Abstract

A new method has been developed to remove noise from the deformation phase map obtained by a phase-shifting electronic speckle pattern interferometry. Unlike usual methods, it estimates almost noise-free phase values directly from the distributions of the intensity differences of four interference patterns by a least-squares fit. The fluctuations of uniform deformation phases are reduced to less than 0.05 rad with a 5 × 5 pixel fitting window. The so-called sawtooth phase jumps that are due to the use of arctangent functions are retained sharply in this method.

© 1995 Optical Society of America

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