Abstract

The in-plane and vertical birefringences of polycarbonate optical disk substrates are important parameters that can adversely affect the system performance. However, these parameters are difficult to measure in coated disks with current techniques. An approach based on a variable-angle spectroscopic ellipsometer allows measurement of the birefringence for coated disks. In particular, it is possible to obtain the vertical birefringence, which is of increasing importance, in a relatively simple manner. Comparison between coated and uncoated substrates shows that the birefringence can decrease after coating with magneto-optical layers.

© 1993 Optical Society of America

Investigation of substrate birefringence effects on optical-disk performance

Bruce E. Bernacki and M. Mansuripur
Appl. Opt. 32(32) 6547-6555 (1993)

Temperature dependence of the birefringence of optical-disk substrates

Timothy D. Goodman, Ronald E. Gerber, and M. Mansuripur
Appl. Opt. 35(16) 3031-3038 (1996)

Retroreflecting ellipsometer for measuring the birefringence of optical disk substrates

Hong Fu, T. Goodman, S. Sugaya, J. K. Erwin, and M. Mansuripur
Appl. Opt. 34(1) 31-39 (1995)

Measurement of birefringence for optical recording of disk substrates

Hong Fu, S. Sugaya, J. K. Erwin, and M. Mansuripur
Appl. Opt. 33(10) 1938-1949 (1994)

Measurement of the wavelength dependence of birefringence for optical disk substrates

Hong Fu, Zheng Yan, and M. Mansuripur
Appl. Opt. 33(31) 7406-7411 (1994)