Abstract

A novel method for measuring the beam quality of short, powerful laser pulses is presented. The method is based on the Z-scan technique used to investigate the nonlinear susceptibilities of optical materials. It is shown that both two-photon absorption and nonlinear refraction of a nonlinear sample can be used to obtain information about the spatial quality of the pulses.

© 1992 Optical Society of America

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References

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  1. A. E. Siegman, Proc. Soc. Photo-Opt. Instrum. Eng. 1224, 1 (1990).
  2. M. W. Sasnett, Proc. Soc. Photo-Opt. Instrum. Eng. 1414, 21 (1991).
  3. A. E. Siegman, M. W. Sasnett, T. F. Johnson, IEEE J. Quantum Electron. 27, 1098 (1991).
    [Crossref]
  4. A. Caprara, G. C. Reali, Opt. Lett. 17, 414 (1992).
    [Crossref] [PubMed]
  5. F. Brioschi, E. Nava, G. C. Reali, IEEE J. Quantum Electron. 28, 1070 (1992).
    [Crossref]
  6. A. E. Siegman, “Beam divergence measurements and analysis” (unpublished notes, 1977).
  7. M. Sheik-Bahae, A. A. Said, E. W. Van Stryland, Opt. Lett. 14, 955 (1989).
    [Crossref] [PubMed]
  8. M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
    [Crossref]
  9. D. Weaire, B. S. Wherrett, D. A. B. Miller, S. D. Smith, Opt. Lett. 4, 331 (1979).
    [Crossref] [PubMed]
  10. A. Agnesi, G. Gabetta, G. C. Reali, Opt. Commun. 88, 54 (1992).
    [Crossref]
  11. A. Cutolo, L. Zeni, Opt. Commun. 89, 223 (1992).
    [Crossref]
  12. R. DeSalvo, D. J. Hagan, M. Sheik-Bahae, G. Stegeman, E. W. Van Stryland, Opt. Lett. 17, 28 (1992).
    [Crossref] [PubMed]

1992 (5)

A. Caprara, G. C. Reali, Opt. Lett. 17, 414 (1992).
[Crossref] [PubMed]

F. Brioschi, E. Nava, G. C. Reali, IEEE J. Quantum Electron. 28, 1070 (1992).
[Crossref]

A. Agnesi, G. Gabetta, G. C. Reali, Opt. Commun. 88, 54 (1992).
[Crossref]

A. Cutolo, L. Zeni, Opt. Commun. 89, 223 (1992).
[Crossref]

R. DeSalvo, D. J. Hagan, M. Sheik-Bahae, G. Stegeman, E. W. Van Stryland, Opt. Lett. 17, 28 (1992).
[Crossref] [PubMed]

1991 (2)

M. W. Sasnett, Proc. Soc. Photo-Opt. Instrum. Eng. 1414, 21 (1991).

A. E. Siegman, M. W. Sasnett, T. F. Johnson, IEEE J. Quantum Electron. 27, 1098 (1991).
[Crossref]

1990 (2)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[Crossref]

A. E. Siegman, Proc. Soc. Photo-Opt. Instrum. Eng. 1224, 1 (1990).

1989 (1)

1979 (1)

Agnesi, A.

A. Agnesi, G. Gabetta, G. C. Reali, Opt. Commun. 88, 54 (1992).
[Crossref]

Brioschi, F.

F. Brioschi, E. Nava, G. C. Reali, IEEE J. Quantum Electron. 28, 1070 (1992).
[Crossref]

Caprara, A.

Cutolo, A.

A. Cutolo, L. Zeni, Opt. Commun. 89, 223 (1992).
[Crossref]

DeSalvo, R.

Gabetta, G.

A. Agnesi, G. Gabetta, G. C. Reali, Opt. Commun. 88, 54 (1992).
[Crossref]

Hagan, D. J.

