Abstract

Interpixel cross talk that is due to diffraction and aberrations is, to some extent, unavoidable because of trade-offs in the design of holographic storage systems. Phase masks have been proposed to avoid problems encountered in Fourier-transform holographic recording, but they have other effects on pixel cross talk. We investigate the effect of using phase masks in the data-bearing object beam on the output interpixel cross talk in a holographic memory system.

© 1996 Optical Society of America

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References

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  1. F. Mok, M. Tackitt, H. Stoll, Opt. Lett. 16, 605 (1992).
    [CrossRef]
  2. J. Hong, I. McMichael, T. Chang, W. Christian, E. Paek, Opt. Eng. 34, 2193 (1995).
    [CrossRef]
  3. D. Psaltis, F. Mok, Sci. Am. 11, 70 (1995).
    [CrossRef]
  4. C. Denz, G. Pauliat, G. Roosen, T. Tschudi, Opt. Commun. 85, 171 (1991).
    [CrossRef]
  5. J. Heanue, M. Bashaw, L. Hesselink, Science 265, 749 (1994).
    [CrossRef] [PubMed]
  6. F. Vachss, I. McMichael, J. Hong, “Cross-erasure noise in high density holographic storage systems,” submitted to J. Opt. Soc. Am. B.
  7. X. Yi, P. Yeh, C. Gu, Opt. Lett. 19, 1580 (1994).
    [CrossRef] [PubMed]

1995

J. Hong, I. McMichael, T. Chang, W. Christian, E. Paek, Opt. Eng. 34, 2193 (1995).
[CrossRef]

D. Psaltis, F. Mok, Sci. Am. 11, 70 (1995).
[CrossRef]

1994

J. Heanue, M. Bashaw, L. Hesselink, Science 265, 749 (1994).
[CrossRef] [PubMed]

X. Yi, P. Yeh, C. Gu, Opt. Lett. 19, 1580 (1994).
[CrossRef] [PubMed]

1992

1991

C. Denz, G. Pauliat, G. Roosen, T. Tschudi, Opt. Commun. 85, 171 (1991).
[CrossRef]

Bashaw, M.

J. Heanue, M. Bashaw, L. Hesselink, Science 265, 749 (1994).
[CrossRef] [PubMed]

Chang, T.

J. Hong, I. McMichael, T. Chang, W. Christian, E. Paek, Opt. Eng. 34, 2193 (1995).
[CrossRef]

Christian, W.

J. Hong, I. McMichael, T. Chang, W. Christian, E. Paek, Opt. Eng. 34, 2193 (1995).
[CrossRef]

Denz, C.

C. Denz, G. Pauliat, G. Roosen, T. Tschudi, Opt. Commun. 85, 171 (1991).
[CrossRef]

Gu, C.

Heanue, J.

J. Heanue, M. Bashaw, L. Hesselink, Science 265, 749 (1994).
[CrossRef] [PubMed]

Hesselink, L.

J. Heanue, M. Bashaw, L. Hesselink, Science 265, 749 (1994).
[CrossRef] [PubMed]

Hong, J.

J. Hong, I. McMichael, T. Chang, W. Christian, E. Paek, Opt. Eng. 34, 2193 (1995).
[CrossRef]

F. Vachss, I. McMichael, J. Hong, “Cross-erasure noise in high density holographic storage systems,” submitted to J. Opt. Soc. Am. B.

McMichael, I.

J. Hong, I. McMichael, T. Chang, W. Christian, E. Paek, Opt. Eng. 34, 2193 (1995).
[CrossRef]

F. Vachss, I. McMichael, J. Hong, “Cross-erasure noise in high density holographic storage systems,” submitted to J. Opt. Soc. Am. B.

Mok, F.

Paek, E.

J. Hong, I. McMichael, T. Chang, W. Christian, E. Paek, Opt. Eng. 34, 2193 (1995).
[CrossRef]

Pauliat, G.

C. Denz, G. Pauliat, G. Roosen, T. Tschudi, Opt. Commun. 85, 171 (1991).
[CrossRef]

Psaltis, D.

D. Psaltis, F. Mok, Sci. Am. 11, 70 (1995).
[CrossRef]

Roosen, G.

C. Denz, G. Pauliat, G. Roosen, T. Tschudi, Opt. Commun. 85, 171 (1991).
[CrossRef]

Stoll, H.

Tackitt, M.

Tschudi, T.

C. Denz, G. Pauliat, G. Roosen, T. Tschudi, Opt. Commun. 85, 171 (1991).
[CrossRef]

Vachss, F.

F. Vachss, I. McMichael, J. Hong, “Cross-erasure noise in high density holographic storage systems,” submitted to J. Opt. Soc. Am. B.

Yeh, P.

Yi, X.

Opt. Commun.

C. Denz, G. Pauliat, G. Roosen, T. Tschudi, Opt. Commun. 85, 171 (1991).
[CrossRef]

Opt. Eng.

J. Hong, I. McMichael, T. Chang, W. Christian, E. Paek, Opt. Eng. 34, 2193 (1995).
[CrossRef]

Opt. Lett.

Sci. Am.

D. Psaltis, F. Mok, Sci. Am. 11, 70 (1995).
[CrossRef]

Science

J. Heanue, M. Bashaw, L. Hesselink, Science 265, 749 (1994).
[CrossRef] [PubMed]

Other

F. Vachss, I. McMichael, J. Hong, “Cross-erasure noise in high density holographic storage systems,” submitted to J. Opt. Soc. Am. B.

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Figures (4)

Fig. 1
Fig. 1

Fourier-plane holographic recording geometry.

Fig. 2
Fig. 2

Data–phase patterns, degeneracy, and probability of occurrence (assuming equal and independent probability for 1, 0, and ±). Open and shaded regions denote 1 and 0 bit values, respectively, and phase is designated ±, corresponding to ±π/2.

Fig. 3
Fig. 3

Percent probability of occurrence for the various values of 1’s (open bars) and 0’s (filled bars) resulting from interpixel cross-talk noise in the presence of various phase mask patterns for F# 25.

Fig. 4
Fig. 4

Percent probability of occurence for the various values of 1’s and 0’s for F# 35.

Tables (1)

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Table 1 Cross-Talk Calculation Resultsa

Equations (2)

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A ( x , y ) = m n a mn exp ( j ϕ mn ) rect ( x mw w ) × rect ( y nw w ) ,
B ( x , y ) = m n a mn exp ( j ϕ mn ) g ( x mw ) g ( y nw ) , g ( x ) = 1 / 2 λF 1 / 2 λF sin c ( uw ) exp ( j 2 πux ) d u ,

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