Abstract

Laser-induced dark traces in LiNbO3:Zn (7.5 mol. %) and LiNbO3:Mg (6.5 mol. %) crystals have been studied with the crystals as the component for 1064–532-nm second-harmonic generation of Nd:YAG radiation operating in a pulsed mode. The results show that, at high input power density, both crystals suffer from dark traces, which reduce the second-harmonic-generation efficiency. The dark traces are induced by the 532-nm radiation and can be recovered after the laser beam is shut off. The transmission loss spectra show a broad absorption peak near 400 nm.

© 1994 Optical Society of America

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  1. G. G. Zhong, J. Jin, Z. K. Wu, in Proceedings of the Eleventh International Conference on Quantum Electronics (Institute of Electrical and Electronics Engineers, New York, 1980), p. 631.
  2. J. L. Nightingale, W. J. Silva, G. E. Ready, A. Rybicki, W. J. Kozlovsky, R. L. Byer, Proc. Soc. Photo-Opt. Instrum. Eng. 681, 20 (1986).
  3. T. R. Volk, V. V. Krasnikov, V. I. Pryalkin, N. M. Rubinina, Sov. J. Quantum Electron. 20, 204 (1990).
    [CrossRef]
  4. T. R. Volk, V. I. Pryalkin, N. M. Rubinina, Opt. Lett. 15, 996 (1990).
    [CrossRef] [PubMed]
  5. J. Q. Yao, W. Q. Shi, J. E. Millerd, G. F. Xu, E. Garmire, M. Birnbaum, Opt. Lett. 15, 1339 (1990).
    [CrossRef] [PubMed]
  6. J. C. Jacco, D. R. Rockafellow, E. A. Teppo, Opt. Lett. 16, 1307 (1991).
    [CrossRef] [PubMed]
  7. R. Blachman, P. F. Bordui, M. M. Fejer, in Conference on Lasers and Electro-Optics, Vol. 11 of 1993 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1993), paper CMD6.
  8. F. Agullo-Lopez, J. M. Cabrera, in Properties of LiNbO3, S. C. Abraham, ed., EMIS Data Review Series No. 5 (Institution of Electrical Engineers, London, 1989), Chap. 1, pp. 11–14.
  9. O. F. Schirmer, D. Von der Linde, Appl. Phys. Lett. 33, 35 (1978).
    [CrossRef]
  10. K. L. Sweeney, L. E. Halliburton, D. A. Bryan, R. R. Rice, R. Gerson, H. E. Tomaschke, Appl. Phys. Lett. 43, 336 (1983).
    [CrossRef]

1991 (1)

1990 (3)

1986 (1)

J. L. Nightingale, W. J. Silva, G. E. Ready, A. Rybicki, W. J. Kozlovsky, R. L. Byer, Proc. Soc. Photo-Opt. Instrum. Eng. 681, 20 (1986).

1983 (1)

K. L. Sweeney, L. E. Halliburton, D. A. Bryan, R. R. Rice, R. Gerson, H. E. Tomaschke, Appl. Phys. Lett. 43, 336 (1983).
[CrossRef]

1978 (1)

O. F. Schirmer, D. Von der Linde, Appl. Phys. Lett. 33, 35 (1978).
[CrossRef]

Agullo-Lopez, F.

F. Agullo-Lopez, J. M. Cabrera, in Properties of LiNbO3, S. C. Abraham, ed., EMIS Data Review Series No. 5 (Institution of Electrical Engineers, London, 1989), Chap. 1, pp. 11–14.

Birnbaum, M.

Blachman, R.

R. Blachman, P. F. Bordui, M. M. Fejer, in Conference on Lasers and Electro-Optics, Vol. 11 of 1993 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1993), paper CMD6.

Bordui, P. F.

R. Blachman, P. F. Bordui, M. M. Fejer, in Conference on Lasers and Electro-Optics, Vol. 11 of 1993 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1993), paper CMD6.

Bryan, D. A.

K. L. Sweeney, L. E. Halliburton, D. A. Bryan, R. R. Rice, R. Gerson, H. E. Tomaschke, Appl. Phys. Lett. 43, 336 (1983).
[CrossRef]

Byer, R. L.

