Abstract

We introduce a simple modification to the Z-scan technique that results in a sensitivity enhancement that permits measurement of nonlinearly induced wave-front distortion of ≃λ/104. This sensitivity was achieved with 10-Hz repetition-rate pulsed laser sources. Sensitivity to nonlinear absorption is also enhanced by a factor of ≃3. This method permits characterization of nonlinear thin films without the need for waveguiding.

© 1994 Optical Society of America

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