Abstract

We show that implantation of electrons erases the second-order nonlinearity in thermally poled silica. This technique provides a versatile new means of realizing quasi-phase-matching structures for parametric frequency conversion in glass optical fibers and planar waveguides.

© 1993 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. R. A. Myers, N. Mukherjee, S. R. Brueck, Opt. Lett. 16, 1732 (1991).
    [CrossRef] [PubMed]
  2. A. Okada, K. Ishii, K. Mito, K. Sasaki, Appl. Phys. Lett. 60, 2853 (1992).
    [CrossRef]
  3. P. G. Kazansky, A. Kamal, P. St. J. Russell, Opt. Lett. 18, 693 (1993).
    [CrossRef] [PubMed]
  4. T. E. Everhart, P. H. Hoff, J. Appl. Phys. 42, 5837 (1971).
    [CrossRef]
  5. P. J. Goodhews, F. J. Humpheries, Electron Microscopy and Analysis, 2nd ed. (Taylor & Francis, London, 1988), Chap. 2, p. 32.
  6. L. Reimer, Scanning Electron Microscopy (Springer-Verlag, Berlin, 1984), Chap. 3, p. 99.
  7. J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York, 1981), Chap. 3, p. 26.

1993 (1)

1992 (1)

A. Okada, K. Ishii, K. Mito, K. Sasaki, Appl. Phys. Lett. 60, 2853 (1992).
[CrossRef]

1991 (1)

1971 (1)

T. E. Everhart, P. H. Hoff, J. Appl. Phys. 42, 5837 (1971).
[CrossRef]

Brueck, S. R.

Echlin, P.

J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York, 1981), Chap. 3, p. 26.

Everhart, T. E.

T. E. Everhart, P. H. Hoff, J. Appl. Phys. 42, 5837 (1971).
[CrossRef]

Fiori, C.

J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York, 1981), Chap. 3, p. 26.

Goldstein, J. I.

J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York, 1981), Chap. 3, p. 26.

Goodhews, P. J.

P. J. Goodhews, F. J. Humpheries, Electron Microscopy and Analysis, 2nd ed. (Taylor & Francis, London, 1988), Chap. 2, p. 32.

Hoff, P. H.

T. E. Everhart, P. H. Hoff, J. Appl. Phys. 42, 5837 (1971).
[CrossRef]

Humpheries, F. J.

P. J. Goodhews, F. J. Humpheries, Electron Microscopy and Analysis, 2nd ed. (Taylor & Francis, London, 1988), Chap. 2, p. 32.

Ishii, K.

A. Okada, K. Ishii, K. Mito, K. Sasaki, Appl. Phys. Lett. 60, 2853 (1992).
[CrossRef]

Joy, D. C.

J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York, 1981), Chap. 3, p. 26.

Kamal, A.

Kazansky, P. G.

Lifshin, E.

J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York, 1981), Chap. 3, p. 26.

Mito, K.

A. Okada, K. Ishii, K. Mito, K. Sasaki, Appl. Phys. Lett. 60, 2853 (1992).
[CrossRef]

Mukherjee, N.

Myers, R. A.

Newbury, D. E.

J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York, 1981), Chap. 3, p. 26.

Okada, A.

A. Okada, K. Ishii, K. Mito, K. Sasaki, Appl. Phys. Lett. 60, 2853 (1992).
[CrossRef]

Reimer, L.

L. Reimer, Scanning Electron Microscopy (Springer-Verlag, Berlin, 1984), Chap. 3, p. 99.

Russell, P. St. J.

Sasaki, K.

A. Okada, K. Ishii, K. Mito, K. Sasaki, Appl. Phys. Lett. 60, 2853 (1992).
[CrossRef]

Appl. Phys. Lett. (1)

A. Okada, K. Ishii, K. Mito, K. Sasaki, Appl. Phys. Lett. 60, 2853 (1992).
[CrossRef]

J. Appl. Phys. (1)

T. E. Everhart, P. H. Hoff, J. Appl. Phys. 42, 5837 (1971).
[CrossRef]

Opt. Lett. (2)

Other (3)

P. J. Goodhews, F. J. Humpheries, Electron Microscopy and Analysis, 2nd ed. (Taylor & Francis, London, 1988), Chap. 2, p. 32.

L. Reimer, Scanning Electron Microscopy (Springer-Verlag, Berlin, 1984), Chap. 3, p. 99.

J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York, 1981), Chap. 3, p. 26.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Schematic of the side view of the poling geometry. Silica disks of ~20-mm diameter and 1.3-mm thickness were sandwiched between the anode (2 mm × 20 mm) and the cathode.

Fig. 2
Fig. 2

Square root of the SH signal versus the distance from the center of the positive electrode.

Fig. 3
Fig. 3

SH near-field pattern in a thermally poled fused-silica sample photographed from the screen of the TV monitor. The nonlinearity was confined to a 7-μm-wide region that was located ~12 μm below the air–glass interface.

Fig. 4
Fig. 4

SH signal from thermally poled fused silica after electron-beam irradiation as a function of electron energy. The electron current and exposure time were fixed at 3 nA and 1 min, respectively.

Metrics