Abstract

Second-harmonic generation (SHG) in poled high-water fused silica was found to be linearly dependent on the relative concentration of Ge E′ defect sites (<10−15 defect sites/cm3) for the highly pure UV-grade material. For commercial-grade material characterized by higher concentrations of Ge E′ defects sites, the SHG appeared to saturate at approximately 0.5 pm/V. No dependence of the SHG was found on the relative concentration of Ge E′ defects sites in poled commercial-grade low-water fused silica.

© 1995 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. R. A. Myers, N. Mukherjee, S. R. J. Brueck, Opt. Lett. 16, 1732 (1991).
    [Crossref] [PubMed]
  2. L. J. Henry, A. D. DeVilbiss, T. E. Tsai, “Effect of preannealing on the level of second-harmonic generation and defect sites achieved in poled fused silica,” submitted toJ. Opt. Soc. Am. B.
  3. R. A. B. Devine, C. Fiori, J. Appl. Phys. 58, 3368 (1985).
    [Crossref]
  4. W. Olthuis, P. Bergveld, IEEE Trans. Electr. Insul. 27, 691 (1992).
    [Crossref]
  5. H. Nasu, H. Okamoto, M. Mito, J. Matsuoka, K. Kamiya, Jpn. J. Appl. Phys. 32, L406 (1993).
    [Crossref]
  6. A. Krotkus, W. Margulis, Appl. Phys. Lett. 52, 1942 (1988).
    [Crossref]
  7. M. A. Saifi, M. J. Andrejco, Opt. Lett. 13, 773 (1988).
    [Crossref] [PubMed]
  8. T. E. Tsai, M. A. Saifi, E. J. Friebele, D. L. Griscom, U. Osterberg, Opt. Lett. 14, 1023 (1989).
    [Crossref] [PubMed]
  9. P. G. Kazansky, L. Dong, P. St. J. Russell, Opt. Lett. 19, 701 (1994).
    [Crossref] [PubMed]
  10. Optical Materials and Components Handbook (Esco Products, Inc., 171 Oak Ridge Road, Oak Ridge, N.J. 07438).
  11. M. S. Aslanova, S. G. Klimanov, S. E. Rudakova, V. E. Khazanov, Izv. Akad. Nauk SSSR Neorg. Mater. 11, 890 (1975).
  12. X.-C. Long, R. A. Myers, S. R. J. Brueck, Opt. Lett. 19, 1819 (1994).
    [Crossref] [PubMed]
  13. J. Jerphagnon, S. K. Kurtz, J. Appl. Phys. 42, 5654 (1971).
    [Crossref]
  14. D. L. Griscom, Nucl. Instrum. Methods Phys. Res. B 1, 481 (1984).
    [Crossref]
  15. F. J. Feigl, J. H. Anderson, J. Phys. Chem. Solids 31, 575 (1970).
    [Crossref]
  16. D. L. Griscom, U.S. Naval Research Laboratory, Washington, D.C. 20375 (personal communication, 1995).

1994 (2)

1993 (1)

H. Nasu, H. Okamoto, M. Mito, J. Matsuoka, K. Kamiya, Jpn. J. Appl. Phys. 32, L406 (1993).
[Crossref]

1992 (1)

W. Olthuis, P. Bergveld, IEEE Trans. Electr. Insul. 27, 691 (1992).
[Crossref]

1991 (1)

1989 (1)

1988 (2)

A. Krotkus, W. Margulis, Appl. Phys. Lett. 52, 1942 (1988).
[Crossref]

M. A. Saifi, M. J. Andrejco, Opt. Lett. 13, 773 (1988).
[Crossref] [PubMed]

1985 (1)

R. A. B. Devine, C. Fiori, J. Appl. Phys. 58, 3368 (1985).
[Crossref]

1984 (1)

D. L. Griscom, Nucl. Instrum. Methods Phys. Res. B 1, 481 (1984).
[Crossref]

1975 (1)

M. S. Aslanova, S. G. Klimanov, S. E. Rudakova, V. E. Khazanov, Izv. Akad. Nauk SSSR Neorg. Mater. 11, 890 (1975).

1971 (1)

J. Jerphagnon, S. K. Kurtz, J. Appl. Phys. 42, 5654 (1971).
[Crossref]

1970 (1)

F. J. Feigl, J. H. Anderson, J. Phys. Chem. Solids 31, 575 (1970).
[Crossref]

Anderson, J. H.

