Abstract

We have developed a technique to measure the group-delay time of optical components with a temporal resolution of ±0.1 fsec and a spectral resolution of 0.1 nm over the spectral region 600–640 nm. The group delay is determined from a measurement of the optical path length through the component as a function of wavelength with a phase-locked interferometer.

© 1990 Optical Society of America

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References

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  1. R. L. Fork, C. H. Brito-Cruz, P. C. Becker, C. V. Shank, Opt. Lett. 12, 483 (1987).
    [CrossRef] [PubMed]
  2. W. H. Knox, N. M. Pearson, K. D. Li, C. A. Hirlimann, Opt. Lett. 13, 574 (1988).
    [CrossRef] [PubMed]
  3. K. D. Li, W. H. Knox, N. M. Pearson, Opt. Lett. 14, 450 (1989).
    [CrossRef] [PubMed]
  4. H.-T. Shang, Electron. Lett. 17, 603 (1981).
    [CrossRef]
  5. J. Stone, D. Marcuse, Electron. Lett. 20, 751 (1984).
    [CrossRef]
  6. G. W. Johnson, D. C. Leiner, D. T. Moore, Opt. Eng. 18, 46 (1979).
  7. J. J. Miceli, Ph.D. dissertation (University of Rochester, Rochester, N. Y., 1982).

1989 (1)

1988 (1)

1987 (1)

1984 (1)

J. Stone, D. Marcuse, Electron. Lett. 20, 751 (1984).
[CrossRef]

1981 (1)

H.-T. Shang, Electron. Lett. 17, 603 (1981).
[CrossRef]

1979 (1)

G. W. Johnson, D. C. Leiner, D. T. Moore, Opt. Eng. 18, 46 (1979).

Becker, P. C.

Brito-Cruz, C. H.

Fork, R. L.

Hirlimann, C. A.

Johnson, G. W.

G. W. Johnson, D. C. Leiner, D. T. Moore, Opt. Eng. 18, 46 (1979).

Knox, W. H.

Leiner, D. C.

G. W. Johnson, D. C. Leiner, D. T. Moore, Opt. Eng. 18, 46 (1979).

Li, K. D.

Marcuse, D.

J. Stone, D. Marcuse, Electron. Lett. 20, 751 (1984).
[CrossRef]

Miceli, J. J.

J. J. Miceli, Ph.D. dissertation (University of Rochester, Rochester, N. Y., 1982).

Moore, D. T.

G. W. Johnson, D. C. Leiner, D. T. Moore, Opt. Eng. 18, 46 (1979).

Pearson, N. M.

Shang, H.-T.

H.-T. Shang, Electron. Lett. 17, 603 (1981).
[CrossRef]

Shank, C. V.

Stone, J.

J. Stone, D. Marcuse, Electron. Lett. 20, 751 (1984).
[CrossRef]

Electron. Lett. (2)

H.-T. Shang, Electron. Lett. 17, 603 (1981).
[CrossRef]

J. Stone, D. Marcuse, Electron. Lett. 20, 751 (1984).
[CrossRef]

Opt. Eng. (1)

G. W. Johnson, D. C. Leiner, D. T. Moore, Opt. Eng. 18, 46 (1979).

Opt. Lett. (3)

Other (1)

J. J. Miceli, Ph.D. dissertation (University of Rochester, Rochester, N. Y., 1982).

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Figures (3)

Fig. 1
Fig. 1

(a) Deviation of the OPL from a straight line Δl as a function of wavelength; the solid curve is the quadratic correction to the SVD fit. (b) The group-delay time as determined from the fit. For clarity, every other data point is shown in (a), while every fourth point is plotted in (b).

Fig. 2
Fig. 2

Group delay of a 6.08-mm sample of BK7 glass plotted versus wavelength. The circles are every fourth point of the measured data, while the solid curve is the theoretically determined delay.

Fig. 3
Fig. 3

Group delay of a pair of prisms whose apexes are separated by 14 cm versus the wavelength. The data of curve (a) are for one thickness of glass, while the data in curve (b) are for an increased thickness of glass. For clarity, every fourth data point is plotted.

Equations (4)

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I ( t ) = 2 I 1 { 1 + cos [ ϕ + A sin ( ωt ) ] } ,
I ( t ) = 2 I 1 { 1 + cos ( ϕ ) [ J 0 ( A ) + 2 J 2 ( A ) cos ( 2 ωt ) + ] sin ( ϕ ) [ 2 J 1 ( A ) sin ( ωt ) + 2 J 3 ( A ) sin ( 3 ωt ) + ] } .
l r = + l t + P ( λ ) m = 0 , ± 1 , ,
τ ( λ ) = 1 c [ P λ ( d P d λ ) ] .

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