Abstract

We have measured the out-of-band transmittance (attenuation) for several narrow-band filters using two Fourier-transform infrared spectrometers in the wavelength range of 2–25 μm. Band-rejection filters are used to eliminate the power transmitted in the main band of the filter under investigation. Neutral-density filters are used for the reference measurement to reduce the effect of nonlinearity. Results from different optical arrangements are compared and discussed. This study demonstrates the feasibility of using Fourier-transform infrared instruments to measure a spectral transmittance of 10−6.

© 1995 Optical Society of America

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References

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  1. D. L. Stierwalt, Opt. Eng. 13, G115 (1974).
  2. D. L. Stierwalt, in Infrared Thin Films, R. P. Shimshock, ed., Vol. 39 of SPIE Critical Reviews (Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., 1991), p. 181.
  3. T. W. Merritt, J. V. Gavin, C. A. Burke, Proc. Soc. Photo-Opt. Instrum. Eng. 308, 45 (1981).
  4. K. L. Eckerle, J. J. Hsia, K. D. Mielenz, V. R. Weidner, NBS Measurement Services: Regular Spectral Transmittance, NBS Spec. Pub. 250–6 (1987).
  5. A. L. Migdall, B. Roop, G. J. Xai, Metrologia 28, 217 (1991).
    [CrossRef]
  6. A. L. Migdall, A. Frenkel, D. E. Kelleher, J. Res. Natl. Inst. Stand. Technol. 98, 691 (1993).
  7. D. A. C. Compton, J. Drab, H. S. Barr, Appl. Opt. 29, 1908 (1990).
    [CrossRef]
  8. D. B. Chase, Appl. Spectrosc. 38, 491 (1984).
    [CrossRef]
  9. T. Hirschfeld, in Fourier Transform Infrared Spectroscopy, J. R. Ferraro, L. J. Basile, eds. (Academic, New York, 1979), Vol. 2, Chap. 6, pp. 193–242.
  10. A. Frenkel, Z. M. Zhang, Opt. Lett. 19,1495 (1994).
    [CrossRef] [PubMed]
  11. Trade names and company products that are mentioned in the text or identified in an illustration are only to specify adequately the experimental procedure and equipment used. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the products are necessarily the best available for the purpose.
  12. H. A. MacLeod, Thin-Film Optical Filters (Hilger, London, 1969), Chap. 7, pp. 154–199.
  13. A. Thelen, Design of Optical Interference Coatings (McGraw-Hill, New York, 1989), Chap. 10, pp. 197–217.
  14. M. I. Flik, Z. M. Zhang, J. Quant. Spectrosc. Radiat. Transfer 47, 293 (1992).
    [CrossRef]

1994 (1)

1993 (1)

A. L. Migdall, A. Frenkel, D. E. Kelleher, J. Res. Natl. Inst. Stand. Technol. 98, 691 (1993).

1992 (1)

M. I. Flik, Z. M. Zhang, J. Quant. Spectrosc. Radiat. Transfer 47, 293 (1992).
[CrossRef]

1991 (1)

A. L. Migdall, B. Roop, G. J. Xai, Metrologia 28, 217 (1991).
[CrossRef]

1990 (1)

D. A. C. Compton, J. Drab, H. S. Barr, Appl. Opt. 29, 1908 (1990).
[CrossRef]

1987 (1)

K. L. Eckerle, J. J. Hsia, K. D. Mielenz, V. R. Weidner, NBS Measurement Services: Regular Spectral Transmittance, NBS Spec. Pub. 250–6 (1987).

1984 (1)

1981 (1)

T. W. Merritt, J. V. Gavin, C. A. Burke, Proc. Soc. Photo-Opt. Instrum. Eng. 308, 45 (1981).

1974 (1)

D. L. Stierwalt, Opt. Eng. 13, G115 (1974).

Barr, H. S.

D. A. C. Compton, J. Drab, H. S. Barr, Appl. Opt. 29, 1908 (1990).
[CrossRef]

Burke, C. A.

T. W. Merritt, J. V. Gavin, C. A. Burke, Proc. Soc. Photo-Opt. Instrum. Eng. 308, 45 (1981).

Chase, D. B.

Compton, D. A. C.

D. A. C. Compton, J. Drab, H. S. Barr, Appl. Opt. 29, 1908 (1990).
[CrossRef]

Drab, J.

D. A. C. Compton, J. Drab, H. S. Barr, Appl. Opt. 29, 1908 (1990).
[CrossRef]

Eckerle, K. L.

K. L. Eckerle, J. J. Hsia, K. D. Mielenz, V. R. Weidner, NBS Measurement Services: Regular Spectral Transmittance, NBS Spec. Pub. 250–6 (1987).

Flik, M. I.

M. I. Flik, Z. M. Zhang, J. Quant. Spectrosc. Radiat. Transfer 47, 293 (1992).
[CrossRef]

Frenkel, A.

A. Frenkel, Z. M. Zhang, Opt. Lett. 19,1495 (1994).
[CrossRef] [PubMed]

A. L. Migdall, A. Frenkel, D. E. Kelleher, J. Res. Natl. Inst. Stand. Technol. 98, 691 (1993).

Gavin, J. V.

T. W. Merritt, J. V. Gavin, C. A. Burke, Proc. Soc. Photo-Opt. Instrum. Eng. 308, 45 (1981).

Hirschfeld, T.

T. Hirschfeld, in Fourier Transform Infrared Spectroscopy, J. R. Ferraro, L. J. Basile, eds. (Academic, New York, 1979), Vol. 2, Chap. 6, pp. 193–242.

