Abstract

An optical method is introduced for observation of temporally and spatially resolved frames that show how light propagates in diffusely scattering materials. The method permits videos with 100-fs resolution in time to be produced. The method utilizes short-coherence interferometry. The source of information is the speckle contrast. The temporal and spatial evolution of the multiple scattering process is demonstrated for several biological and industrial samples. A major objective of the method is to investigate the conditions for optimum coherence and optimum apertures to achieve high resolution in the short-coherence interferometry. One important result is that during the propagation a sharp photon horizon evolves, which is useful for the morphological analysis of volume scatterers.

© 1996 Optical Society of America

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References

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  1. X. Clivaz, F. Marquis-Weible, R. P. Salathe, R. P. Novak, H. H. Gilgen, Opt. Lett. 17, 4 (1992).
    [CrossRef] [PubMed]
  2. C. K. Hitzenberger, Appl. Opt. 31, 6637 (1992).
    [CrossRef] [PubMed]
  3. J. M. Schmitt, A. Knüttel, A. Gandjbakhche, R. F. Bonner, Proc. SPIE 1889, 197 (1993).
    [CrossRef]
  4. J. A. Izatt, M. R. Hee, G. M. Owen, E. A. Swanson, J. G. Fujimoto, Opt. Lett. 19, 590 (1994).
    [CrossRef] [PubMed]
  5. L. Suddeath, V. Sahai, A. Wisler, C. Burch, B. Chance, E. Sevick, Proc. SPIE 1888, 117 (1993).
    [CrossRef]
  6. Th. Dresel, G. Häusler, H. Venzke, Appl. Opt. 31, 919 (1992).
    [CrossRef] [PubMed]

1994

1993

L. Suddeath, V. Sahai, A. Wisler, C. Burch, B. Chance, E. Sevick, Proc. SPIE 1888, 117 (1993).
[CrossRef]

J. M. Schmitt, A. Knüttel, A. Gandjbakhche, R. F. Bonner, Proc. SPIE 1889, 197 (1993).
[CrossRef]

1992

Bonner, R. F.

J. M. Schmitt, A. Knüttel, A. Gandjbakhche, R. F. Bonner, Proc. SPIE 1889, 197 (1993).
[CrossRef]

Burch, C.

L. Suddeath, V. Sahai, A. Wisler, C. Burch, B. Chance, E. Sevick, Proc. SPIE 1888, 117 (1993).
[CrossRef]

Chance, B.

L. Suddeath, V. Sahai, A. Wisler, C. Burch, B. Chance, E. Sevick, Proc. SPIE 1888, 117 (1993).
[CrossRef]

Clivaz, X.

Dresel, Th.

Fujimoto, J. G.

Gandjbakhche, A.

J. M. Schmitt, A. Knüttel, A. Gandjbakhche, R. F. Bonner, Proc. SPIE 1889, 197 (1993).
[CrossRef]

Gilgen, H. H.

Häusler, G.

Hee, M. R.

Hitzenberger, C. K.

Izatt, J. A.

Knüttel, A.

J. M. Schmitt, A. Knüttel, A. Gandjbakhche, R. F. Bonner, Proc. SPIE 1889, 197 (1993).
[CrossRef]

Marquis-Weible, F.

Novak, R. P.

Owen, G. M.

Sahai, V.

L. Suddeath, V. Sahai, A. Wisler, C. Burch, B. Chance, E. Sevick, Proc. SPIE 1888, 117 (1993).
[CrossRef]

Salathe, R. P.

Schmitt, J. M.

J. M. Schmitt, A. Knüttel, A. Gandjbakhche, R. F. Bonner, Proc. SPIE 1889, 197 (1993).
[CrossRef]

Sevick, E.

L. Suddeath, V. Sahai, A. Wisler, C. Burch, B. Chance, E. Sevick, Proc. SPIE 1888, 117 (1993).
[CrossRef]

Suddeath, L.

L. Suddeath, V. Sahai, A. Wisler, C. Burch, B. Chance, E. Sevick, Proc. SPIE 1888, 117 (1993).
[CrossRef]

Swanson, E. A.

Venzke, H.

Wisler, A.

L. Suddeath, V. Sahai, A. Wisler, C. Burch, B. Chance, E. Sevick, Proc. SPIE 1888, 117 (1993).
[CrossRef]

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Figures (7)

Fig. 1
Fig. 1

Experimental setup.

Fig. 2
Fig. 2

Images of the scattering process with different coherence lengths and different kinds of observation.

Fig. 3
Fig. 3

Longitudinal extension of the impulse response versus the coherence length (polyester sample, penetration depth 1200 μm, illumination aperture 0.05).

Fig. 4
Fig. 4

Light scattering in PVC. The phantom is a compound of two differently scattering slabs.

Fig. 5
Fig. 5

Light scattering in human skin (in vitro). The stratum corneum and the dermis show stronger scattering than the rete malpighii.

Fig. 6
Fig. 6

Transversal observation of light, scattered around an absorbing obstacle (cross section).

Fig. 7
Fig. 7

Same experiment as in Fig. 6 but observation of the surface as shown in Fig. 1(b).

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