Abstract

The dependence of double-heterostructure AlGaAs semiconductor laser wavelength on injection current and temperature was investigated by means of a Michelson interferometer. The lasers operated in a single longitudinal mode at 790 nm, permitting them to be applied to two-wavelength holographic contouring. Continuous change and discontinuous change by mode hopping were observed. The wavelength was continuously tunable by variation of injection current and temperature at rates of 0.0045 nm/mA and 0.070 mm/°C, respectively. Discontinuties in wavelength change were observed to be integer multiples of the longitudinal mode spacing. Holographic contour fringes were interpreted given the measured variation in wavelength.

© 1985 Optical Society of America

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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref] [PubMed]
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    [Crossref] [PubMed]
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    [Crossref]
  14. K. Tatsuno, A. Arimoto, Appl. Opt. 19, 2096 (1980).
    [Crossref] [PubMed]

1982 (1)

R. Ito, M. Suyama, N. Ogasawara, Appl. Phys. Lett. 40, 214 (1982).
[Crossref]

1981 (4)

S. Kobayashi, Y. Tamamoto, T. Kimura, Electron. Lett. 17, 350 (1981).
[Crossref]

L. Goldberg, H. F. Taylor, J. F. Weller, Electron. Lett. 17, 498 (1981).

M. Suyama, N. Ogasawara, R. Ito, Jpn. J. Appl. Phys. 20, L395 (1981).
[Crossref]

P. Melman, W. J. Carlsen, Appl. Opt. 20, 2694 (1981).
[Crossref] [PubMed]

1980 (2)

K. Tatsuno, A. Arimoto, Appl. Opt. 19, 2096 (1980).
[Crossref] [PubMed]

T. Okoshi, K. Kikuchi, Electron. Lett. 16, 179 (1980).
[Crossref]

1978 (1)

M. Nakamura, K. Aiki, N. Chinone, R. Ito, J. Umeda, J. Appl. Phys. 49, 4644 (1978).
[Crossref]

1973 (2)

W. Schmidt, A. Vogel, D. Preussler, Appl. Phys. 1, 103 (1973).
[Crossref]

P. D. Henshaw, S. Ezekiel, Appl. Opt. 12, 2550 (1973).
[Crossref] [PubMed]

1971 (1)

1969 (1)

L. O. Heflinger, R. F. Wuerker, Appl. Phys. Lett. 15, 28 (1969).
[Crossref]

1967 (1)

1963 (1)

W. E. Engeler, M. Garfinkel, J. Appl. Phys. 34, 2746 (1963).
[Crossref]

Aiki, K.

M. Nakamura, K. Aiki, N. Chinone, R. Ito, J. Umeda, J. Appl. Phys. 49, 4644 (1978).
[Crossref]

Arimoto, A.

Carlsen, W. J.

Chinone, N.

M. Nakamura, K. Aiki, N. Chinone, R. Ito, J. Umeda, J. Appl. Phys. 49, 4644 (1978).
[Crossref]

Engeler, W. E.

W. E. Engeler, M. Garfinkel, J. Appl. Phys. 34, 2746 (1963).
[Crossref]

Ezekiel, S.

Garfinkel, M.

W. E. Engeler, M. Garfinkel, J. Appl. Phys. 34, 2746 (1963).
[Crossref]

Goldberg, L.

L. Goldberg, H. F. Taylor, J. F. Weller, Electron. Lett. 17, 498 (1981).

Haines, K. A.

Heflinger, L. O.

L. O. Heflinger, R. F. Wuerker, Appl. Phys. Lett. 15, 28 (1969).
[Crossref]

Henshaw, P. D.

Hildebrand, B. P.

Ito, R.

R. Ito, M. Suyama, N. Ogasawara, Appl. Phys. Lett. 40, 214 (1982).
[Crossref]

M. Suyama, N. Ogasawara, R. Ito, Jpn. J. Appl. Phys. 20, L395 (1981).
[Crossref]

M. Nakamura, K. Aiki, N. Chinone, R. Ito, J. Umeda, J. Appl. Phys. 49, 4644 (1978).
[Crossref]

Kikuchi, K.

T. Okoshi, K. Kikuchi, Electron. Lett. 16, 179 (1980).
[Crossref]

Kimura, T.

S. Kobayashi, Y. Tamamoto, T. Kimura, Electron. Lett. 17, 350 (1981).
[Crossref]

Kobayashi, S.

S. Kobayashi, Y. Tamamoto, T. Kimura, Electron. Lett. 17, 350 (1981).
[Crossref]

Melman, P.

