. B.

H. Schwiecker, D. B. Dang, H. P. T. Thanh, J. Zilian, U. Schneider, J. Heland, Proc. SPIE 1746, 222 (1992).
[CrossRef]

Elminyawi, I. M.

R. M. A. Azzam, E. Masetti, I. M. Elminyawi, F. G. Grosz, Rev. Sci. Instrum. 59, 84 (1988).
[CrossRef]

R. M. A. Azzam, I. M. Elminyawi, A. M. El-Saba, J. Opt. Soc. Am. A 5, 681 (1988).
[CrossRef]

El-Saba, A. M.

Giardina, K. A.

Grosz, F. G.

R. M. A. Azzam, E. Masetti, I. M. Elminyawi, F. G. Grosz, Rev. Sci. Instrum. 59, 84 (1988).
[CrossRef]

Heland, J.

H. Schwiecker, D. B. Dang, H. P. T. Thanh, J. Zilian, U. Schneider, J. Heland, Proc. SPIE 1746, 222 (1992).
[CrossRef]

Krishnan, S.

Lopez, A. G.

Masetti, E.

R. M. A. Azzam, E. Masetti, I. M. Elminyawi, F. G. Grosz, Rev. Sci. Instrum. 59, 84 (1988).
[CrossRef]

Nikolova, L.

Schneider, U.

H. Schwiecker, D. B. Dang, H. P. T. Thanh, J. Zilian, U. Schneider, J. Heland, Proc. SPIE 1746, 222 (1992).
[CrossRef]

Schwiecker, H.

H. Schwiecker, D. B. Dang, H. P. T. Thanh, J. Zilian, U. Schneider, J. Heland, Proc. SPIE 1746, 222 (1992).
[CrossRef]

Thanh, H. P. T.

H. Schwiecker, D. B. Dang, H. P. T. Thanh, J. Zilian, U. Schneider, J. Heland, Proc. SPIE 1746, 222 (1992).
[CrossRef]

Todorov, T.

Zilian, J.

H. Schwiecker, D. B. Dang, H. P. T. Thanh, J. Zilian, U. Schneider, J. Heland, Proc. SPIE 1746, 222 (1992).
[CrossRef]

Appl. Opt. (1)

J. Mod. Opt. (1)

K. Brudzewski, J. Mod. Opt. 38, 889 (1991).
[CrossRef]

J. Opt. Soc. Am. A (4)

Opt. Acta. (1)

R. M. A. Azzam, Opt. Acta. 29, 685 (1982); R. M. A. Azzam, Opt. Acta. 32, 1407 (1985).
[CrossRef]

Opt. Lett. (2)

Proc. SPIE (1)

H. Schwiecker, D. B. Dang, H. P. T. Thanh, J. Zilian, U. Schneider, J. Heland, Proc. SPIE 1746, 222 (1992).
[CrossRef]

Rev. Sci. Instrum. (2)

R. M. A. Azzam, E. Masetti, I. M. Elminyawi, F. G. Grosz, Rev. Sci. Instrum. 59, 84 (1988).
[CrossRef]

Y. Cui, R. M. A. Azzam, Rev. Sci. Instrum. 66, 5552 (1995); Opt. Lett. 21, 89 (1996).
[CrossRef] [PubMed]

Surf. Sci. (1)

E. Collett, Surf. Sci. 96, 156 (1980).
[CrossRef]

Thin Solid Films (1)

R. M. A. Azzam, Thin Solid Films 234, 371 (1993).
[CrossRef]

Other (2)

R. A. Chipman, in Handbook of Optics, 2nd ed., M. Bass, ed. (McGraw-Hill, New York, 1995), Vol. 2, Chap. 22.

E. D. Palik, ed., Handbook of Optical Constants of Soilds (Academic, New York, 1985).

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Figures (6)

Fig. 1
Fig. 1

Parallel-slab division-of-amplitude photopolarimeter.

Fig. 2
Fig. 2

Percentage of power as a function of angle of incidence for the first four orders reflected from a SiO2/Ag parallel slab at the 633-nm wavelength.

Fig. 3
Fig. 3

Normalized determinant of the instrument matrix as a function of angle of incidence for a PS DOAP using a SiO2/Ag or a SiO2/Al parallel slab at 633-nm wavelength.

Fig. 4
Fig. 4

Percentage of power as a function of wavelength for the first four beams reflected from a SiO2/Ag parallel slab at an 80° angle of incidence.

Fig. 5
Fig. 5

Normalized determinant of the instrument matrix as a function of wavelength at an 80° angle of incidence for a PS DOAP using a SiO2/Ag or a SiO2/Al parallel slab.

Fig. 6
Fig. 6

Normalized determinant of the instrument matrix as a function of angle of incidence for a PS DOAP using a ZnS/SiO2/Ag-coated slab at the 633-nm wavelength. The thickness of the ZnS thin-film coating is 30 nm.

Equations (4)

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i m = j = 0 3 a m j S j , m = 0 , 1 , 2 , . . . .
I = A S .
S = A 1 I .
det A = [ ( 1 / 8 ) Π q = 0 3 ( κ q r q ) ] [ 1 cos ( 2 ψ 0 ) ] [ 1 + cos ( 2 ψ 2 ) ] × [ sin ( 2 ψ 1 ) ] [ sin ( 2 ψ 3 ) ] [ sin ( Δ 1 Δ 3 ) ] .

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