F. J. Feigl, J. H. Anderson, J. Phys. Chem. Solids 31, 575 (1970).
[Crossref]

Andrejco, M. J.

Aslanova, M. S.

M. S. Aslanova, S. G. Klimanov, S. E. Rudakova, V. E. Khazanov, Izv. Akad. Nauk SSSR Neorg. Mater. 11, 890 (1975).

Bergveld, P.

W. Olthuis, P. Bergveld, IEEE Trans. Electr. Insul. 27, 691 (1992).
[Crossref]

Brueck, S. R. J.

DeVilbiss, A. D.

L. J. Henry, A. D. DeVilbiss, T. E. Tsai, “Effect of preannealing on the level of second-harmonic generation and defect sites achieved in poled fused silica,” submitted toJ. Opt. Soc. Am. B.

Devine, R. A. B.

R. A. B. Devine, C. Fiori, J. Appl. Phys. 58, 3368 (1985).
[Crossref]

Dong, L.

Feigl, F. J.

F. J. Feigl, J. H. Anderson, J. Phys. Chem. Solids 31, 575 (1970).
[Crossref]

Fiori, C.

R. A. B. Devine, C. Fiori, J. Appl. Phys. 58, 3368 (1985).
[Crossref]

Friebele, E. J.

Griscom, D. L.

T. E. Tsai, M. A. Saifi, E. J. Friebele, D. L. Griscom, U. Osterberg, Opt. Lett. 14, 1023 (1989).
[Crossref] [PubMed]

D. L. Griscom, Nucl. Instrum. Methods Phys. Res. B 1, 481 (1984).
[Crossref]

D. L. Griscom, U.S. Naval Research Laboratory, Washington, D.C. 20375 (personal communication, 1995).

Henry, L. J.

L. J. Henry, A. D. DeVilbiss, T. E. Tsai, “Effect of preannealing on the level of second-harmonic generation and defect sites achieved in poled fused silica,” submitted toJ. Opt. Soc. Am. B.

Jerphagnon, J.

J. Jerphagnon, S. K. Kurtz, J. Appl. Phys. 42, 5654 (1971).
[Crossref]

Kamiya, K.

H. Nasu, H. Okamoto, M. Mito, J. Matsuoka, K. Kamiya, Jpn. J. Appl. Phys. 32, L406 (1993).
[Crossref]

Kazansky, P. G.

Khazanov, V. E.

M. S. Aslanova, S. G. Klimanov, S. E. Rudakova, V. E. Khazanov, Izv. Akad. Nauk SSSR Neorg. Mater. 11, 890 (1975).

Klimanov, S. G.

M. S. Aslanova, S. G. Klimanov, S. E. Rudakova, V. E. Khazanov, Izv. Akad. Nauk SSSR Neorg. Mater. 11, 890 (1975).

Krotkus, A.

A. Krotkus, W. Margulis, Appl. Phys. Lett. 52, 1942 (1988).
[Crossref]

Kurtz, S. K.

J. Jerphagnon, S. K. Kurtz, J. Appl. Phys. 42, 5654 (1971).
[Crossref]

Long, X.-C.

Margulis, W.

A. Krotkus, W. Margulis, Appl. Phys. Lett. 52, 1942 (1988).
[Crossref]

Matsuoka, J.

H. Nasu, H. Okamoto, M. Mito, J. Matsuoka, K. Kamiya, Jpn. J. Appl. Phys. 32, L406 (1993).
[Crossref]

Mito, M.

H. Nasu, H. Okamoto, M. Mito, J. Matsuoka, K. Kamiya, Jpn. J. Appl. Phys. 32, L406 (1993).
[Crossref]

Mukherjee, N.

Myers, R. A.

Nasu, H.