Nakamura, M.

M. Nakamura, K. Aiki, N. Chinone, R. Ito, J. Umeda, J. Appl. Phys. 49, 4644 (1978).
[Crossref]

Ogasawara, N.

R. Ito, M. Suyama, N. Ogasawara, Appl. Phys. Lett. 40, 214 (1982).
[Crossref]

M. Suyama, N. Ogasawara, R. Ito, Jpn. J. Appl. Phys. 20, L395 (1981).
[Crossref]

Okoshi, T.

T. Okoshi, K. Kikuchi, Electron. Lett. 16, 179 (1980).
[Crossref]

Preussler, D.

W. Schmidt, A. Vogel, D. Preussler, Appl. Phys. 1, 103 (1973).
[Crossref]

Schmidt, W.

W. Schmidt, A. Vogel, D. Preussler, Appl. Phys. 1, 103 (1973).
[Crossref]

Suyama, M.

R. Ito, M. Suyama, N. Ogasawara, Appl. Phys. Lett. 40, 214 (1982).
[Crossref]

M. Suyama, N. Ogasawara, R. Ito, Jpn. J. Appl. Phys. 20, L395 (1981).
[Crossref]

Tamamoto, Y.

S. Kobayashi, Y. Tamamoto, T. Kimura, Electron. Lett. 17, 350 (1981).
[Crossref]

Tatsuno, K.

Taylor, H. F.

L. Goldberg, H. F. Taylor, J. F. Weller, Electron. Lett. 17, 498 (1981).

Umeda, J.

M. Nakamura, K. Aiki, N. Chinone, R. Ito, J. Umeda, J. Appl. Phys. 49, 4644 (1978).
[Crossref]

Varner, J. R.

Vogel, A.

W. Schmidt, A. Vogel, D. Preussler, Appl. Phys. 1, 103 (1973).
[Crossref]

Weller, J. F.

L. Goldberg, H. F. Taylor, J. F. Weller, Electron. Lett. 17, 498 (1981).

Wuerker, R. F.

L. O. Heflinger, R. F. Wuerker, Appl. Phys. Lett. 15, 28 (1969).
[Crossref]

Zelenka, J. S.

Appl. Opt. (4)

Appl. Phys. (1)

W. Schmidt, A. Vogel, D. Preussler, Appl. Phys. 1, 103 (1973).
[Crossref]

Appl. Phys. Lett. (2)

R. Ito, M. Suyama, N. Ogasawara, Appl. Phys. Lett. 40, 214 (1982).
[Crossref]

L. O. Heflinger, R. F. Wuerker, Appl. Phys. Lett. 15, 28 (1969).
[Crossref]

Electron. Lett. (3)

T. Okoshi, K. Kikuchi, Electron. Lett. 16, 179 (1980).
[Crossref]

S. Kobayashi, Y. Tamamoto, T. Kimura, Electron. Lett. 17, 350 (1981).
[Crossref]

L. Goldberg, H. F. Taylor, J. F. Weller, Electron. Lett. 17, 498 (1981).

J. Appl. Phys. (2)

W. E. Engeler, M. Garfinkel, J. Appl. Phys. 34, 2746 (1963).
[Crossref]

M. Nakamura, K. Aiki, N. Chinone, R. Ito, J. Umeda, J. Appl. Phys. 49, 4644 (1978).
[Crossref]

J. Opt. Soc. Am. (1)

Jpn. J. Appl. Phys. (1)

M. Suyama, N. Ogasawara, R. Ito, Jpn. J. Appl. Phys. 20, L395 (1981).
[Crossref]

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Figures (5)

Fig. 1
Fig. 1

Experimental configuration for measurements of wavelength change of semiconductor lasers.

Fig. 2
Fig. 2

Interference signals from the Michelson interferometer (lower traces). Modulation frequencies are (a) 100 and (b) 10 kHz. Arrows indicate the mode hopping. Upper traces show the injection current; threshold current Ith = 49 mA, and maximum current Imax = 69 mA. Horizontal scales: (a) 1 msec/division and (b) 10 μsec/division.

Fig. 3
Fig. 3

Dependence of the wavelength change on the injection current and the temperature for a 7801 laser diode.

Fig. 4
Fig. 4

Experimental arrangement for two-wavelength holographic contouring.

Fig. 5
Fig. 5

Contour fringes for two different temperatures of the heat sink, (a) 31°C, (b) 26°C.

Equations (1)

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Δ φ = 2 π d Δ λ λ 2 = 2 π d Δ f c

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