Abstract

Ellipsometers permit the measurement of the phase between s and p polarizations with high accuracy. However, for some applications such high accuracy is not required. A configuration based on a grating interferometer is an attractive solution that permits, with the use of a polarizer and a ferroelectric liquid-crystal retarder, the measurement of the phase between s and p polarizations after diffraction by gratings. This device can find applications in the field of optical fiber sensors.

© 1995 Optical Society of America

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