Abstract

We present the simulation, fabrication, and characterization of a dual-band metamaterial absorber in the mid-infrared regime. Two pairs of circular-patterned metal–dielectric stacks are employed to excite the dual-band absorption peaks. Dielectric characteristics of the dielectric spacing layer determine energy dissipation in each resonant stack, i.e., dielectric or ohmic loss. By controlling material parameters, both two mechanisms are introduced into our structure. Up to 98% absorption is obtained at 9.03 and 13.32 μm in the simulation, which is in reasonable agreement with experimental results. The proposed structure holds promise for various applications, e.g., thermal radiation modulators and multicolor infrared focal plane arrays.

© 2013 Optical Society of America

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2012 (1)

2011 (7)

Y. Wang, T. Sun, T. Paudel, Y. Zhang, Z. Ren, and K. Kempa, Nano Lett. 12, 440 (2011).
[CrossRef]

J. Hao, L. Zhou, and M. Qiu, Phys. Rev. B 83, 165107 (2011).
[CrossRef]

J. Wang, Y. Chen, J. Hao, M. Yan, and M. Qiu, Jpn. J. Appl. Phys. 109, 074510 (2011).
[CrossRef]

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[CrossRef]

J. A. Mason, S. Smith, and D. Wasserman, Appl. Phys. Lett. 98, 241105 (2011).
[CrossRef]

B. Zhang, Y. Zhao, Q. Hao, B. Kiraly, I. Khoo, S. Chen, and T. J. Huang, Opt. Express 19, 15221 (2011).
[CrossRef]

S. Chen, H. Cheng, H. Yang, J. Li, X. Duan, C. Gu, and J. Tian, Appl. Phys. Lett. 99, 253104 (2011).
[CrossRef]

2010 (4)

Y. Q. Ye, Y. Jin, and S. He, J. Opt. Soc. Am. B 27, 498 (2010).
[CrossRef]

X. Liu, T. Starr, A. F. Starr, and W. J. Padilla, Phys. Rev. Lett. 104, 207403 (2010).
[CrossRef]

J. Hao, J. Wang, X. Liu, W. J. Padilla, L. Zhou, and M. Qiu, Appl. Phys. Lett. 96, 251104 (2010).
[CrossRef]

N. Liu, M. Mesch, T. Weiss, M. Hentschel, and H. Giessen, Nano Lett. 10, 2342 (2010).
[CrossRef]

2008 (1)

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[CrossRef]

1983 (1)

Alexander, R. W.

Bell, R. J.

Bell, R. R.

Bell, S. E.

Chen, S.

B. Zhang, Y. Zhao, Q. Hao, B. Kiraly, I. Khoo, S. Chen, and T. J. Huang, Opt. Express 19, 15221 (2011).
[CrossRef]

S. Chen, H. Cheng, H. Yang, J. Li, X. Duan, C. Gu, and J. Tian, Appl. Phys. Lett. 99, 253104 (2011).
[CrossRef]

Chen, Y.

J. Wang, Y. Chen, J. Hao, M. Yan, and M. Qiu, Jpn. J. Appl. Phys. 109, 074510 (2011).
[CrossRef]

Cheng, D.

Cheng, H.

S. Chen, H. Cheng, H. Yang, J. Li, X. Duan, C. Gu, and J. Tian, Appl. Phys. Lett. 99, 253104 (2011).
[CrossRef]

Deng, L.

Duan, X.

S. Chen, H. Cheng, H. Yang, J. Li, X. Duan, C. Gu, and J. Tian, Appl. Phys. Lett. 99, 253104 (2011).
[CrossRef]

Giessen, H.

N. Liu, M. Mesch, T. Weiss, M. Hentschel, and H. Giessen, Nano Lett. 10, 2342 (2010).
[CrossRef]

Gu, C.

S. Chen, H. Cheng, H. Yang, J. Li, X. Duan, C. Gu, and J. Tian, Appl. Phys. Lett. 99, 253104 (2011).
[CrossRef]

Hao, J.

J. Hao, L. Zhou, and M. Qiu, Phys. Rev. B 83, 165107 (2011).
[CrossRef]

J. Wang, Y. Chen, J. Hao, M. Yan, and M. Qiu, Jpn. J. Appl. Phys. 109, 074510 (2011).
[CrossRef]

J. Hao, J. Wang, X. Liu, W. J. Padilla, L. Zhou, and M. Qiu, Appl. Phys. Lett. 96, 251104 (2010).
[CrossRef]

Hao, Q.

He, S.

