Abstract

The relaxation processes in As2S3 films related to the self-enhancement effect of holographic gratings with low initial diffraction efficiencies are examined. It is demonstrated that the dark relaxation plays a noticeable role in the self-enhancement.

© 1992 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. A. O. Ozols, K. K. Shvarts, M. I. Reinfelde, Proc. Soc. Photo-Opt. Instrum. Eng. 1183, 159 (1990).
  2. P. Ketolainen, A. Ozols, V. Pashkevich, O. Salminen, P. Silfsten, K. Shvarts, Avtometria 4, 103 (1988) [published in English in Optoelectron. Instrum. Data Process. 4, 109 (1988)].

1990 (1)

A. O. Ozols, K. K. Shvarts, M. I. Reinfelde, Proc. Soc. Photo-Opt. Instrum. Eng. 1183, 159 (1990).

1988 (1)

P. Ketolainen, A. Ozols, V. Pashkevich, O. Salminen, P. Silfsten, K. Shvarts, Avtometria 4, 103 (1988) [published in English in Optoelectron. Instrum. Data Process. 4, 109 (1988)].

Ketolainen, P.

P. Ketolainen, A. Ozols, V. Pashkevich, O. Salminen, P. Silfsten, K. Shvarts, Avtometria 4, 103 (1988) [published in English in Optoelectron. Instrum. Data Process. 4, 109 (1988)].

Ozols, A.

P. Ketolainen, A. Ozols, V. Pashkevich, O. Salminen, P. Silfsten, K. Shvarts, Avtometria 4, 103 (1988) [published in English in Optoelectron. Instrum. Data Process. 4, 109 (1988)].

Ozols, A. O.

A. O. Ozols, K. K. Shvarts, M. I. Reinfelde, Proc. Soc. Photo-Opt. Instrum. Eng. 1183, 159 (1990).

Pashkevich, V.

P. Ketolainen, A. Ozols, V. Pashkevich, O. Salminen, P. Silfsten, K. Shvarts, Avtometria 4, 103 (1988) [published in English in Optoelectron. Instrum. Data Process. 4, 109 (1988)].

Reinfelde, M. I.

A. O. Ozols, K. K. Shvarts, M. I. Reinfelde, Proc. Soc. Photo-Opt. Instrum. Eng. 1183, 159 (1990).

Salminen, O.

P. Ketolainen, A. Ozols, V. Pashkevich, O. Salminen, P. Silfsten, K. Shvarts, Avtometria 4, 103 (1988) [published in English in Optoelectron. Instrum. Data Process. 4, 109 (1988)].

Shvarts, K.

P. Ketolainen, A. Ozols, V. Pashkevich, O. Salminen, P. Silfsten, K. Shvarts, Avtometria 4, 103 (1988) [published in English in Optoelectron. Instrum. Data Process. 4, 109 (1988)].

Shvarts, K. K.

A. O. Ozols, K. K. Shvarts, M. I. Reinfelde, Proc. Soc. Photo-Opt. Instrum. Eng. 1183, 159 (1990).

Silfsten, P.

P. Ketolainen, A. Ozols, V. Pashkevich, O. Salminen, P. Silfsten, K. Shvarts, Avtometria 4, 103 (1988) [published in English in Optoelectron. Instrum. Data Process. 4, 109 (1988)].

Avtometria (1)

P. Ketolainen, A. Ozols, V. Pashkevich, O. Salminen, P. Silfsten, K. Shvarts, Avtometria 4, 103 (1988) [published in English in Optoelectron. Instrum. Data Process. 4, 109 (1988)].

Proc. Soc. Photo-Opt. Instrum. Eng. (1)

A. O. Ozols, K. K. Shvarts, M. I. Reinfelde, Proc. Soc. Photo-Opt. Instrum. Eng. 1183, 159 (1990).

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (1)

Fig. 1
Fig. 1

Self-enhancement in As2S3 films. Curves 1–3 are taken with pulsed readout for initial DE values η0 of 0.19 × 10−3%, 1.01 × 10−3%, and 2.84 × 10−3%, respectively. Curves 4–6 correspond to continuous readout and η0 values of 0.29 × 10−3%, 1.17 × 10−3%, and 1.51 × 10−3, respectively.

Metrics