Abstract

The stimulated Raman gain effect in planar dielectric waveguides is analyzed for the study of thin layers. Calculations show high gain factors and predict the possibility of detecting monolayers. Compared with those for methods based on reflection, the gain can be 4 orders of magnitude higher for a monolayer of benzene. It is concluded that waveguide stimulated Raman gain spectroscopy is a promising technique for the study of thin layers.

© 1995 Optical Society of America

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