Abstract

We report a near-field optical microscopy experiment at λ = 10.6 μm, using an apertureless metallic tip functioning simultaneously in the atomic force microscopy tapping mode. The 17-nm optical resolution (λ/600) that we achieved confirms the validity and the potential of this concept for numerous applications.

© 1996 Optical Society of America

Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip

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