Abstract

A dual-cavity interrogation method used to enhance the unambiguous measurement range of in-fiber Bragg grating sensors with high-resolution interferometric wavelength-shift detection is described. This novel technique is based on the use of two sets of fringes obtained with a stepped interferometric wavelength scanner with dual cavity lengths. We demonstrate the concept by interrogating an in-fiber grating temperature sensor with a stepped Michelson wavelength scanner.

© 1996 Optical Society of America

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