R. DeSalvo, D. J. Hagan, M. Sheik-Bahae, G. Stegeman, E. W. Van Stryland, Opt. Lett. 17, 28 (1992).
[Crossref] [PubMed]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[Crossref]

Johnson, T. F.

A. E. Siegman, M. W. Sasnett, T. F. Johnson, IEEE J. Quantum Electron. 27, 1098 (1991).
[Crossref]

Miller, D. A. B.

Nava, E.

F. Brioschi, E. Nava, G. C. Reali, IEEE J. Quantum Electron. 28, 1070 (1992).
[Crossref]

Reali, G. C.

F. Brioschi, E. Nava, G. C. Reali, IEEE J. Quantum Electron. 28, 1070 (1992).
[Crossref]

A. Caprara, G. C. Reali, Opt. Lett. 17, 414 (1992).
[Crossref] [PubMed]

A. Agnesi, G. Gabetta, G. C. Reali, Opt. Commun. 88, 54 (1992).
[Crossref]

Said, A. A.

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[Crossref]

M. Sheik-Bahae, A. A. Said, E. W. Van Stryland, Opt. Lett. 14, 955 (1989).
[Crossref] [PubMed]

Sasnett, M. W.

M. W. Sasnett, Proc. Soc. Photo-Opt. Instrum. Eng. 1414, 21 (1991).

A. E. Siegman, M. W. Sasnett, T. F. Johnson, IEEE J. Quantum Electron. 27, 1098 (1991).
[Crossref]

Sheik-Bahae, M.

Siegman, A. E.

A. E. Siegman, M. W. Sasnett, T. F. Johnson, IEEE J. Quantum Electron. 27, 1098 (1991).
[Crossref]

A. E. Siegman, Proc. Soc. Photo-Opt. Instrum. Eng. 1224, 1 (1990).

A. E. Siegman, “Beam divergence measurements and analysis” (unpublished notes, 1977).

Smith, S. D.

Stegeman, G.

Van Stryland, E. W.

Weaire, D.

Wei, T. H.

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[Crossref]

Wherrett, B. S.

Zeni, L.

A. Cutolo, L. Zeni, Opt. Commun. 89, 223 (1992).
[Crossref]

IEEE J. Quantum Electron. (3)

A. E. Siegman, M. W. Sasnett, T. F. Johnson, IEEE J. Quantum Electron. 27, 1098 (1991).
[Crossref]

F. Brioschi, E. Nava, G. C. Reali, IEEE J. Quantum Electron. 28, 1070 (1992).
[Crossref]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[Crossref]

Opt. Commun. (2)

A. Agnesi, G. Gabetta, G. C. Reali, Opt. Commun. 88, 54 (1992).
[Crossref]

A. Cutolo, L. Zeni, Opt. Commun. 89, 223 (1992).
[Crossref]

Opt. Lett. (4)

Proc. Soc. Photo-Opt. Instrum. Eng. (2)

A. E. Siegman, Proc. Soc. Photo-Opt. Instrum. Eng. 1224, 1 (1990).

M. W. Sasnett, Proc. Soc. Photo-Opt. Instrum. Eng. 1414, 21 (1991).

Other (1)

A. E. Siegman, “Beam divergence measurements and analysis” (unpublished notes, 1977).

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Figures (2)

Fig. 1
Fig. 1

Experimental Z-scan results for a nearly TEM00 mode: (a) with 1-mm-thick CS2 as the nonlinear refractive sample, (b) with a 0.9-mm-thick GaAs plate as the TPA sample.

Fig. 2
Fig. 2

Experimental results for a clipped Gaussian beam: (a) CS2 response, (b) GaAs response.

Equations (4)

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W ( z ) = W 0 [ 1 + ( z z R ) 2 ] 1 / 2 ,
T 1 1 2 β L eff I 0 1 + ( z / z R ) 2 ,
M NL 2 = π z R λ 0 ( W i f ) 2 ,
Δ T ( x ) 4 x Δ Φ 0 ( x 2 + 1 ) ( x 2 + 9 ) ,

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