Abstract

It is shown that the speckle nature of electronic speckle pattern interferometry images can be reduced in quasi-real time with the use of only three consecutive video images. By use of additive–subtractive phase modulation processing the technique is essentially insensitive to environmental noise, and distortion of fringes does not occur. By further removing the random speckle phase we show, using speckle statistics, that the number of dark speckles in the resulting fringe pattern is close to zero.

© 1995 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. B. F. Pouet, S. Krishnaswamy, Opt. Eng. 32, 1360 (1993).
    [CrossRef]
  2. K. A. Stetson, W. R. Brohinsky, J. Wahid, T. Bushman, J. Nondestruct. Eval. 8, 69 (1989).
    [CrossRef]
  3. B. F. Pouet, S. Krishnaswamy, Appl. Opt. 33, 6609 (1994).
    [CrossRef] [PubMed]
  4. K. Creath, Opt. Lett. 10, 582 (1985).
    [CrossRef] [PubMed]
  5. J. W. Goodman, in Laser Speckle and Related Phenomena, 2nd ed., J. C. Dainty, ed., Vol. 9 of Springer Series in Topics in Applied Physics (Springer-Verlag, Berlin, 1984), p. 9.

1994 (1)

1993 (1)

B. F. Pouet, S. Krishnaswamy, Opt. Eng. 32, 1360 (1993).
[CrossRef]

1989 (1)

K. A. Stetson, W. R. Brohinsky, J. Wahid, T. Bushman, J. Nondestruct. Eval. 8, 69 (1989).
[CrossRef]

1985 (1)

Brohinsky, W. R.

K. A. Stetson, W. R. Brohinsky, J. Wahid, T. Bushman, J. Nondestruct. Eval. 8, 69 (1989).
[CrossRef]

Bushman, T.

K. A. Stetson, W. R. Brohinsky, J. Wahid, T. Bushman, J. Nondestruct. Eval. 8, 69 (1989).
[CrossRef]

Creath, K.

Goodman, J. W.

J. W. Goodman, in Laser Speckle and Related Phenomena, 2nd ed., J. C. Dainty, ed., Vol. 9 of Springer Series in Topics in Applied Physics (Springer-Verlag, Berlin, 1984), p. 9.

Krishnaswamy, S.

B. F. Pouet, S. Krishnaswamy, Appl. Opt. 33, 6609 (1994).
[CrossRef] [PubMed]

B. F. Pouet, S. Krishnaswamy, Opt. Eng. 32, 1360 (1993).
[CrossRef]

Pouet, B. F.

B. F. Pouet, S. Krishnaswamy, Appl. Opt. 33, 6609 (1994).
[CrossRef] [PubMed]

B. F. Pouet, S. Krishnaswamy, Opt. Eng. 32, 1360 (1993).
[CrossRef]

Stetson, K. A.

K. A. Stetson, W. R. Brohinsky, J. Wahid, T. Bushman, J. Nondestruct. Eval. 8, 69 (1989).
[CrossRef]

Wahid, J.

K. A. Stetson, W. R. Brohinsky, J. Wahid, T. Bushman, J. Nondestruct. Eval. 8, 69 (1989).
[CrossRef]

Appl. Opt. (1)

J. Nondestruct. Eval. (1)

K. A. Stetson, W. R. Brohinsky, J. Wahid, T. Bushman, J. Nondestruct. Eval. 8, 69 (1989).
[CrossRef]

Opt. Eng. (1)

B. F. Pouet, S. Krishnaswamy, Opt. Eng. 32, 1360 (1993).
[CrossRef]

Opt. Lett. (1)

Other (1)

J. W. Goodman, in Laser Speckle and Related Phenomena, 2nd ed., J. C. Dainty, ed., Vol. 9 of Springer Series in Topics in Applied Physics (Springer-Verlag, Berlin, 1984), p. 9.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Schematic of the experimental setup.

Fig. 2
Fig. 2

Timing diagram.

Fig. 3
Fig. 3

Probability-density functions of the intensities for the ASPM–ESPI [p(χASPM)] and the SPR [p(χSPR)] techniques.

Fig. 4
Fig. 4

Influence of the speckle phase for A, ASPM–ESPI and B, SPR–ESPI.

Equations (10)

Equations on this page are rendered with MathJax. Learn more.

q ASPM ( x ) = 8 A R A O ( x ) cos [ φ ( x ) ] cos ( M ) ,
I 1 ( x ) = 2 [ I R + I O ( x ) ] ,
I 2 ( x ) = 2 [ I R + I O ( x ) ] - 4 A R A O ( x ) sin [ ϕ 2 ( x ) ] cos ( M ) ,
I 3 ( x ) = 2 [ I R + I O ( x ) ] + 4 A R A O ( x ) cos [ ϕ 3 ( x ) ] cos ( M ) ,
q EOH ( x ) = [ I 3 ( x ) - I 1 ( x ) ] 2 + [ I 2 ( x ) - I 1 ( x ) ] 2 = 16 I R I O ( cos 2 φ 3 + sin 2 φ 2 ) cos 2 M .
q SPR ( x ) = q EOH ( x ) = 4 A R A O ( cos 2 φ 3 + sin 2 φ 2 ) 1 / 2 cos M .
q EOH ( x ) = 16 I R I O ( x ) cos 2 M , q SPR ( x ) = 4 A R A O ( x ) cos M .
p ( I O ) = 1 I O exp ( - I O / I O ) ,             I o 0 ; p ( φ ) = 1 2 π ,             - π φ π ,
p ( χ ASPM ) = 2 ( π ) 1 / 2 exp ( - χ ASPM 2 ) ,
p ( χ SPR ) = 2 χ SPR exp ( - χ SPR 2 ) ,

Metrics