Abstract

Backscattering of silica-based glass waveguides is characterized for the first time to our knowledge by using an interferometric optical time-domain reflectometry system. High spatial resolution, as short as 15 μm, is obtained by using a newly developed 1.3-μm-wavelength superluminescent diode. Scattering centers produced by waveguide irregularities are clearly observed in glass optical waveguides. Waveguide loss and bend loss in the curved regions are estimated from the backscattered light intensity distribution.

© 1989 Optical Society of America

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References

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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]

1989

H. Nagai, Y. Noguchi, S. Suda, Appl. Phys. Lett. 54, 18 (1989).
[CrossRef]

N. Takato, M. Yasu, M. Kawachi, Electron. Lett. 22, 321 (1989).
[CrossRef]

1987

1986

I. Yokohama, M. Kawachi, K. Okamoto, J. Noda, Electron. Lett. 22, 929 (1986).
[CrossRef]

1977

S. D. Personick, Bell Syst. Tech. J. 56, 355 (1977).

1976

Barnoski, M. K.

Chida, K.

Jensen, S. M.

Kawachi, M.

N. Takato, M. Yasu, M. Kawachi, Electron. Lett. 22, 321 (1989).
[CrossRef]

I. Yokohama, M. Kawachi, K. Okamoto, J. Noda, Electron. Lett. 22, 929 (1986).
[CrossRef]

Nagai, H.

H. Nagai, Y. Noguchi, S. Suda, Appl. Phys. Lett. 54, 18 (1989).
[CrossRef]

Noda, J.

K. Takada, I. Yokohama, K. Chida, J. Noda, Appl. Opt. 26, 1603 (1987).
[CrossRef] [PubMed]

I. Yokohama, M. Kawachi, K. Okamoto, J. Noda, Electron. Lett. 22, 929 (1986).
[CrossRef]

Noguchi, Y.

H. Nagai, Y. Noguchi, S. Suda, Appl. Phys. Lett. 54, 18 (1989).
[CrossRef]

Okamoto, K.

I. Yokohama, M. Kawachi, K. Okamoto, J. Noda, Electron. Lett. 22, 929 (1986).
[CrossRef]

Personick, S. D.

S. D. Personick, Bell Syst. Tech. J. 56, 355 (1977).

Suda, S.

H. Nagai, Y. Noguchi, S. Suda, Appl. Phys. Lett. 54, 18 (1989).
[CrossRef]

Takada, K.

Takato, N.

N. Takato, M. Yasu, M. Kawachi, Electron. Lett. 22, 321 (1989).
[CrossRef]

Yasu, M.

N. Takato, M. Yasu, M. Kawachi, Electron. Lett. 22, 321 (1989).
[CrossRef]

Yokohama, I.

K. Takada, I. Yokohama, K. Chida, J. Noda, Appl. Opt. 26, 1603 (1987).
[CrossRef] [PubMed]

I. Yokohama, M. Kawachi, K. Okamoto, J. Noda, Electron. Lett. 22, 929 (1986).
[CrossRef]

Appl. Opt.

Appl. Phys. Lett.

H. Nagai, Y. Noguchi, S. Suda, Appl. Phys. Lett. 54, 18 (1989).
[CrossRef]

Bell Syst. Tech. J.

S. D. Personick, Bell Syst. Tech. J. 56, 355 (1977).

Electron. Lett.

I. Yokohama, M. Kawachi, K. Okamoto, J. Noda, Electron. Lett. 22, 929 (1986).
[CrossRef]

N. Takato, M. Yasu, M. Kawachi, Electron. Lett. 22, 321 (1989).
[CrossRef]

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Figures (5)

Fig. 1
Fig. 1

Experimental setup of the interferometric OTDR system. P, polarizer; OSC, oscillator; M1, M2, mirrors; P1, P2, optical paths in the Michelson interferometer; HM, half-mirror; A, analyzer; PD, photodiode; DVM, digital voltmeter.

Fig. 2
Fig. 2

Reflected light intensity distribution for a curved (8-mm-radius) glass waveguide. Regions A and C are straight waveguides, and region B is a curved waveguide. The light is coupled into the waveguide from the input end of region A.

Fig. 3
Fig. 3

Reflected light intensity distribution in the curved waveguide in Fig. 2. The light is coupled into the waveguide from the input end of region C.

Fig 4
Fig 4

Reflected light intensity distribution in curved (3-mm-radius) glass waveguide. The light is coupled into the waveguide from the input end of region A.

Fig. 5
Fig. 5

Reflected light intensity distribution in the curved waveguide in Fig. 4. The light is coupled into the waveguide from the input end of region C.

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