Abstract

The occurrence of higher-order Fourier components in an originally sinusoidal free-carrier index grating produced in CdS by interference of two picosecond light pulses is demonstrated by simultaneously monitoring the decay of the first- and second-order diffraction intensity of a transparent probe pulse. A pronounced contribution with doubled period can be attributed to an exciton phase grating formed by binding of electrons and holes of the free-carrier grating.

© 1986 Optical Society of America

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