J. L. Nightingale, W. J. Silva, G. E. Ready, A. Rybicki, W. J. Kozlovsky, R. L. Byer, Proc. Soc. Photo-Opt. Instrum. Eng. 681, 20 (1986).

Cabrera, J. M.

F. Agullo-Lopez, J. M. Cabrera, in Properties of LiNbO3, S. C. Abraham, ed., EMIS Data Review Series No. 5 (Institution of Electrical Engineers, London, 1989), Chap. 1, pp. 11–14.

Fejer, M. M.

R. Blachman, P. F. Bordui, M. M. Fejer, in Conference on Lasers and Electro-Optics, Vol. 11 of 1993 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1993), paper CMD6.

Garmire, E.

Gerson, R.

K. L. Sweeney, L. E. Halliburton, D. A. Bryan, R. R. Rice, R. Gerson, H. E. Tomaschke, Appl. Phys. Lett. 43, 336 (1983).
[CrossRef]

Halliburton, L. E.

K. L. Sweeney, L. E. Halliburton, D. A. Bryan, R. R. Rice, R. Gerson, H. E. Tomaschke, Appl. Phys. Lett. 43, 336 (1983).
[CrossRef]

Jacco, J. C.

Jin, J.

G. G. Zhong, J. Jin, Z. K. Wu, in Proceedings of the Eleventh International Conference on Quantum Electronics (Institute of Electrical and Electronics Engineers, New York, 1980), p. 631.

Kozlovsky, W. J.

J. L. Nightingale, W. J. Silva, G. E. Ready, A. Rybicki, W. J. Kozlovsky, R. L. Byer, Proc. Soc. Photo-Opt. Instrum. Eng. 681, 20 (1986).

Krasnikov, V. V.

T. R. Volk, V. V. Krasnikov, V. I. Pryalkin, N. M. Rubinina, Sov. J. Quantum Electron. 20, 204 (1990).
[CrossRef]

Millerd, J. E.

Nightingale, J. L.

J. L. Nightingale, W. J. Silva, G. E. Ready, A. Rybicki, W. J. Kozlovsky, R. L. Byer, Proc. Soc. Photo-Opt. Instrum. Eng. 681, 20 (1986).

Pryalkin, V. I.

T. R. Volk, V. V. Krasnikov, V. I. Pryalkin, N. M. Rubinina, Sov. J. Quantum Electron. 20, 204 (1990).
[CrossRef]

T. R. Volk, V. I. Pryalkin, N. M. Rubinina, Opt. Lett. 15, 996 (1990).
[CrossRef] [PubMed]

Ready, G. E.

J. L. Nightingale, W. J. Silva, G. E. Ready, A. Rybicki, W. J. Kozlovsky, R. L. Byer, Proc. Soc. Photo-Opt. Instrum. Eng. 681, 20 (1986).

Rice, R. R.

K. L. Sweeney, L. E. Halliburton, D. A. Bryan, R. R. Rice, R. Gerson, H. E. Tomaschke, Appl. Phys. Lett. 43, 336 (1983).
[CrossRef]

Rockafellow, D. R.

Rubinina, N. M.

T. R. Volk, V. I. Pryalkin, N. M. Rubinina, Opt. Lett. 15, 996 (1990).
[CrossRef] [PubMed]

T. R. Volk, V. V. Krasnikov, V. I. Pryalkin, N. M. Rubinina, Sov. J. Quantum Electron. 20, 204 (1990).
[CrossRef]

Rybicki, A.

J. L. Nightingale, W. J. Silva, G. E. Ready, A. Rybicki, W. J. Kozlovsky, R. L. Byer, Proc. Soc. Photo-Opt. Instrum. Eng. 681, 20 (1986).

Schirmer, O. F.

O. F. Schirmer, D. Von der Linde, Appl. Phys. Lett. 33, 35 (1978).
[CrossRef]

Shi, W. Q.

Silva, W. J.

J. L. Nightingale, W. J. Silva, G. E. Ready, A. Rybicki, W. J. Kozlovsky, R. L. Byer, Proc. Soc. Photo-Opt. Instrum. Eng. 681, 20 (1986).

