Abstract

The experimental and numerical evaluation of the shadow effect in kinoform diffractive gratings for the terahertz (THz) range is given. This effect limits the diffractive efficiency of dense gratings, which are the base of the elements suited for convenient beam focusing and imaging in THz. The observed effect of redirecting most of the incident energy into stray 1st diffractive order is observed and discussed. The presented results show the great significance of the shadow effect in selected kinoform gratings and prove the utility of the used methodology of numerical simulations.

© 2013 Optical Society of America

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References

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2013 (1)

2012 (2)

M. Sypek, M. Makowski, E. Hérault, A. M. Siemion, A. Siemion, J. Suszek, F. Garet, and J-L. Coutaz, Opt. Lett. 37, 2214 (2012).
[CrossRef]

M. Sypek, J.-L. Coutaz, A. Kolodziejczyk, M. Makowski, and J. Suszek, Proc. SPIE 8261, 826110 (2012).
[CrossRef]

2011 (1)

E. Hérault, J.-L. Coutaz, A. M. Siemion, A. Siemion, M. Makowski, and M. Sypek, J. Infrared Milli. Terahz. Waves 32, 403 (2011).
[CrossRef]

2010 (3)

C. Bruckner, G. Notnia, and A. Tünnermann, Optik 121, 113 (2010).
[CrossRef]

O. Paul, B. Reinhard, B. Krolla, R. Beigang, and M. Rahm, Appl. Phys. Lett. 96, 241110 (2010).
[CrossRef]

N. Oda, C. R. Phys. 11, 496 (2010).
[CrossRef]

2001 (1)

1999 (1)

1995 (1)

M. Sypek, Opt. Commun. 116, 43 (1995).
[CrossRef]

1990 (1)

J. C. Marron, D. K. Angell, and A. M. Tai, Proc. SPIE 1211, 62 (1990).
[CrossRef]

1981 (1)

Angell, D. K.

J. C. Marron, D. K. Angell, and A. M. Tai, Proc. SPIE 1211, 62 (1990).
[CrossRef]

Astilean, S.

Beigang, R.

O. Paul, B. Reinhard, B. Krolla, R. Beigang, and M. Rahm, Appl. Phys. Lett. 96, 241110 (2010).
[CrossRef]

Bruckner, C.

C. Bruckner, G. Notnia, and A. Tünnermann, Optik 121, 113 (2010).
[CrossRef]

Chavel, P.

Coutaz, J.-L.

J. Oden, J. Meilhan, J. Lalanne-Dera, J.-F. Roux, F. Garet, J.-L. Coutaz, and F. Simoens, Opt. Express 21, 4817 (2013).
[CrossRef]

M. Sypek, J.-L. Coutaz, A. Kolodziejczyk, M. Makowski, and J. Suszek, Proc. SPIE 8261, 826110 (2012).
[CrossRef]

E. Hérault, J.-L. Coutaz, A. M. Siemion, A. Siemion, M. Makowski, and M. Sypek, J. Infrared Milli. Terahz. Waves 32, 403 (2011).
[CrossRef]

Coutaz, J-L.

Garet, F.

Hérault, E.

M. Sypek, M. Makowski, E. Hérault, A. M. Siemion, A. Siemion, J. Suszek, F. Garet, and J-L. Coutaz, Opt. Lett. 37, 2214 (2012).
[CrossRef]

E. Hérault, J.-L. Coutaz, A. M. Siemion, A. Siemion, M. Makowski, and M. Sypek, J. Infrared Milli. Terahz. Waves 32, 403 (2011).
[CrossRef]

Hofmann, A.

J. Richter, A. Hofmann, and L.-P. Schmidt, in Proceedings of the 31st European Microwave Conference, London, UK, 25–27 September 2001.

Jaroszewicz, Z.

A. Kowalik, A. Kołodziejczyk, and Z. Jaroszewicz, in Proceedings of the EOS Topical Meeting on Diffractive Optics, Barcelona, Spain, 20–23 November 2007, pp. 174–175.

Kolodziejczyk, A.

M. Sypek, J.-L. Coutaz, A. Kolodziejczyk, M. Makowski, and J. Suszek, Proc. SPIE 8261, 826110 (2012).
[CrossRef]

A. Kowalik, A. Kołodziejczyk, and Z. Jaroszewicz, in Proceedings of the EOS Topical Meeting on Diffractive Optics, Barcelona, Spain, 20–23 November 2007, pp. 174–175.