H. Nasu, H. Okamoto, M. Mito, J. Matsuoka, K. Kamiya, Jpn. J. Appl. Phys. 32, L406 (1993).
[Crossref]

Okamoto, H.

H. Nasu, H. Okamoto, M. Mito, J. Matsuoka, K. Kamiya, Jpn. J. Appl. Phys. 32, L406 (1993).
[Crossref]

Olthuis, W.

W. Olthuis, P. Bergveld, IEEE Trans. Electr. Insul. 27, 691 (1992).
[Crossref]

Osterberg, U.

Rudakova, S. E.

M. S. Aslanova, S. G. Klimanov, S. E. Rudakova, V. E. Khazanov, Izv. Akad. Nauk SSSR Neorg. Mater. 11, 890 (1975).

Russell, P. St. J.

Saifi, M. A.

Tsai, T. E.

T. E. Tsai, M. A. Saifi, E. J. Friebele, D. L. Griscom, U. Osterberg, Opt. Lett. 14, 1023 (1989).
[Crossref] [PubMed]

L. J. Henry, A. D. DeVilbiss, T. E. Tsai, “Effect of preannealing on the level of second-harmonic generation and defect sites achieved in poled fused silica,” submitted toJ. Opt. Soc. Am. B.

Appl. Phys. Lett. (1)

A. Krotkus, W. Margulis, Appl. Phys. Lett. 52, 1942 (1988).
[Crossref]

IEEE Trans. Electr. Insul. (1)

W. Olthuis, P. Bergveld, IEEE Trans. Electr. Insul. 27, 691 (1992).
[Crossref]

Izv. Akad. Nauk SSSR Neorg. Mater. (1)

M. S. Aslanova, S. G. Klimanov, S. E. Rudakova, V. E. Khazanov, Izv. Akad. Nauk SSSR Neorg. Mater. 11, 890 (1975).

J. Appl. Phys. (2)

J. Jerphagnon, S. K. Kurtz, J. Appl. Phys. 42, 5654 (1971).
[Crossref]

R. A. B. Devine, C. Fiori, J. Appl. Phys. 58, 3368 (1985).
[Crossref]

J. Phys. Chem. Solids (1)

F. J. Feigl, J. H. Anderson, J. Phys. Chem. Solids 31, 575 (1970).
[Crossref]

Jpn. J. Appl. Phys. (1)

H. Nasu, H. Okamoto, M. Mito, J. Matsuoka, K. Kamiya, Jpn. J. Appl. Phys. 32, L406 (1993).
[Crossref]

Nucl. Instrum. Methods Phys. Res. B (1)

D. L. Griscom, Nucl. Instrum. Methods Phys. Res. B 1, 481 (1984).
[Crossref]

Opt. Lett. (5)

Other (3)

Optical Materials and Components Handbook (Esco Products, Inc., 171 Oak Ridge Road, Oak Ridge, N.J. 07438).

L. J. Henry, A. D. DeVilbiss, T. E. Tsai, “Effect of preannealing on the level of second-harmonic generation and defect sites achieved in poled fused silica,” submitted toJ. Opt. Soc. Am. B.

D. L. Griscom, U.S. Naval Research Laboratory, Washington, D.C. 20375 (personal communication, 1995).

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (3)

Fig. 1
Fig. 1

High-power electron paramagnetic resonance spectrum of a sample of fused silica. The peak located at 3492.20 G has been attributed to the GeE′ center, and that located at 3487.91G has been attributed to the SiE′ center.

Fig. 2
Fig. 2

Relative concentration of Ge E′ defect sites versus d33 for samples of high-water fused silica: ●, S1-UV fused silica; ■, G1 fused silica.

Fig. 3
Fig. 3

Relative concentration of Ge E′ defect sites versus d33 for samples of low-water fused silica.

Tables (1)

Tables Icon

Table 1 Properties of Low- and High-Water Fused Silica

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

Si + . Si + H 2 O Si + HO - Si + H ,
Si + . Ge + H 2 O Si + HO - Ge + H .
Si - OH + H 2 O Si - O - + H 3 O + ,
Si - O - + H 3 O + + e - Si - O - + H 2 O + H .

Metrics