Abstract

This Letter presents a multiview phase shifting (MPS) framework for full-resolution and high-speed reconstruction of arbitrary shape dynamic objects. Unlike conventional methods, this framework can directly find the corresponding points from the wrapped phase-maps. Therefore, only a minimum number of images are required for phase shifting to measure arbitrary shape objects, including discontinuous surfaces. Benefit from phase shifting MPS can achieve full spatial resolution and high, accurate 3D reconstruction. Benefit from multiview constraint MPS is also robust to discontinuities. Experimental results are presented to verify the performance of the proposed technique.

© 2013 Optical Society of America

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References

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2012

2011

2010

2008

Z. W. Li, Y. S. Shi, C. J. Wang, and Y. Y. Wang, Opt. Eng. 47, 053604 (2008).
[CrossRef]

S. Chen, Y. F. Li, and J. Zhang, IEEE Trans. Image Process. 17, 167 (2008).
[CrossRef]

1999

R. I. Hartley, Int. J. Comput. Vis. 35, 115 (1999).
[CrossRef]

Chen, S.

S. Chen, Y. F. Li, and J. Zhang, IEEE Trans. Image Process. 17, 167 (2008).
[CrossRef]

Gool, L. V.

T. Weise, B. Leibe, and L. V. Gool, Proc. IEEE Conf. CVPR (IEEE, 2007), pp. 1–8.

Hao, Q.

Hartley, R. I.

R. I. Hartley, Int. J. Comput. Vis. 35, 115 (1999).
[CrossRef]

Hassebrook, L. G.

Lau, D. L.

Leibe, B.

T. Weise, B. Leibe, and L. V. Gool, Proc. IEEE Conf. CVPR (IEEE, 2007), pp. 1–8.

Li, Y. F.

S. Chen, Y. F. Li, and J. Zhang, IEEE Trans. Image Process. 17, 167 (2008).
[CrossRef]

Li, Z. W.

Z. W. Li, Y. S. Shi, C. J. Wang, and Y. Y. Wang, Opt. Eng. 47, 053604 (2008).
[CrossRef]

Liu, K.

Oliver, J. H.

Olvier, J.

Shi, Y. S.

Z. W. Li, Y. S. Shi, C. J. Wang, and Y. Y. Wang, Opt. Eng. 47, 053604 (2008).
[CrossRef]

Wang, C. J.

Z. W. Li, Y. S. Shi, C. J. Wang, and Y. Y. Wang, Opt. Eng. 47, 053604 (2008).
[CrossRef]

Wang, Y.

Wang, Y. Y.

Z. W. Li, Y. S. Shi, C. J. Wang, and Y. Y. Wang, Opt. Eng. 47, 053604 (2008).
[CrossRef]

Weide, D.

Weise, T.

T. Weise, B. Leibe, and L. V. Gool, Proc. IEEE Conf. CVPR (IEEE, 2007), pp. 1–8.

Zhang, J.

S. Chen, Y. F. Li, and J. Zhang, IEEE Trans. Image Process. 17, 167 (2008).
[CrossRef]

Zhang, S.

IEEE Trans. Image Process.

S. Chen, Y. F. Li, and J. Zhang, IEEE Trans. Image Process. 17, 167 (2008).
[CrossRef]

Int. J. Comput. Vis.

R. I. Hartley, Int. J. Comput. Vis. 35, 115 (1999).
[CrossRef]

Opt. Eng.

Z. W. Li, Y. S. Shi, C. J. Wang, and Y. Y. Wang, Opt. Eng. 47, 053604 (2008).
[CrossRef]

Opt. Express

Opt. Lasers Eng.

S. Zhang, Opt. Lasers Eng. 50, 1538 (2012).
[CrossRef]

S. Zhang, Opt. Lasers Eng. 48, 149 (2010).
[CrossRef]

Opt. Lett.

Other

T. Weise, B. Leibe, and L. V. Gool, Proc. IEEE Conf. CVPR (IEEE, 2007), pp. 1–8.

Supplementary Material (2)

» Media 1: MOV (418 KB)     
» Media 2: MOV (390 KB)     

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Figures (4)

Fig. 1.
Fig. 1.

Diagram of multiview constraint.

Fig. 2.
Fig. 2.

Diagram of disparity range constraint.

Fig. 3.
Fig. 3.

Measurement system and its measurement results of the statues: (a) scanning system, (b) one of the captured fringe images, and (c) 3D results obtained from our MPS method.

Fig. 4.
Fig. 4.

Measurement results of dynamic objects: (a) deforming sheet (media 1) and (b) moving hands (media 2).

Equations (10)

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I n c = A c + B c cos ( ϕ + δ n ) ,
ϕ = arctan ( n = 1 N I n c sin ( δ n ) / n = 1 N I n c cos ( δ n ) ) ,
A c = 1 N n = 1 N I n c ,
B c = 2 N { [ n = 1 N I n c sin ( δ n ) ] 2 + [ n = 1 N I n c cos ( δ n ) ] 2 } 0.5 .
{ s p = MP l M P = 0 s p = M P ,
x t i j r p i l j ε k r s p k = 0 z ,
l k = ( φ + 2 π ( k 1 ) ) / ( 2 π f ) × ( w 1 ) ,
P z = F rect B l / ( x rect x rect ) ,
{ ( x rect x rect ) min = F rect B l / Z max ( x rect x rect ) max = F rect B l / Z min ,
D i = w 1 [ ( ϕ 2 i ϕ 1 ) / 2 π ] 2 + w 2 [ ( I 2 i I 1 I 2 1 ) / ( 255 / 2 ) ] 2 ,

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