Abstract

An application of speckle interferometry is presented that allows one to compare the resistance to stress of two nominally identical specimens. The interference pattern gives contours of equal differences in displacements of the two stressed specimens. The method is briefly developed, and its experimental feasibility is demonstrated by comparing the deflections of two square plates clamped along the edges and subjected to centrally concentrated loads.

© 1987 Optical Society of America

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References

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  1. D. B. Neumann, in Technical Digest of the Conference on Hologram Interferometry and Speckle Metrology (Optical Society of America, Washington, D.C., 1982), paper MB-2.
  2. C. M. Vest, Proc. Soc. Photo-Opt. Instrum. Eng. 349, 186 (1982).
  3. B. Breuckmann, Proc. Soc. Photo-Opt. Instrum. Eng. 398, 234 (1983).
  4. P. K. Rastogi, Appl. Opt. 23, 924 (1984).
    [CrossRef] [PubMed]
  5. P. K. Rastogi, J. Phys. E 17, 1094 (1984).
    [CrossRef]
  6. D. B. Neumann, Opt. Eng. 24, 625 (1985).
  7. P. K. Rastogi, Exp. Mech. 25, 325 (1985).
    [CrossRef]
  8. R. K. Erf, Speckle Metrology (Academic, New York, 1978).
  9. M. Françon, Speckle (Masson, Paris, 1978).
  10. R. Jones, C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, Cambridge, 1983).
  11. C. Joenathan, A. R. Ganesan, R. S. Sirohi, Appl. Opt. 25, 3781 (1986).
    [CrossRef] [PubMed]

1986 (1)

1985 (2)

D. B. Neumann, Opt. Eng. 24, 625 (1985).

P. K. Rastogi, Exp. Mech. 25, 325 (1985).
[CrossRef]

1984 (2)

1983 (1)

B. Breuckmann, Proc. Soc. Photo-Opt. Instrum. Eng. 398, 234 (1983).

1982 (1)

C. M. Vest, Proc. Soc. Photo-Opt. Instrum. Eng. 349, 186 (1982).

Breuckmann, B.

B. Breuckmann, Proc. Soc. Photo-Opt. Instrum. Eng. 398, 234 (1983).

Erf, R. K.

R. K. Erf, Speckle Metrology (Academic, New York, 1978).

Françon, M.

M. Françon, Speckle (Masson, Paris, 1978).

Ganesan, A. R.

Joenathan, C.

Jones, R.

R. Jones, C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, Cambridge, 1983).

Neumann, D. B.

D. B. Neumann, Opt. Eng. 24, 625 (1985).

D. B. Neumann, in Technical Digest of the Conference on Hologram Interferometry and Speckle Metrology (Optical Society of America, Washington, D.C., 1982), paper MB-2.

Rastogi, P. K.

P. K. Rastogi, Exp. Mech. 25, 325 (1985).
[CrossRef]

P. K. Rastogi, J. Phys. E 17, 1094 (1984).
[CrossRef]

P. K. Rastogi, Appl. Opt. 23, 924 (1984).
[CrossRef] [PubMed]

Sirohi, R. S.

Vest, C. M.

C. M. Vest, Proc. Soc. Photo-Opt. Instrum. Eng. 349, 186 (1982).

Wykes, C.

R. Jones, C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, Cambridge, 1983).

Appl. Opt. (2)

Exp. Mech. (1)

P. K. Rastogi, Exp. Mech. 25, 325 (1985).
[CrossRef]

J. Phys. E (1)

P. K. Rastogi, J. Phys. E 17, 1094 (1984).
[CrossRef]

Opt. Eng. (1)

D. B. Neumann, Opt. Eng. 24, 625 (1985).

Proc. Soc. Photo-Opt. Instrum. Eng. (2)

C. M. Vest, Proc. Soc. Photo-Opt. Instrum. Eng. 349, 186 (1982).

B. Breuckmann, Proc. Soc. Photo-Opt. Instrum. Eng. 398, 234 (1983).

Other (4)

R. K. Erf, Speckle Metrology (Academic, New York, 1978).

M. Françon, Speckle (Masson, Paris, 1978).

R. Jones, C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, Cambridge, 1983).

D. B. Neumann, in Technical Digest of the Conference on Hologram Interferometry and Speckle Metrology (Optical Society of America, Washington, D.C., 1982), paper MB-2.

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Figures (4)

Fig. 1
Fig. 1

Setup for experimental speckle inteferometry used to obtain fringes that contour the difference in displacements.

Fig. 2
Fig. 2

Schematic diagram of path-length changes due to the loading of the test and the master specimens.

Fig. 3
Fig. 3

Spatial representation of the components of the difference of displacement vectors, ΔSj, that the method seeks to measure.

Fig. 4
Fig. 4

Fringe pattern, corresponding to ΔS3, of two square plates clamped along the edges and subjected to centrally concentrated loads. The panel below the photograph schematically shows the quantity measured.

Equations (5)

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Δ δ ϕ = 2 n π
Δ δ ϕ = 2 π λ j = 1 3 [ ( l e j l o j ) Δ S j S j Δ l j ] ,
Δ δ ϕ = 2 π λ j = 1 3 ( l e j l o j ) Δ S j .
Δ S 3 = n λ / 2 .
Δ S 3 = 0 .

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