Abstract

The intensity of the XeF CA transition induced by a subpicosecond KrF laser is shown to have a cubic dependence on KrF laser intensity. The third-order autocorrelation technique for measuring the duration of a single KrF subpicosecond pulse has been developed utilizing this visible transition. A pulse width of 220 fsec was successfully measured with a high contrast of ~10. The visible fluorescence is more useful to researchers than vacuum-UV fluorescences. Furthermore, this simple technique may be applied over a wide UV wavelength region from 204 to 306 nm.

© 1988 Optical Society of America

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References

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  1. C. K. Rhodes, Science 229, 1345 (1985).
    [Crossref] [PubMed]
  2. S. Watanabe, A. Endoh, M. Watanabe, N. Surakura, Opt. Lett. 13, 580 (1988).
    [Crossref] [PubMed]
  3. M. H. R. Hutchinson, I. A. McIntyre, G. N. Gibson, C. K. Rhodes, Opt. Lett. 12, 102 (1987).
    [Crossref] [PubMed]
  4. W. Walter, R. Sauerbery, F. K. Tittel, W. L. Wilson, Appl. Phys. Lett. 41, 387 (1982).
    [Crossref]
  5. A. P. Schwarzenbach, T. S. Luk, I. A. McIntyre, U. Johann, A. McPherson, K. Boyer, C. K. Rhodes, Opt. Lett. 11, 499 (1986).
    [Crossref] [PubMed]
  6. M. Watanabe, A. Endoh, N. Sarukura, S. Watanabe, in Digest of the Sixth International Conference on Ultrafast Phenomena (Springer-Verlag, Tokyo, 1988), paper FG 2-1.
  7. R. Sauerbery, W. Walter, F. K. Tittel, W. L. Wilson, J. Chem. Phys. 78, 737 (1983).
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    [Crossref]
  9. D. J. Bradley, G. H. C. New, Proc. IEEE 62, 313 (1974).
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    [Crossref]

1988 (1)

1987 (1)

1986 (1)

1985 (1)

C. K. Rhodes, Science 229, 1345 (1985).
[Crossref] [PubMed]

1983 (1)

R. Sauerbery, W. Walter, F. K. Tittel, W. L. Wilson, J. Chem. Phys. 78, 737 (1983).

1982 (2)

N. Morita, T. Yajima, Appl. Phys. B 28, 25 (1982).
[Crossref]

W. Walter, R. Sauerbery, F. K. Tittel, W. L. Wilson, Appl. Phys. Lett. 41, 387 (1982).
[Crossref]

1974 (1)

D. J. Bradley, G. H. C. New, Proc. IEEE 62, 313 (1974).
[Crossref]

1971 (1)

D. H. Auston, IEEE J. Quantum Electron. QE-7, 465 (1971).
[Crossref]

Auston, D. H.

D. H. Auston, IEEE J. Quantum Electron. QE-7, 465 (1971).
[Crossref]

Boyer, K.

Bradley, D. J.

D. J. Bradley, G. H. C. New, Proc. IEEE 62, 313 (1974).
[Crossref]

Endoh, A.

S. Watanabe, A. Endoh, M. Watanabe, N. Surakura, Opt. Lett. 13, 580 (1988).
[Crossref] [PubMed]

M. Watanabe, A. Endoh, N. Sarukura, S. Watanabe, in Digest of the Sixth International Conference on Ultrafast Phenomena (Springer-Verlag, Tokyo, 1988), paper FG 2-1.

Gibson, G. N.

Hutchinson, M. H. R.

Johann, U.

Luk, T. S.

McIntyre, I. A.

McPherson, A.

Morita, N.

N. Morita, T. Yajima, Appl. Phys. B 28, 25 (1982).
[Crossref]

New, G. H. C.

D. J. Bradley, G. H. C. New, Proc. IEEE 62, 313 (1974).
[Crossref]

Rhodes, C. K.

Sarukura, N.

M. Watanabe, A. Endoh, N. Sarukura, S. Watanabe, in Digest of the Sixth International Conference on Ultrafast Phenomena (Springer-Verlag, Tokyo, 1988), paper FG 2-1.

