Abstract

A novel transient-grating geometry, which is nondegenerate, copropagating, phase matched, and polarization sensitive, is used to isolate and measure independently the ultrafast dynamics of multiple coexisting gratings in GaAs:EL2 with a temporal resolution of <5 psec. This technique permits the measurement of the evolution of the photorefractive grating in materials with zinc blende symmetry, where the photorefractive grating is usually obscured by the stronger free-carrier and instantaneous bound-electronic gratings.

© 1991 Optical Society of America

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