Abstract

An optical evaluation technique is described that is suitable for determining the positions and magnitudes of reflection sites within miniature optical assemblies. This method utilizes the coherence effects exhibited by a broadband optical source and is referred to as optical coherence-domain reflectometry. Background theory is given, and experimental results have demonstrated a resolution of 10 μm with an optical dynamic range of more than 100 dB.

© 1987 Optical Society of America

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