Kowalik, A.

A. Kowalik, A. Kołodziejczyk, and Z. Jaroszewicz, in Proceedings of the EOS Topical Meeting on Diffractive Optics, Barcelona, Spain, 20–23 November 2007, pp. 174–175.

Krolla, B.

O. Paul, B. Reinhard, B. Krolla, R. Beigang, and M. Rahm, Appl. Phys. Lett. 96, 241110 (2010).
[CrossRef]

Lagasse, P.

Lalanne, P.

Lalanne-Dera, J.

Makowski, M.

M. Sypek, J.-L. Coutaz, A. Kolodziejczyk, M. Makowski, and J. Suszek, Proc. SPIE 8261, 826110 (2012).
[CrossRef]

M. Sypek, M. Makowski, E. Hérault, A. M. Siemion, A. Siemion, J. Suszek, F. Garet, and J-L. Coutaz, Opt. Lett. 37, 2214 (2012).
[CrossRef]

E. Hérault, J.-L. Coutaz, A. M. Siemion, A. Siemion, M. Makowski, and M. Sypek, J. Infrared Milli. Terahz. Waves 32, 403 (2011).
[CrossRef]

Marron, J. C.

J. C. Marron, D. K. Angell, and A. M. Tai, Proc. SPIE 1211, 62 (1990).
[CrossRef]

Meilhan, J.

Notnia, G.

C. Bruckner, G. Notnia, and A. Tünnermann, Optik 121, 113 (2010).
[CrossRef]

Oda, N.

N. Oda, C. R. Phys. 11, 496 (2010).
[CrossRef]

Oden, J.

Paul, O.

O. Paul, B. Reinhard, B. Krolla, R. Beigang, and M. Rahm, Appl. Phys. Lett. 96, 241110 (2010).
[CrossRef]

Prather, D. W.

Pustai, D.

Rahm, M.

O. Paul, B. Reinhard, B. Krolla, R. Beigang, and M. Rahm, Appl. Phys. Lett. 96, 241110 (2010).
[CrossRef]

Reinhard, B.

O. Paul, B. Reinhard, B. Krolla, R. Beigang, and M. Rahm, Appl. Phys. Lett. 96, 241110 (2010).
[CrossRef]

Richter, J.

J. Richter, A. Hofmann, and L.-P. Schmidt, in Proceedings of the 31st European Microwave Conference, London, UK, 25–27 September 2001.

Roux, J.-F.

Schmidt, L.-P.

J. Richter, A. Hofmann, and L.-P. Schmidt, in Proceedings of the 31st European Microwave Conference, London, UK, 25–27 September 2001.

Shi, S.

Siemion, A.

M. Sypek, M. Makowski, E. Hérault, A. M. Siemion, A. Siemion, J. Suszek, F. Garet, and J-L. Coutaz, Opt. Lett. 37, 2214 (2012).
[CrossRef]

E. Hérault, J.-L. Coutaz, A. M. Siemion, A. Siemion, M. Makowski, and M. Sypek, J. Infrared Milli. Terahz. Waves 32, 403 (2011).
[CrossRef]

Siemion, A. M.

M. Sypek, M. Makowski, E. Hérault, A. M. Siemion, A. Siemion, J. Suszek, F. Garet, and J-L. Coutaz, Opt. Lett. 37, 2214 (2012).
[CrossRef]

E. Hérault, J.-L. Coutaz, A. M. Siemion, A. Siemion, M. Makowski, and M. Sypek, J. Infrared Milli. Terahz. Waves 32, 403 (2011).
[CrossRef]

Simoens, F.

Suszek, J.

M. Sypek, J.-L. Coutaz, A. Kolodziejczyk, M. Makowski, and J. Suszek, Proc. SPIE 8261, 826110 (2012).
[CrossRef]

M. Sypek, M. Makowski, E. Hérault, A. M. Siemion, A. Siemion, J. Suszek, F. Garet, and J-L. Coutaz, Opt. Lett. 37, 2214 (2012).
[CrossRef]

Sypek, M.