Sweeney, K. L.

K. L. Sweeney, L. E. Halliburton, D. A. Bryan, R. R. Rice, R. Gerson, H. E. Tomaschke, Appl. Phys. Lett. 43, 336 (1983).
[CrossRef]

Teppo, E. A.

Tomaschke, H. E.

K. L. Sweeney, L. E. Halliburton, D. A. Bryan, R. R. Rice, R. Gerson, H. E. Tomaschke, Appl. Phys. Lett. 43, 336 (1983).
[CrossRef]

Volk, T. R.

T. R. Volk, V. I. Pryalkin, N. M. Rubinina, Opt. Lett. 15, 996 (1990).
[CrossRef] [PubMed]

T. R. Volk, V. V. Krasnikov, V. I. Pryalkin, N. M. Rubinina, Sov. J. Quantum Electron. 20, 204 (1990).
[CrossRef]

Von der Linde, D.

O. F. Schirmer, D. Von der Linde, Appl. Phys. Lett. 33, 35 (1978).
[CrossRef]

Wu, Z. K.

G. G. Zhong, J. Jin, Z. K. Wu, in Proceedings of the Eleventh International Conference on Quantum Electronics (Institute of Electrical and Electronics Engineers, New York, 1980), p. 631.

Xu, G. F.

Yao, J. Q.

Zhong, G. G.

G. G. Zhong, J. Jin, Z. K. Wu, in Proceedings of the Eleventh International Conference on Quantum Electronics (Institute of Electrical and Electronics Engineers, New York, 1980), p. 631.

Appl. Phys. Lett. (2)

O. F. Schirmer, D. Von der Linde, Appl. Phys. Lett. 33, 35 (1978).
[CrossRef]

K. L. Sweeney, L. E. Halliburton, D. A. Bryan, R. R. Rice, R. Gerson, H. E. Tomaschke, Appl. Phys. Lett. 43, 336 (1983).
[CrossRef]

Opt. Lett. (3)

Proc. Soc. Photo-Opt. Instrum. Eng. (1)

J. L. Nightingale, W. J. Silva, G. E. Ready, A. Rybicki, W. J. Kozlovsky, R. L. Byer, Proc. Soc. Photo-Opt. Instrum. Eng. 681, 20 (1986).

Sov. J. Quantum Electron. (1)

T. R. Volk, V. V. Krasnikov, V. I. Pryalkin, N. M. Rubinina, Sov. J. Quantum Electron. 20, 204 (1990).
[CrossRef]

Other (3)

R. Blachman, P. F. Bordui, M. M. Fejer, in Conference on Lasers and Electro-Optics, Vol. 11 of 1993 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1993), paper CMD6.

F. Agullo-Lopez, J. M. Cabrera, in Properties of LiNbO3, S. C. Abraham, ed., EMIS Data Review Series No. 5 (Institution of Electrical Engineers, London, 1989), Chap. 1, pp. 11–14.

G. G. Zhong, J. Jin, Z. K. Wu, in Proceedings of the Eleventh International Conference on Quantum Electronics (Institute of Electrical and Electronics Engineers, New York, 1980), p. 631.

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Figures (4)

Fig. 1
Fig. 1

SHG efficiency after the initial shot versus the input power density for LiNbO3:Zn (∇) and LiNbO3:Mg (Δ).

Fig. 2
Fig. 2

SHG efficiency versus the number of shots at input power densities of 39 MW/cm2 (Δ), 12 MW/cm2 (□), and 3 MW/cm2 (×).

Fig. 3
Fig. 3

Transmission spectra T(λ) for unirradiated samples (curves a), after 1200 shots at a power density of 18 MW/ cm2 (curves b), and 20 min later after the irradiation was shut off (curve c).

Fig. 4
Fig. 4

Transmission loss after 1200 shots at a power density of 18 MW/cm2 for LiNbO3:Zn (curve a) and LiNbO3:Mg (curve b).

Tables (1)

Tables Icon

Table 1 Representative Data of SHG Efficiency for Prolonged Exposure

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