Hsia, J. J.

K. L. Eckerle, J. J. Hsia, K. D. Mielenz, V. R. Weidner, NBS Measurement Services: Regular Spectral Transmittance, NBS Spec. Pub. 250–6 (1987).

Kelleher, D. E.

A. L. Migdall, A. Frenkel, D. E. Kelleher, J. Res. Natl. Inst. Stand. Technol. 98, 691 (1993).

MacLeod, H. A.

H. A. MacLeod, Thin-Film Optical Filters (Hilger, London, 1969), Chap. 7, pp. 154–199.

Merritt, T. W.

T. W. Merritt, J. V. Gavin, C. A. Burke, Proc. Soc. Photo-Opt. Instrum. Eng. 308, 45 (1981).

Mielenz, K. D.

K. L. Eckerle, J. J. Hsia, K. D. Mielenz, V. R. Weidner, NBS Measurement Services: Regular Spectral Transmittance, NBS Spec. Pub. 250–6 (1987).

Migdall, A. L.

A. L. Migdall, A. Frenkel, D. E. Kelleher, J. Res. Natl. Inst. Stand. Technol. 98, 691 (1993).

A. L. Migdall, B. Roop, G. J. Xai, Metrologia 28, 217 (1991).
[CrossRef]

Roop, B.

A. L. Migdall, B. Roop, G. J. Xai, Metrologia 28, 217 (1991).
[CrossRef]

Stierwalt, D. L.

D. L. Stierwalt, Opt. Eng. 13, G115 (1974).

D. L. Stierwalt, in Infrared Thin Films, R. P. Shimshock, ed., Vol. 39 of SPIE Critical Reviews (Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., 1991), p. 181.

Thelen, A.

A. Thelen, Design of Optical Interference Coatings (McGraw-Hill, New York, 1989), Chap. 10, pp. 197–217.

Weidner, V. R.

K. L. Eckerle, J. J. Hsia, K. D. Mielenz, V. R. Weidner, NBS Measurement Services: Regular Spectral Transmittance, NBS Spec. Pub. 250–6 (1987).

Xai, G. J.

A. L. Migdall, B. Roop, G. J. Xai, Metrologia 28, 217 (1991).
[CrossRef]

Zhang, Z. M.

A. Frenkel, Z. M. Zhang, Opt. Lett. 19,1495 (1994).
[CrossRef] [PubMed]

M. I. Flik, Z. M. Zhang, J. Quant. Spectrosc. Radiat. Transfer 47, 293 (1992).
[CrossRef]

Appl. Opt. (1)

D. A. C. Compton, J. Drab, H. S. Barr, Appl. Opt. 29, 1908 (1990).
[CrossRef]

Appl. Spectrosc. (1)

J. Quant. Spectrosc. Radiat. Transfer (1)

M. I. Flik, Z. M. Zhang, J. Quant. Spectrosc. Radiat. Transfer 47, 293 (1992).
[CrossRef]

J. Res. Natl. Inst. Stand. Technol. (1)

A. L. Migdall, A. Frenkel, D. E. Kelleher, J. Res. Natl. Inst. Stand. Technol. 98, 691 (1993).

Metrologia (1)

A. L. Migdall, B. Roop, G. J. Xai, Metrologia 28, 217 (1991).
[CrossRef]

NBS Spec. Pub. (1)

K. L. Eckerle, J. J. Hsia, K. D. Mielenz, V. R. Weidner, NBS Measurement Services: Regular Spectral Transmittance, NBS Spec. Pub. 250–6 (1987).

Opt. Eng. (1)

D. L. Stierwalt, Opt. Eng. 13, G115 (1974).

Opt. Lett. (1)

Proc. Soc. Photo-Opt. Instrum. Eng. (1)

T. W. Merritt, J. V. Gavin, C. A. Burke, Proc. Soc. Photo-Opt. Instrum. Eng. 308, 45 (1981).

Other (5)

D. L. Stierwalt, in Infrared Thin Films, R. P. Shimshock, ed., Vol. 39 of SPIE Critical Reviews (Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., 1991), p. 181.

Trade names and company products that are mentioned in the text or identified in an illustration are only to specify adequately the experimental procedure and equipment used. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the products are necessarily the best available for the purpose.

H. A. MacLeod, Thin-Film Optical Filters (Hilger, London, 1969), Chap. 7, pp. 154–199.

A. Thelen, Design of Optical Interference Coatings (McGraw-Hill, New York, 1989), Chap. 10, pp. 197–217.

T. Hirschfeld, in Fourier Transform Infrared Spectroscopy, J. R. Ferraro, L. J. Basile, eds. (Academic, New York, 1979), Vol. 2, Chap. 6, pp. 193–242.

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Figures (4)

Fig. 1
Fig. 1

Optical scheme for out-of-band transmittance measurements.

Fig. 2
Fig. 2

Main-band transmittance of five filters measured with FTS-60A.

Fig. 3
Fig. 3

Results for the N4324 filter. (a) Optical density measured with different instruments and band-rejection filters, where FTS-60A is used for the main band. (b) Noise in transmittance measured with L4983.

Fig. 4
Fig. 4

Optical density of the N4637 filter. (a) Measured with different instruments and band-rejection filters, where the FTS-60A is used for the main band. The 10% transmittance cut-on and cut-off wavelengths of the S4365 filter are 2.660 and 4.365 μm, respectively. (b) Measured with L4983 for wavelengths longer than 5 μm.

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