Abstract

A new method of measuring the far-field pattern of single-mode optical fibers is presented. The method involves measuring the total power passed by a linear aperture in the far field and can be used with a white-light source. The measured far fields can then be used to determine the wavelength variance of characteristics such as the rms spot size (near or far field) and Gaussian-overlap spot size. The Gaussian-overlap spot size measured agrees well with results from both the transverse-offset and the direct far-field methods.

© 1985 Optical Society of America

Predicting the polarization dependence of two-mode fiber interferometers from the far-field intensity patterns

J. R. Doma and J. Blake
Opt. Lett. 17(23) 1661-1663 (1992)

Mode-field diameter of single-mode optical fiber by far-field scanning

Matt Young
Appl. Opt. 37(24) 5605-5619 (1998)

Dependence of Raman gain on relative index difference for GeO₂-doped single-mode fibers

Takashi Nakashima, Shigeyuki Seikai, and Masataka Nakazawa
Opt. Lett. 10(8) 420-422 (1985)

Microbending dependence of phase in single-mode fibers

Santanu Das, Paul A. Goud, and Colin G. Englefield
Opt. Lett. 10(6) 294-296 (1985)

Single-pass mode-locked or Q-switched pump operation of D₂ gas-in-glass fiber Raman lasers operating at 1.56-μm wavelength

A. R. Chraplyvy and J. Stone
Opt. Lett. 10(7) 344-346 (1985)