Abstract

Forty-four NH3 absorption spectral lines of the combination tones of the vibration–rotation transitions were observed at 1.4988–1.5520 μm with a 1.5-μm grating-external-cavity semiconductor laser. The linewidth and absorption rate of NH3 absorption spectral lines were measured. Also, the changes of center frequency and linewidth of the NH3 absorption spectral line with the variation of NH3 pressure were measured for what is to our knowledge the first time.

© 1993 Optical Society of America

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References

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  1. I. P. Kaminow, J. Select. Areas Commun. 8, 1005 (1990).
    [CrossRef]
  2. T. Kimura, J. Lightwave Technol. LT-5, 414 (1987).
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  3. T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
    [CrossRef]
  4. V. L. Davies, S. Ezekiel, Proc. Soc. Photo-Opt. Instrum. Eng. 157, 13 (1978).
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  6. D. Wang, L. Xie, Y. Wang, Opt. Lett. 13, 820 (1988).
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  7. S. Tu, Frequency Stabilization and Measurement Frequency Technology, 1st ed. (Science, Beijing, China, 1986), Chap. 5, p. 133.
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    [CrossRef]

1990

I. P. Kaminow, J. Select. Areas Commun. 8, 1005 (1990).
[CrossRef]

1989

Q. Jiang, L. Xie, Electron. Lett. 25, 1626 (1989).
[CrossRef]

1988

1987

T. Kimura, J. Lightwave Technol. LT-5, 414 (1987).
[CrossRef]

1984

T. Yanagawa, S. Saito, Y. Yamamoto, Appl. Phys. Lett. 45, 826 (1984).
[CrossRef]

1982

T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
[CrossRef]

1978

V. L. Davies, S. Ezekiel, Proc. Soc. Photo-Opt. Instrum. Eng. 157, 13 (1978).

Bucaro, J. A.

T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
[CrossRef]

Core, J. H.

T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
[CrossRef]

Dandridge, A.

T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
[CrossRef]

Davies, V. L.

V. L. Davies, S. Ezekiel, Proc. Soc. Photo-Opt. Instrum. Eng. 157, 13 (1978).

Ezekiel, S.

V. L. Davies, S. Ezekiel, Proc. Soc. Photo-Opt. Instrum. Eng. 157, 13 (1978).

Giallorenzi, T. G.

T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
[CrossRef]

Jiang, Q.

Q. Jiang, L. Xie, Electron. Lett. 25, 1626 (1989).
[CrossRef]

Kaminow, I. P.

I. P. Kaminow, J. Select. Areas Commun. 8, 1005 (1990).
[CrossRef]

Kimura, T.

T. Kimura, J. Lightwave Technol. LT-5, 414 (1987).
[CrossRef]

Priest, R. G.

T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
[CrossRef]

Rashleigh, S. C.

T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
[CrossRef]

Saito, S.

T. Yanagawa, S. Saito, Y. Yamamoto, Appl. Phys. Lett. 45, 826 (1984).
[CrossRef]

Sigeru, G. H.

T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
[CrossRef]

Tu, S.

S. Tu, Frequency Stabilization and Measurement Frequency Technology, 1st ed. (Science, Beijing, China, 1986), Chap. 5, p. 133.

Wang, D.

Wang, Y.

Xie, L.

Yamamoto, Y.

T. Yanagawa, S. Saito, Y. Yamamoto, Appl. Phys. Lett. 45, 826 (1984).
[CrossRef]

Yanagawa, T.

T. Yanagawa, S. Saito, Y. Yamamoto, Appl. Phys. Lett. 45, 826 (1984).
[CrossRef]

Appl. Phys. Lett.

T. Yanagawa, S. Saito, Y. Yamamoto, Appl. Phys. Lett. 45, 826 (1984).
[CrossRef]

Electron. Lett.

Q. Jiang, L. Xie, Electron. Lett. 25, 1626 (1989).
[CrossRef]

IEEE J. Quantum Electron.

T. G. Giallorenzi, J. A. Bucaro, A. Dandridge, G. H. Sigeru, J. H. Core, S. C. Rashleigh, R. G. Priest, IEEE J. Quantum Electron. QE-18, 626 (1982).
[CrossRef]

J. Lightwave Technol.

T. Kimura, J. Lightwave Technol. LT-5, 414 (1987).
[CrossRef]

J. Select. Areas Commun.

I. P. Kaminow, J. Select. Areas Commun. 8, 1005 (1990).
[CrossRef]

Opt. Lett.

Proc. Soc. Photo-Opt. Instrum. Eng.

V. L. Davies, S. Ezekiel, Proc. Soc. Photo-Opt. Instrum. Eng. 157, 13 (1978).

Other

S. Tu, Frequency Stabilization and Measurement Frequency Technology, 1st ed. (Science, Beijing, China, 1986), Chap. 5, p. 133.

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Figures (4)

Fig. 1
Fig. 1

Schematic of the spectral measurement system of the NH3 absorption line. In the GEC laser 1 represents an antireflection-coated 0.65-N.A. gradient-index rod, 2 represents a laser diode, 3 represents Peltier cooling, 4 represents a piezoelectric translator, and 5 represents a grating. BS’s, beam splitters; O.D.C’s, optical directional couplers.

Fig. 2
Fig. 2

Absorption spectrum of NH3 at 1.5361 μm obtained with an XY recorder. Curve (a) is obtained at a pressure of 21 Torr; curve (b) is obtained at a pressure of 10 Torr. The center wavelength of the left peak of the two curves is 1.5361 μm.

Fig. 3
Fig. 3

Experiment block diagram for frequency stabilization of the GEC semiconductor laser. OSC., oscillator; LPF, low-pass filter.

Fig. 4
Fig. 4

Recorded frequency fluctuation of the laser. Lower trace: the left-hand signal is in the free-running condition, and the right-hand signal is frequency locked to the center of the NH3 absorption line at 1.5361 μm. Upper trace: same as the lower right-hand signal but with a different measurement scale.

Tables (1)

Tables Icon

Table 1 Measurement Results of NH3 Absorption Spectral Linesa

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