Abstract
We demonstrate what we believe to be the first experimental observation of self-trapping and self-deflection of a planar optical beam by the photorefractive effect in a semiconductor. The semiconductor material is indium phosphide doped with iron. We show that the observed focusing and defocusing effects follow the component of the two-wave-mixing space charge field that is in phase with the intensity pattern, whereas the spatial beam deflection effects follow the 90°-shifted component.
© 1996 Optical Society of America
Full Article | PDF ArticleMore Like This
Zheng-ming Sheng, Yiping Cui, Ning Cheng, and Yu Wei
J. Opt. Soc. Am. B 13(3) 584-589 (1996)
D. N. Christodoulides and T. H. Coskun
Opt. Lett. 21(16) 1220-1222 (1996)
D. N. Christodoulides and T. H. Coskun
Opt. Lett. 21(18) 1460-1462 (1996)