Abstract

Periodically segmented waveguides with periods of few tens of micrometers and nonconnected segments are studied experimentally in Ti:LiNbO3. The near-field patterns were found to expand with decreasing duty cycle but to be independent of the segmentation period. The measured segmentation losses vary between 0.5 and 2.5 dB/cm, depending on the period and the duty cycle. These results agree with a simple numerical model, based on two loss mechanisms: waveguide segmentation and surface relief related to Ti indiffusion.

© 1994 Optical Society of America

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1994 (1)

P. Baldi, M. R. Shenoy, S. Nouh, M. P. De Micheli, D. B. Ostrowski, Opt. Commun. 104, 308 (1994).
[Crossref]

1993 (1)

Z. Weissman, A. Hardy, J. Lightwave Technol. 11, 1831 (1993).
[Crossref]

1992 (2)

L. Li, J. J. Burke, Opt. Lett. 17, 1195 (1992).
[Crossref] [PubMed]

Z. Weissman, A. Hardy, Electron. Lett. 28, 1514 (1992).
[Crossref]

1990 (1)

C. J. Van der Poel, J. D. Bierlein, J. B. Brown, S. Colak, Appl. Phys. Lett. 57, 2074 (1990).
[Crossref]

1989 (1)

T. Negami, H. Haga, S. Yamamoto, Appl. Phys. Lett. 54, 1080 (1989).
[Crossref]

1988 (1)

1987 (1)

P. G. Suchoski, R. V. Ramaswamy, J. Lightwave Technol. LT-5, 1246 (1987).
[Crossref]

1985 (1)

1978 (1)

R. C. Alferness, R. V. Schmidt, Appl. Phys. Lett. 33, 161 (1978).
[Crossref]

Alferness, R. C.

R. C. Alferness, R. V. Schmidt, Appl. Phys. Lett. 33, 161 (1978).
[Crossref]

S. K. Korotky, R. C. Alferness, in Integrated Optical Circuits and Components, L. D. Hutcheson, ed. (Dekker, New York, 1987), pp. 169–227.

Baldi, P.

P. Baldi, M. R. Shenoy, S. Nouh, M. P. De Micheli, D. B. Ostrowski, Opt. Commun. 104, 308 (1994).
[Crossref]

Bierlein, J. D.

C. J. Van der Poel, J. D. Bierlein, J. B. Brown, S. Colak, Appl. Phys. Lett. 57, 2074 (1990).
[Crossref]

Brown, J. B.

C. J. Van der Poel, J. D. Bierlein, J. B. Brown, S. Colak, Appl. Phys. Lett. 57, 2074 (1990).
[Crossref]

Burke, J. J.

Colak, S.

C. J. Van der Poel, J. D. Bierlein, J. B. Brown, S. Colak, Appl. Phys. Lett. 57, 2074 (1990).
[Crossref]

Connors, J. M.

De Micheli, M. P.

P. Baldi, M. R. Shenoy, S. Nouh, M. P. De Micheli, D. B. Ostrowski, Opt. Commun. 104, 308 (1994).
[Crossref]

Haga, H.

T. Negami, H. Haga, S. Yamamoto, Appl. Phys. Lett. 54, 1080 (1989).
[Crossref]

Hardy, A.

Z. Weissman, A. Hardy, J. Lightwave Technol. 11, 1831 (1993).
[Crossref]

Z. Weissman, A. Hardy, Electron. Lett. 28, 1514 (1992).
[Crossref]

Korotky, S. K.

S. K. Korotky, R. C. Alferness, in Integrated Optical Circuits and Components, L. D. Hutcheson, ed. (Dekker, New York, 1987), pp. 169–227.

Li, L.

Mahapatra, A.

McCaughan, L.

L. McCaughan, in Critical Reviews of Optical Science and Technology, Integrated Optics and Optoelectronics, K. A. Z. Wang, M. Razegehi, eds., Vol. CR45 (Society of Photo-Optical and Instrumentation Engineers, Bellingham, Wash., 1993), p. 15.

Negami, T.

T. Negami, H. Haga, S. Yamamoto, Appl. Phys. Lett. 54, 1080 (1989).
[Crossref]

Nouh, S.

