Abstract

We introduce a method for measuring the anisotropy of nonlinear absorption and nonlinear refraction in crystals by incorporating a wave plate into the Z-scan apparatus. We demonstrate this method by measuring the polarization dependence of the nonlinear refractive index or two-photon absorption coefficient in BaF2, KTP, and GaAs at wavelengths of 532 and 1064 nm.

© 1993 Optical Society of America

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