Abstract

Ellipsometers permit the measurement of the phase between s and p polarizations with high accuracy. However, for some applications such high accuracy is not required. A configuration based on a grating interferometer is an attractive solution that permits, with the use of a polarizer and a ferroelectric liquid-crystal retarder, the measurement of the phase between s and p polarizations after diffraction by gratings. This device can find applications in the field of optical fiber sensors.

© 1995 Optical Society of America

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References

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  1. R. Petit, M. Cadilhac, D. Maystre, P. Vincent, M. Neviere, in Electromagnetic Theory of Gratings, R. Petit, ed., Vol. 22 of Topics in Current Physics (Springer-Verlag, Berlin, 1980), pp. 1–225.
    [CrossRef]
  2. D. Maystre, in Progress in Optics XXI, E. Wolf, ed. (Elsevier, Amsterdam, 1984), pp. 3–67.
  3. M. G. Moharam, T. K. Gaylord, J. Opt. Soc. Am. A 3, 1780 (1986).
    [CrossRef]
  4. P. Vincent, H. Akhouayri, M. Neviere, J. Opt. Soc. Am. B 8, 1149 (1991).
    [CrossRef]
  5. A. Roger, Opt. Commun. 32, 11 (1980).
    [CrossRef]
  6. P. Connes, Rev. Opt. 38, 157 (1959).P. Connes, Rev. Opt. 38, 416 (1959).P. Connes, Rev. Opt. 39, 402 (1960).
  7. H. R. Giovannini, D. Yeddou, S. J. Huard, M. R. Lequime, C. Froehly, Opt. Lett. 18, 2074 (1993).
    [CrossRef] [PubMed]
  8. M. Lequime, S. Huard, H. Giovannini, French patent94402712.7 (November28, 1994).

1993 (1)

1991 (1)

1986 (1)

1980 (1)

A. Roger, Opt. Commun. 32, 11 (1980).
[CrossRef]

1959 (1)

P. Connes, Rev. Opt. 38, 157 (1959).P. Connes, Rev. Opt. 38, 416 (1959).P. Connes, Rev. Opt. 39, 402 (1960).

Akhouayri, H.

Cadilhac, M.

R. Petit, M. Cadilhac, D. Maystre, P. Vincent, M. Neviere, in Electromagnetic Theory of Gratings, R. Petit, ed., Vol. 22 of Topics in Current Physics (Springer-Verlag, Berlin, 1980), pp. 1–225.
[CrossRef]

Connes, P.

P. Connes, Rev. Opt. 38, 157 (1959).P. Connes, Rev. Opt. 38, 416 (1959).P. Connes, Rev. Opt. 39, 402 (1960).

Froehly, C.

Gaylord, T. K.

Giovannini, H.

M. Lequime, S. Huard, H. Giovannini, French patent94402712.7 (November28, 1994).

Giovannini, H. R.

Huard, S.

M. Lequime, S. Huard, H. Giovannini, French patent94402712.7 (November28, 1994).

Huard, S. J.

Lequime, M.

M. Lequime, S. Huard, H. Giovannini, French patent94402712.7 (November28, 1994).

Lequime, M. R.

Maystre, D.

R. Petit, M. Cadilhac, D. Maystre, P. Vincent, M. Neviere, in Electromagnetic Theory of Gratings, R. Petit, ed., Vol. 22 of Topics in Current Physics (Springer-Verlag, Berlin, 1980), pp. 1–225.
[CrossRef]

D. Maystre, in Progress in Optics XXI, E. Wolf, ed. (Elsevier, Amsterdam, 1984), pp. 3–67.

Moharam, M. G.

Neviere, M.

P. Vincent, H. Akhouayri, M. Neviere, J. Opt. Soc. Am. B 8, 1149 (1991).
[CrossRef]

R. Petit, M. Cadilhac, D. Maystre, P. Vincent, M. Neviere, in Electromagnetic Theory of Gratings, R. Petit, ed., Vol. 22 of Topics in Current Physics (Springer-Verlag, Berlin, 1980), pp. 1–225.
[CrossRef]

Petit, R.

R. Petit, M. Cadilhac, D. Maystre, P. Vincent, M. Neviere, in Electromagnetic Theory of Gratings, R. Petit, ed., Vol. 22 of Topics in Current Physics (Springer-Verlag, Berlin, 1980), pp. 1–225.
[CrossRef]

Roger, A.

A. Roger, Opt. Commun. 32, 11 (1980).
[CrossRef]

Vincent, P.

P. Vincent, H. Akhouayri, M. Neviere, J. Opt. Soc. Am. B 8, 1149 (1991).
[CrossRef]

R. Petit, M. Cadilhac, D. Maystre, P. Vincent, M. Neviere, in Electromagnetic Theory of Gratings, R. Petit, ed., Vol. 22 of Topics in Current Physics (Springer-Verlag, Berlin, 1980), pp. 1–225.
[CrossRef]

Yeddou, D.

J. Opt. Soc. Am. A (1)

J. Opt. Soc. Am. B (1)

Opt. Commun. (1)

A. Roger, Opt. Commun. 32, 11 (1980).
[CrossRef]

Opt. Lett. (1)

Rev. Opt. (1)

P. Connes, Rev. Opt. 38, 157 (1959).P. Connes, Rev. Opt. 38, 416 (1959).P. Connes, Rev. Opt. 39, 402 (1960).

Other (3)

M. Lequime, S. Huard, H. Giovannini, French patent94402712.7 (November28, 1994).

R. Petit, M. Cadilhac, D. Maystre, P. Vincent, M. Neviere, in Electromagnetic Theory of Gratings, R. Petit, ed., Vol. 22 of Topics in Current Physics (Springer-Verlag, Berlin, 1980), pp. 1–225.
[CrossRef]

D. Maystre, in Progress in Optics XXI, E. Wolf, ed. (Elsevier, Amsterdam, 1984), pp. 3–67.

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Figures (2)

Fig. 1
Fig. 1

Schematic of the grating interferometer. G1 and G2 are not necessarily identical, and they can be rotated to change the order of the Littrow mount. L’s, lenses; FO, fiber optic.

Fig. 2
Fig. 2

Signals S1 and S2 as a function of time: (a) G1 and G2 are in a Littrow mount for diffracted order m = −2 (incidence angle i = −38.3°); in this case the grating efficiency is low. (b) G1 and G2 are in a Littrow mount for diffracted order m = −2 (incidence angle i = +38.3°); in this case the grating efficiency is high. (c) G1 and G2 are in a Littrow mount for the diffracted order m = −1 (incidence angle i = −18°); in this case the grating efficiency is high. (d) G1 and G2 are in a Littrow mount for the diffracted order m = −1 (incidence angle i = +18°); in this case the grating efficiency is low.

Tables (1)

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Table 1 Measurements Obtained from the Experimental Results of Fig. 2

Equations (7)

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S 1 = ( I TE 1 n + I TE 2 m ) { 1 + I TE 1 n I TE 2 m I TE 1 n + I TE 2 m cos [ k L ( t ) + ϕ TE n m ] } ,
ϕ TE n m = ϕ TE1 n - ϕ TE2 m ,
L ( t ) = L 0 + l ( t )
S 2 = ( I TE1 n + I TM2 m ) { 1 + I TE 1 n I TM 2 m I TE 1 n + I TM 2 m cos [ k L ( t ) + ϕ TM n m ] } ,
ϕ TM n m = ϕ TE1 n - ϕ TM2 m ,
Φ m = ϕ TM n m - ϕ TE n m ,
Φ m = ϕ TE2 m - ϕ TM2 m ,

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