P. Baldi, M. R. Shenoy, S. Nouh, M. P. De Micheli, D. B. Ostrowski, Opt. Commun. 104, 308 (1994).
[Crossref]

Ostrowski, D. B.

P. Baldi, M. R. Shenoy, S. Nouh, M. P. De Micheli, D. B. Ostrowski, Opt. Commun. 104, 308 (1994).
[Crossref]

Ramaswamy, R. V.

P. G. Suchoski, R. V. Ramaswamy, J. Lightwave Technol. LT-5, 1246 (1987).
[Crossref]

Ruschin, S.

Schmidt, R. V.

R. C. Alferness, R. V. Schmidt, Appl. Phys. Lett. 33, 161 (1978).
[Crossref]

Shenoy, M. R.

P. Baldi, M. R. Shenoy, S. Nouh, M. P. De Micheli, D. B. Ostrowski, Opt. Commun. 104, 308 (1994).
[Crossref]

Suchoski, P. G.

P. G. Suchoski, R. V. Ramaswamy, J. Lightwave Technol. LT-5, 1246 (1987).
[Crossref]

Van der Poel, C. J.

C. J. Van der Poel, J. D. Bierlein, J. B. Brown, S. Colak, Appl. Phys. Lett. 57, 2074 (1990).
[Crossref]

Weissman, Z.

Z. Weissman, A. Hardy, J. Lightwave Technol. 11, 1831 (1993).
[Crossref]

Z. Weissman, A. Hardy, Electron. Lett. 28, 1514 (1992).
[Crossref]

Yamamoto, S.

T. Negami, H. Haga, S. Yamamoto, Appl. Phys. Lett. 54, 1080 (1989).
[Crossref]

Appl. Opt. (1)

Appl. Phys. Lett. (3)

C. J. Van der Poel, J. D. Bierlein, J. B. Brown, S. Colak, Appl. Phys. Lett. 57, 2074 (1990).
[Crossref]

R. C. Alferness, R. V. Schmidt, Appl. Phys. Lett. 33, 161 (1978).
[Crossref]

T. Negami, H. Haga, S. Yamamoto, Appl. Phys. Lett. 54, 1080 (1989).
[Crossref]

Electron. Lett. (1)

Z. Weissman, A. Hardy, Electron. Lett. 28, 1514 (1992).
[Crossref]

J. Lightwave Technol. (2)

Z. Weissman, A. Hardy, J. Lightwave Technol. 11, 1831 (1993).
[Crossref]

P. G. Suchoski, R. V. Ramaswamy, J. Lightwave Technol. LT-5, 1246 (1987).
[Crossref]

Opt. Commun. (1)

P. Baldi, M. R. Shenoy, S. Nouh, M. P. De Micheli, D. B. Ostrowski, Opt. Commun. 104, 308 (1994).
[Crossref]

Opt. Lett. (2)

Other (2)

L. McCaughan, in Critical Reviews of Optical Science and Technology, Integrated Optics and Optoelectronics, K. A. Z. Wang, M. Razegehi, eds., Vol. CR45 (Society of Photo-Optical and Instrumentation Engineers, Bellingham, Wash., 1993), p. 15.

S. K. Korotky, R. C. Alferness, in Integrated Optical Circuits and Components, L. D. Hutcheson, ed. (Dekker, New York, 1987), pp. 169–227.

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Figures (4)

Fig. 1
Fig. 1

(a) Schematic of a PSW and (b) a photomicrograph (×70) of some Ti:LiNbO3 PSW’s. The photograph was taken after diffusion, and the observed contrast was contributed mainly by the surface relief related to Ti indiffusion. continuous

Fig. 2
Fig. 2

Intensity contours for the near field of a 40-nm Ti:LiNbO3 PSW with various segmentations.

Fig. 3
Fig. 3

Power-loss factors for 30-nm Ti:LiNbO3 PSW’s with various segmentations. The measured points are indicated by circles.

Fig. 4
Fig. 4

Calculated power radiation-loss factors for a slab-waveguide model with Δnslab = 5.5 × 10−3, tslab = 1.9 μm, and trelief = 105 nm. Each segment is lengthened by 2Dy ≈ 4 μm.

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