Hentschel, M.

N. Liu, M. Mesch, T. Weiss, M. Hentschel, and H. Giessen, Nano Lett. 10, 2342 (2010).
[CrossRef]

Huang, T. J.

Jin, Y.

Jokerst, N. M.

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[CrossRef]

Kempa, K.

Y. Wang, T. Sun, T. Paudel, Y. Zhang, Z. Ren, and K. Kempa, Nano Lett. 12, 440 (2011).
[CrossRef]

Khoo, I.

Kiraly, B.

Landy, N. I.

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[CrossRef]

Li, J.

S. Chen, H. Cheng, H. Yang, J. Li, X. Duan, C. Gu, and J. Tian, Appl. Phys. Lett. 99, 253104 (2011).
[CrossRef]

Liu, N.

N. Liu, M. Mesch, T. Weiss, M. Hentschel, and H. Giessen, Nano Lett. 10, 2342 (2010).
[CrossRef]

Liu, X.

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[CrossRef]

X. Liu, T. Starr, A. F. Starr, and W. J. Padilla, Phys. Rev. Lett. 104, 207403 (2010).
[CrossRef]

J. Hao, J. Wang, X. Liu, W. J. Padilla, L. Zhou, and M. Qiu, Appl. Phys. Lett. 96, 251104 (2010).
[CrossRef]

Long, L. L.

Mason, J. A.

J. A. Mason, S. Smith, and D. Wasserman, Appl. Phys. Lett. 98, 241105 (2011).
[CrossRef]

Mesch, M.

N. Liu, M. Mesch, T. Weiss, M. Hentschel, and H. Giessen, Nano Lett. 10, 2342 (2010).
[CrossRef]

Mock, J. J.

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[CrossRef]

Ordal, M. A.

Padilla, W. J.

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[CrossRef]

J. Hao, J. Wang, X. Liu, W. J. Padilla, L. Zhou, and M. Qiu, Appl. Phys. Lett. 96, 251104 (2010).
[CrossRef]

X. Liu, T. Starr, A. F. Starr, and W. J. Padilla, Phys. Rev. Lett. 104, 207403 (2010).
[CrossRef]

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[CrossRef]

Palik, E. D.

E. D. Palik, Handbook of Optical Constants in Solids(Academic, 1991).

Paudel, T.

Y. Wang, T. Sun, T. Paudel, Y. Zhang, Z. Ren, and K. Kempa, Nano Lett. 12, 440 (2011).
[CrossRef]

Qiu, M.

J. Wang, Y. Chen, J. Hao, M. Yan, and M. Qiu, Jpn. J. Appl. Phys. 109, 074510 (2011).
[CrossRef]

J. Hao, L. Zhou, and M. Qiu, Phys. Rev. B 83, 165107 (2011).
[CrossRef]

J. Hao, J. Wang, X. Liu, W. J. Padilla, L. Zhou, and M. Qiu, Appl. Phys. Lett. 96, 251104 (2010).
[CrossRef]

Ren, Z.

Y. Wang, T. Sun, T. Paudel, Y. Zhang, Z. Ren, and K. Kempa, Nano Lett. 12, 440 (2011).
[CrossRef]

Sajuyigbe, S.

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[CrossRef]

Smith, D. R.

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[CrossRef]

Smith, S.

J. A. Mason, S. Smith, and D. Wasserman, Appl. Phys. Lett. 98, 241105 (2011).
[CrossRef]

Starr, A. F.

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[CrossRef]

X. Liu, T. Starr, A. F. Starr, and W. J. Padilla, Phys. Rev. Lett. 104, 207403 (2010).
[CrossRef]

Starr, T.

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[CrossRef]

X. Liu, T. Starr, A. F. Starr, and W. J. Padilla, Phys. Rev. Lett. 104, 207403 (2010).
[CrossRef]

Sun, T.

Y. Wang, T. Sun, T. Paudel, Y. Zhang, Z. Ren, and K. Kempa, Nano Lett. 12, 440 (2011).
[CrossRef]

Tian, J.

S. Chen, H. Cheng, H. Yang, J. Li, X. Duan, C. Gu, and J. Tian, Appl. Phys. Lett. 99, 253104 (2011).
[CrossRef]

Tyler, T.

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[CrossRef]

Wang, C.

Wang, J.

J. Wang, Y. Chen, J. Hao, M. Yan, and M. Qiu, Jpn. J. Appl. Phys. 109, 074510 (2011).
[CrossRef]

J. Hao, J. Wang, X. Liu, W. J. Padilla, L. Zhou, and M. Qiu, Appl. Phys. Lett. 96, 251104 (2010).
[CrossRef]

Wang, Y.

