Abstract

We report recent developments in a technique to measure the thickness of cladding remaining on polished single-mode fiber substrates. This technique relies on the measurement of the throughput attenuation resulting when a drop of liquid of appropriate refractive index is placed on the substrate. Applications to fiber couplers and other all-fiber devices are described.

© 1985 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. R. A. Bergh, G. Kotler, H. J. Shaw, Electron. Lett. 16, 260 (1980).
    [Crossref]
  2. M. J. F. Digonnet, H. J. Shaw, IEEE J. Quantum Electron. 18, 746 (1982).
    [Crossref]
  3. R. A. Bergh, H. C. Lefevre, H. J. Shaw, Opt. Lett. 5, 479 (1980).
    [Crossref] [PubMed]
  4. W. V. Sorin, K. P. Jackson, H. J. Shaw, Electron. Lett. 19, 820 (1983).
    [Crossref]

1983 (1)

W. V. Sorin, K. P. Jackson, H. J. Shaw, Electron. Lett. 19, 820 (1983).
[Crossref]

1982 (1)

M. J. F. Digonnet, H. J. Shaw, IEEE J. Quantum Electron. 18, 746 (1982).
[Crossref]

1980 (2)

R. A. Bergh, G. Kotler, H. J. Shaw, Electron. Lett. 16, 260 (1980).
[Crossref]

R. A. Bergh, H. C. Lefevre, H. J. Shaw, Opt. Lett. 5, 479 (1980).
[Crossref] [PubMed]

Bergh, R. A.

R. A. Bergh, G. Kotler, H. J. Shaw, Electron. Lett. 16, 260 (1980).
[Crossref]

R. A. Bergh, H. C. Lefevre, H. J. Shaw, Opt. Lett. 5, 479 (1980).
[Crossref] [PubMed]

Digonnet, M. J. F.

M. J. F. Digonnet, H. J. Shaw, IEEE J. Quantum Electron. 18, 746 (1982).
[Crossref]

Jackson, K. P.

W. V. Sorin, K. P. Jackson, H. J. Shaw, Electron. Lett. 19, 820 (1983).
[Crossref]

Kotler, G.

R. A. Bergh, G. Kotler, H. J. Shaw, Electron. Lett. 16, 260 (1980).
[Crossref]

Lefevre, H. C.

Shaw, H. J.

W. V. Sorin, K. P. Jackson, H. J. Shaw, Electron. Lett. 19, 820 (1983).
[Crossref]

M. J. F. Digonnet, H. J. Shaw, IEEE J. Quantum Electron. 18, 746 (1982).
[Crossref]

R. A. Bergh, G. Kotler, H. J. Shaw, Electron. Lett. 16, 260 (1980).
[Crossref]

R. A. Bergh, H. C. Lefevre, H. J. Shaw, Opt. Lett. 5, 479 (1980).
[Crossref] [PubMed]

Sorin, W. V.

W. V. Sorin, K. P. Jackson, H. J. Shaw, Electron. Lett. 19, 820 (1983).
[Crossref]

Electron. Lett. (2)

R. A. Bergh, G. Kotler, H. J. Shaw, Electron. Lett. 16, 260 (1980).
[Crossref]

W. V. Sorin, K. P. Jackson, H. J. Shaw, Electron. Lett. 19, 820 (1983).
[Crossref]

IEEE J. Quantum Electron. (1)

M. J. F. Digonnet, H. J. Shaw, IEEE J. Quantum Electron. 18, 746 (1982).
[Crossref]

Opt. Lett. (1)

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Geometry of a polished fiber substrate. A drop of liquid of index n3 placed on the polished region induces a throughput attenuation from which the thickness d can be inferred.

Fig. 2
Fig. 2

Optical attenuation measured when a liquid of index n3 is placed on a polished fiber substrate, as a function of n3 (at the signal wavelength used in the test). (a) When increasing amounts of material are removed from the fiber (the thickness parameters are approximate), (b) when part of the fiber core has been removed.

Fig. 3
Fig. 3

Maximum attenuation (on a log–log scale; see text) versus thickness of cladding material removed from various types of single-mode fiber. The curves were shifted horizontally for clarity.

Fig. 4
Fig. 4

Coupling curve and attenuation curve for a 25-cm radius-of-curvature Corning fiber coupler (a = 3 μm, N. A. = 0.09). See text.

Metrics