Abstract

An electrically switchable diffractive optical element has been built based on a computer-generated phase hologram and a liquid-crystal layer. The design of the diffractive optical element and the fabrication and performance of the device are discussed. The application of the device in a machine vision system for optical surface inspection is shown.

© 1994 Optical Society of America

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References

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  1. U. Müssigmann, in Fractals in the Fundamental and Applied Sciences, H. O. Peitgen, ed. (North-Holland, Amsterdam, 1991), p. 269.
  2. P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).
  3. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1969), Chap. 5-2, pp. 83ff; Chap. 6-2, pp. 110ff; Chap. 6-3, pp. 113ff.
  4. S. Chandrasekhar, Liquid Crystals, 2nd ed. (Cambridge U. Press, Cambridge, 1992), Chap. 1.1.1, p. 1; Chap. 5.3, pp. 117ff.
    [Crossref]
  5. R. W. Gerchberg, W. O. Saxton, Optik 35, 237 (1972).
  6. J. R. Fienup, Opt. Eng. 19, 297 (1980).
  7. F. Wyrowski, O. Bryngdahl, J. Opt. Soc. Am. A 5, 1058 (1988).
    [Crossref]
  8. M. T. Gale, M. Rossi, H. Schütz, P. Ehbets, H. P. Herzig, D. Prongué, Appl. Opt. 32, 2526 (1993).
    [Crossref] [PubMed]

1993 (1)

1988 (1)

1980 (1)

J. R. Fienup, Opt. Eng. 19, 297 (1980).

1972 (1)

R. W. Gerchberg, W. O. Saxton, Optik 35, 237 (1972).

Abele, A.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Bryngdahl, O.

Cavanna, C.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Chandrasekhar, S.

S. Chandrasekhar, Liquid Crystals, 2nd ed. (Cambridge U. Press, Cambridge, 1992), Chap. 1.1.1, p. 1; Chap. 5.3, pp. 117ff.
[Crossref]

Claeys, C.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Debusschere, I.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Ehbets, P.

Fienup, J. R.

J. R. Fienup, Opt. Eng. 19, 297 (1980).

Gale, M. T.

Gerchberg, R. W.

R. W. Gerchberg, W. O. Saxton, Optik 35, 237 (1972).

Gilia, G.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Goodman, J. W.

J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1969), Chap. 5-2, pp. 83ff; Chap. 6-2, pp. 110ff; Chap. 6-3, pp. 113ff.

Herzig, H. P.

Lang, G. K.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Muessigmann, U.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Müssigmann, U.

U. Müssigmann, in Fractals in the Fundamental and Applied Sciences, H. O. Peitgen, ed. (North-Holland, Amsterdam, 1991), p. 269.

Prongué, D.

Raynor, J. M.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Ricquir, N.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Rossi, M.

Saxton, W. O.

R. W. Gerchberg, W. O. Saxton, Optik 35, 237 (1972).

Schütz, H.

Seitz, P.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Stalder, M.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

Wyrowski, F.

Appl. Opt. (1)

J. Opt. Soc. Am. A (1)

Opt. Eng. (1)

J. R. Fienup, Opt. Eng. 19, 297 (1980).

Optik (1)

R. W. Gerchberg, W. O. Saxton, Optik 35, 237 (1972).

Other (4)

U. Müssigmann, in Fractals in the Fundamental and Applied Sciences, H. O. Peitgen, ed. (North-Holland, Amsterdam, 1991), p. 269.

P. Seitz, M. Stalder, J. M. Raynor, G. K. Lang, C. Claeys, I. Debusschere, N. Ricquir, G. Gilia, C. Cavanna, U. Muessigmann, A. Abele, Proc. Soc. Photo-Opt. Instrum. Eng. (to be published).

J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1969), Chap. 5-2, pp. 83ff; Chap. 6-2, pp. 110ff; Chap. 6-3, pp. 113ff.

S. Chandrasekhar, Liquid Crystals, 2nd ed. (Cambridge U. Press, Cambridge, 1992), Chap. 1.1.1, p. 1; Chap. 5.3, pp. 117ff.
[Crossref]

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Figures (4)

Fig. 1
Fig. 1

Cross section of the switchable DOE device. ITO, indium tin oxide.

Fig. 2
Fig. 2

Maximum PSF errors ΔR and phase profile depths Φmax resulting from 2000 runs with the iterative algorithm.

Fig. 3
Fig. 3

Switching behavior of the switchable DOE.

Fig. 4
Fig. 4

Measured and simulated Gaussian PSF; the PSF of the imaging system is also given.

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