Abstract

A compact experimental setup for an electro-optical microscope is introduced. The microscope is based on phase-shift interferometry (a well-known tool for surface profilometry) that is modified for measuring electro-optic responses. Its feasibility is demonstrated with a two-dimensional map of the electro-optic activity of a periodically poled nonlinear-optical side-chain polymer.

© 1995 Optical Society of America

Full Article  |  PDF Article
More Like This
Vibration in phase-shifting interferometry

Peter J. de Groot
J. Opt. Soc. Am. A 12(2) 354-365 (1995)

Phase-extraction algorithm in laser-diode phase-shifting interferometry

Yukihiro Ishii and Ribun Onodera
Opt. Lett. 20(18) 1883-1885 (1995)

Least-squares fitting of the phase map obtained in phase-shifting electronic speckle pattern interferometry

Chung Ki Hong, Hyun Surk Ryu, and Hyun Choon Lim
Opt. Lett. 20(8) 931-933 (1995)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (2)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (5)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Metrics