Sauerbery, R.

R. Sauerbery, W. Walter, F. K. Tittel, W. L. Wilson, J. Chem. Phys. 78, 737 (1983).

W. Walter, R. Sauerbery, F. K. Tittel, W. L. Wilson, Appl. Phys. Lett. 41, 387 (1982).
[Crossref]

Schwarzenbach, A. P.

Surakura, N.

Tittel, F. K.

R. Sauerbery, W. Walter, F. K. Tittel, W. L. Wilson, J. Chem. Phys. 78, 737 (1983).

W. Walter, R. Sauerbery, F. K. Tittel, W. L. Wilson, Appl. Phys. Lett. 41, 387 (1982).
[Crossref]

Walter, W.

R. Sauerbery, W. Walter, F. K. Tittel, W. L. Wilson, J. Chem. Phys. 78, 737 (1983).

W. Walter, R. Sauerbery, F. K. Tittel, W. L. Wilson, Appl. Phys. Lett. 41, 387 (1982).
[Crossref]

Watanabe, M.

S. Watanabe, A. Endoh, M. Watanabe, N. Surakura, Opt. Lett. 13, 580 (1988).
[Crossref] [PubMed]

M. Watanabe, A. Endoh, N. Sarukura, S. Watanabe, in Digest of the Sixth International Conference on Ultrafast Phenomena (Springer-Verlag, Tokyo, 1988), paper FG 2-1.

Watanabe, S.

S. Watanabe, A. Endoh, M. Watanabe, N. Surakura, Opt. Lett. 13, 580 (1988).
[Crossref] [PubMed]

M. Watanabe, A. Endoh, N. Sarukura, S. Watanabe, in Digest of the Sixth International Conference on Ultrafast Phenomena (Springer-Verlag, Tokyo, 1988), paper FG 2-1.

Wilson, W. L.

R. Sauerbery, W. Walter, F. K. Tittel, W. L. Wilson, J. Chem. Phys. 78, 737 (1983).

W. Walter, R. Sauerbery, F. K. Tittel, W. L. Wilson, Appl. Phys. Lett. 41, 387 (1982).
[Crossref]

Yajima, T.

N. Morita, T. Yajima, Appl. Phys. B 28, 25 (1982).
[Crossref]

Appl. Phys. B (1)

N. Morita, T. Yajima, Appl. Phys. B 28, 25 (1982).
[Crossref]

Appl. Phys. Lett. (1)

W. Walter, R. Sauerbery, F. K. Tittel, W. L. Wilson, Appl. Phys. Lett. 41, 387 (1982).
[Crossref]

IEEE J. Quantum Electron. (1)

D. H. Auston, IEEE J. Quantum Electron. QE-7, 465 (1971).
[Crossref]

J. Chem. Phys. (1)

R. Sauerbery, W. Walter, F. K. Tittel, W. L. Wilson, J. Chem. Phys. 78, 737 (1983).

Opt. Lett. (3)

Proc. IEEE (1)

D. J. Bradley, G. H. C. New, Proc. IEEE 62, 313 (1974).
[Crossref]

Science (1)

C. K. Rhodes, Science 229, 1345 (1985).
[Crossref] [PubMed]

Other (1)

M. Watanabe, A. Endoh, N. Sarukura, S. Watanabe, in Digest of the Sixth International Conference on Ultrafast Phenomena (Springer-Verlag, Tokyo, 1988), paper FG 2-1.

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Figures (5)

Fig. 1
Fig. 1

Spectrum of XeF fluorescence induced by the 30-nsec KrF laser.

Fig. 2
Fig. 2

Dependence of XeF BX fluorescence on the intensity of the 30-nsec KrF laser.

Fig. 3
Fig. 3

Dependence of XeF CA fluorescence on the intensity of the 30-nsec KrF laser.

Fig. 4
Fig. 4

Dependence of XeF CA fluorescence on the intensity of the subpicosecond KrF laser.

Fig. 5
Fig. 5

Autocorrelation trace of a single subpicosecond KrF laser pulse. The pulse shape is assumed to be sech2.

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