Abstract

Phase-sensitive coherence-domain reflectometry is shown to be suited for testing laser diodes with respect to weakly reflecting irregularities inside the cavity, distributed scatterers, group indices, dispersion, and gain properties, the latter both spatially and spectrally resolved.

© 1992 Optical Society of America

High-speed optical coherence domain reflectometry

E. A. Swanson, D. Huang, M. R. Hee, J. G. Fujimoto, C. P. Lin, and C. A. Puliafito
Opt. Lett. 17(2) 151-153 (1992)

Characterization of silica-based waveguides with an interferometric optical time-domain reflectometry system using a 1.3-μm-wavelength superluminescent diode

Kazumasa Takada, Norio Takato, Juichi Noda, and Yoshio Noguchi
Opt. Lett. 14(13) 706-708 (1989)

Optical coherence-domain reflectometry: a new optical evaluation technique

Robert C. Youngquist, Sally Carr, and D. E. N. Davies
Opt. Lett. 12(3) 158-160 (1987)

High-speed optical coherence domain reflectometry: erratum

E. A. Swanson, D. Huang, M. R. Hee, J. G. Fujimoto, C. P. Lin, and C. A. Puliafito
Opt. Lett. 17(7) 547-547 (1992)

High-resolution reflectometry in biological tissues

X. Clivaz, F. Marquis-Weible, R. P. Salathé, R. P. Novàk, and H. H. Gilgen
Opt. Lett. 17(1) 4-6 (1992)