M. Sypek, M. Makowski, E. Hérault, A. M. Siemion, A. Siemion, J. Suszek, F. Garet, and J-L. Coutaz, Opt. Lett. 37, 2214 (2012).
[CrossRef]

M. Sypek, J.-L. Coutaz, A. Kolodziejczyk, M. Makowski, and J. Suszek, Proc. SPIE 8261, 826110 (2012).
[CrossRef]

E. Hérault, J.-L. Coutaz, A. M. Siemion, A. Siemion, M. Makowski, and M. Sypek, J. Infrared Milli. Terahz. Waves 32, 403 (2011).
[CrossRef]

M. Sypek, Opt. Commun. 116, 43 (1995).
[CrossRef]

Tai, A. M.

J. C. Marron, D. K. Angell, and A. M. Tai, Proc. SPIE 1211, 62 (1990).
[CrossRef]

Tünnermann, A.

C. Bruckner, G. Notnia, and A. Tünnermann, Optik 121, 113 (2010).
[CrossRef]

Vanderdonk, J.

Vanroey, J.

Appl. Opt. (1)

Appl. Phys. Lett. (1)

O. Paul, B. Reinhard, B. Krolla, R. Beigang, and M. Rahm, Appl. Phys. Lett. 96, 241110 (2010).
[CrossRef]

C. R. Phys. (1)

N. Oda, C. R. Phys. 11, 496 (2010).
[CrossRef]

J. Infrared Milli. Terahz. Waves (1)

E. Hérault, J.-L. Coutaz, A. M. Siemion, A. Siemion, M. Makowski, and M. Sypek, J. Infrared Milli. Terahz. Waves 32, 403 (2011).
[CrossRef]

J. Opt. Soc. Am. (1)

J. Opt. Soc. Am. A (1)

Opt. Commun. (1)

M. Sypek, Opt. Commun. 116, 43 (1995).
[CrossRef]

Opt. Express (1)

Opt. Lett. (1)

Optik (1)

C. Bruckner, G. Notnia, and A. Tünnermann, Optik 121, 113 (2010).
[CrossRef]

Proc. SPIE (2)

J. C. Marron, D. K. Angell, and A. M. Tai, Proc. SPIE 1211, 62 (1990).
[CrossRef]

M. Sypek, J.-L. Coutaz, A. Kolodziejczyk, M. Makowski, and J. Suszek, Proc. SPIE 8261, 826110 (2012).
[CrossRef]

Other (2)

J. Richter, A. Hofmann, and L.-P. Schmidt, in Proceedings of the 31st European Microwave Conference, London, UK, 25–27 September 2001.

A. Kowalik, A. Kołodziejczyk, and Z. Jaroszewicz, in Proceedings of the EOS Topical Meeting on Diffractive Optics, Barcelona, Spain, 20–23 November 2007, pp. 174–175.

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Figures (6)

Fig. 1.
Fig. 1.

Photographs of the manufactured kinoform THz gratings: sparse grating (Λ/λ=4.16, top); dense grating (Λ/λ=1.17, bottom).

Fig. 2.
Fig. 2.

Repartition of THz field by a sparse kinoform diffractive grating of Λ/λ=4.16: (a) compared simulated far field intensity cross sections; (b) field amplitude distribution for teeth-side illumination; (c) for substrate-side illumination. Diffractive orders are marked with dashed vertical lines.

Fig. 3.
Fig. 3.

Experimental measurement of THz far field diffracted by the sparse kinoform grating for two illumination sides.

Fig. 4.
Fig. 4.

Experimental measurement of THz far field diffracted by the dense kinoform grating for two illumination sides.

Fig. 5.
Fig. 5.

Qualitative geometrical optics explanation [6] of the grating behavior for teeth-side illumination with the shadow effect (left) and substrate-side illumination without the shadow effect (right). Dashed rays are misdirected into 1st order by the shadow effect.

Fig. 6.
Fig. 6.

Repartition of THz field by a dense kinoform diffractive grating of Λ/λ=1.17: (a) compared simulated far field intensity cross sections; (b) field amplitude distribution for teeth-side illumination; (c) for substrate-side illumination. Diffractive orders are marked with dashed vertical lines.

Tables (1)

Tables Icon

Table 1. Design Parameters of the Modeled and Fabricated Kinoform Gratings

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