Y. Wang, T. Sun, T. Paudel, Y. Zhang, Z. Ren, and K. Kempa, Nano Lett. 12, 440 (2011).
[CrossRef]

Ward, C. A.

Wasserman, D.

J. A. Mason, S. Smith, and D. Wasserman, Appl. Phys. Lett. 98, 241105 (2011).
[CrossRef]

Weiss, T.

N. Liu, M. Mesch, T. Weiss, M. Hentschel, and H. Giessen, Nano Lett. 10, 2342 (2010).
[CrossRef]

Xie, J.

Yan, M.

J. Wang, Y. Chen, J. Hao, M. Yan, and M. Qiu, Jpn. J. Appl. Phys. 109, 074510 (2011).
[CrossRef]

Yang, H.

S. Chen, H. Cheng, H. Yang, J. Li, X. Duan, C. Gu, and J. Tian, Appl. Phys. Lett. 99, 253104 (2011).
[CrossRef]

Ye, Y. Q.

Zhang, B.

Zhang, H.

Zhang, N.

Zhang, Y.

Y. Wang, T. Sun, T. Paudel, Y. Zhang, Z. Ren, and K. Kempa, Nano Lett. 12, 440 (2011).
[CrossRef]

Zhao, Y.

Zhou, L.

J. Hao, L. Zhou, and M. Qiu, Phys. Rev. B 83, 165107 (2011).
[CrossRef]

J. Hao, J. Wang, X. Liu, W. J. Padilla, L. Zhou, and M. Qiu, Appl. Phys. Lett. 96, 251104 (2010).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. Lett. (3)

S. Chen, H. Cheng, H. Yang, J. Li, X. Duan, C. Gu, and J. Tian, Appl. Phys. Lett. 99, 253104 (2011).
[CrossRef]

J. Hao, J. Wang, X. Liu, W. J. Padilla, L. Zhou, and M. Qiu, Appl. Phys. Lett. 96, 251104 (2010).
[CrossRef]

J. A. Mason, S. Smith, and D. Wasserman, Appl. Phys. Lett. 98, 241105 (2011).
[CrossRef]

J. Opt. Soc. Am. B (2)

Jpn. J. Appl. Phys. (1)

J. Wang, Y. Chen, J. Hao, M. Yan, and M. Qiu, Jpn. J. Appl. Phys. 109, 074510 (2011).
[CrossRef]

Nano Lett. (2)

N. Liu, M. Mesch, T. Weiss, M. Hentschel, and H. Giessen, Nano Lett. 10, 2342 (2010).
[CrossRef]

Y. Wang, T. Sun, T. Paudel, Y. Zhang, Z. Ren, and K. Kempa, Nano Lett. 12, 440 (2011).
[CrossRef]

Opt. Express (1)

Phys. Rev. B (1)

J. Hao, L. Zhou, and M. Qiu, Phys. Rev. B 83, 165107 (2011).
[CrossRef]

Phys. Rev. Lett. (3)

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[CrossRef]

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[CrossRef]

X. Liu, T. Starr, A. F. Starr, and W. J. Padilla, Phys. Rev. Lett. 104, 207403 (2010).
[CrossRef]

Other (2)

E. D. Palik, Handbook of Optical Constants in Solids(Academic, 1991).

CST Microwave Studio 2009 (Computer Simulation Technology GmbH, Darmstadt, Germany).

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Figures (4)

Fig. 1.
Fig. 1.

Schematic of the dual-band MM absorber; (a) top view; (b) side view of the structure; and (c), (d) scanning electron microscopy (SEM) images of the dual-band MM absorber. Period of the unit cell: p=6μm; diameter of the circular pattern: d=3.2μm; thickness of the metallic and dielectric layers: t1=200nm, t3=t5=100nm, t2=t4=250nm.

Fig. 2.
Fig. 2.

Absorption spectra of a single-band MM absorber for different dielectric constants of the dielectric spacing layer but with the same characteristic dimensions as sample A. Inset: relationship between the dielectric constant and the resonance wavelength.

Fig. 3.
Fig. 3.

(a) Simulated and (b) experimental absorption spectra of samples A–D.

Fig. 4.
Fig. 4.

Energy dissipation in sample A in the xz plane at y=0 at two resonance wavelengths: (a) the absorption peak at 9.03 μm, and (b) the absorption peak at 13.32 μm.

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