Abstract

Electronic speckle-shearing pattern interferometry is applied to yield whole-field phase maps corresponding to the curvature and twist distributions of a deformed specimen.

© 1996 Optical Society of America

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References

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  1. Y. Y. Hung, in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), Chap. 4, p. 51.
  2. P. K. Rastogi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 2, p. 41.
  3. P. S. Sirohi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 3, p. 99.
  4. Y. Y. Hung, C. Y. Liang, Appl. Opt. 18, 1046 (1979).
    [CrossRef] [PubMed]
  5. D. K. Sharma, R. S. Sirohi, M. P. Kothiyal, Appl. Opt. 23, 1542 (1984).
    [CrossRef] [PubMed]
  6. D. K. Sharma, N. Krishna Mohan, R. S. Sirohi, Opt. Commun. 57, 230 (1986).
    [CrossRef]

1986

D. K. Sharma, N. Krishna Mohan, R. S. Sirohi, Opt. Commun. 57, 230 (1986).
[CrossRef]

1984

1979

Hung, Y. Y.

Y. Y. Hung, C. Y. Liang, Appl. Opt. 18, 1046 (1979).
[CrossRef] [PubMed]

Y. Y. Hung, in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), Chap. 4, p. 51.

Kothiyal, M. P.

Krishna Mohan, N.

D. K. Sharma, N. Krishna Mohan, R. S. Sirohi, Opt. Commun. 57, 230 (1986).
[CrossRef]

Liang, C. Y.

Rastogi, P. K.

P. K. Rastogi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 2, p. 41.

Sharma, D. K.

D. K. Sharma, N. Krishna Mohan, R. S. Sirohi, Opt. Commun. 57, 230 (1986).
[CrossRef]

D. K. Sharma, R. S. Sirohi, M. P. Kothiyal, Appl. Opt. 23, 1542 (1984).
[CrossRef] [PubMed]

Sirohi, P. S.

P. S. Sirohi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 3, p. 99.

Sirohi, R. S.

D. K. Sharma, N. Krishna Mohan, R. S. Sirohi, Opt. Commun. 57, 230 (1986).
[CrossRef]

D. K. Sharma, R. S. Sirohi, M. P. Kothiyal, Appl. Opt. 23, 1542 (1984).
[CrossRef] [PubMed]

Appl. Opt.

Opt. Commun.

D. K. Sharma, N. Krishna Mohan, R. S. Sirohi, Opt. Commun. 57, 230 (1986).
[CrossRef]

Other

Y. Y. Hung, in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), Chap. 4, p. 51.

P. K. Rastogi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 2, p. 41.

P. S. Sirohi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 3, p. 99.

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Figures (4)

Fig. 1
Fig. 1

Schematic layout of an optical three-beam shearing interferometer.

Fig. 2
Fig. 2

Image acquisition by means of (a) a lens and a photographic plate and (b) a CCD camera.

Fig. 3
Fig. 3

Interference phase contours corresponding to the curvature distribution along the x direction.

Fig. 4
Fig. 4

Phase map representing the contours of constant twist.

Equations (3)

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Δ φ ( x δ x 2 , y ) = 4 π λ w x ( x δ x 2 , y ) δ x ,
Δ φ ( x + δ x 2 , y ) = 4 π λ w x ( x + δ x 2 , y ) δ x .
Δ [ Δ φ ( x , y ) ] = Δ φ ( x + δ x 2 , y ) Δ φ ( x δ x 2 , y ) = 4 π λ [ w x ( x + δ x 2 , y ) w x ( x δ x 2 , y ) ] δ x = 4 π λ 2 w x 2 δ x 2 ,

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