Abstract

A concept of two-dimensional periodic subwavelength gratings exhibiting different reflectance on the front and back sides is presented. This structure incorporates an arrangement of a metalized hole array and a nanodot array on top. We exemplify the optical properties for an aluminum grating with 243 nm period, and we demonstrate its color filtering properties for unpolarized light in reflectance as well as in transmittance yielding different colors for frontside and backside illumination. These findings have been confirmed by a numerical study. The gratings may be replicated by a simple nanoimprint process on plastic foils predestined for industrial mass production.

© 2013 Optical Society of America

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  2. Y. Kanamori, M. Shimono, and K. Hane, IEEE Photon. Technol. Lett. 18, 2126 (2006).
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    [CrossRef]
  4. E.-H. Cho, H.-S. Kim, B.-H. Cheong, O. Prudnikov, W. Xianyua, J.-S. Sohn, D.-J. Ma, H.-Y. Choi, N.-C. Park, and Y.-P. Park, Opt. Express 17, 8621 (2009).
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  6. Y. Ye, Y. Zhou, and L. Chen, Appl. Opt. 48, 5035 (2009).
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  7. H. Lochbihler, Opt. Express 17, 12189 (2009).
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  9. Q. Chen and D. R. S. Cummings, Opt. Express 18, 14056 (2010).
    [CrossRef]
  10. N. Nguyen-Huu, Y.-L. Lo, and Y.-B. Chen, Opt. Commun. 284, 2473 (2011).
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    [CrossRef]
  14. C.-J. Ting, F.-Y. Chang, C.-F. Chen, and C. P. Chou, J. Micromech. Microeng. 18, 075001 (2008).
    [CrossRef]

2012 (1)

2011 (2)

W.-D. Li, J. Hu, and S. Y. Chou, Opt. Express 19, 21098 (2011).
[CrossRef]

N. Nguyen-Huu, Y.-L. Lo, and Y.-B. Chen, Opt. Commun. 284, 2473 (2011).
[CrossRef]

2010 (2)

Y. Ye, H. Zhang, Y. Zhou, and L. Chen, Opt. Commun. 283, 613 (2010).
[CrossRef]

Q. Chen and D. R. S. Cummings, Opt. Express 18, 14056 (2010).
[CrossRef]

2009 (4)

2008 (1)

C.-J. Ting, F.-Y. Chang, C.-F. Chen, and C. P. Chou, J. Micromech. Microeng. 18, 075001 (2008).
[CrossRef]

2007 (1)

2006 (1)

Y. Kanamori, M. Shimono, and K. Hane, IEEE Photon. Technol. Lett. 18, 2126 (2006).
[CrossRef]

2005 (1)

S. Kinoshita and S. Yoshioka, ChemPhysChem 6, 1442 (2005).
[CrossRef]

Chang, F.-Y.

C.-J. Ting, F.-Y. Chang, C.-F. Chen, and C. P. Chou, J. Micromech. Microeng. 18, 075001 (2008).
[CrossRef]

Chen, C.-F.

C.-J. Ting, F.-Y. Chang, C.-F. Chen, and C. P. Chou, J. Micromech. Microeng. 18, 075001 (2008).
[CrossRef]

Chen, L.

Y. Ye, H. Zhang, Y. Zhou, and L. Chen, Opt. Commun. 283, 613 (2010).
[CrossRef]

Y. Ye, Y. Zhou, and L. Chen, Appl. Opt. 48, 5035 (2009).
[CrossRef]

Chen, Q.

Chen, Y.

Chen, Y.-B.

N. Nguyen-Huu, Y.-L. Lo, and Y.-B. Chen, Opt. Commun. 284, 2473 (2011).
[CrossRef]

Cheong, B.-H.

B.-H. Cheong, O. N. Prudnikov, E.-H. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, and S. T. Shin, Appl. Phys. Lett. 94, 213104 (2009).
[CrossRef]

E.-H. Cho, H.-S. Kim, B.-H. Cheong, O. Prudnikov, W. Xianyua, J.-S. Sohn, D.-J. Ma, H.-Y. Choi, N.-C. Park, and Y.-P. Park, Opt. Express 17, 8621 (2009).
[CrossRef]

Cho, E.-H.

E.-H. Cho, H.-S. Kim, B.-H. Cheong, O. Prudnikov, W. Xianyua, J.-S. Sohn, D.-J. Ma, H.-Y. Choi, N.-C. Park, and Y.-P. Park, Opt. Express 17, 8621 (2009).
[CrossRef]

B.-H. Cheong, O. N. Prudnikov, E.-H. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, and S. T. Shin, Appl. Phys. Lett. 94, 213104 (2009).
[CrossRef]

Cho, Y.-S.

B.-H. Cheong, O. N. Prudnikov, E.-H. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, and S. T. Shin, Appl. Phys. Lett. 94, 213104 (2009).
[CrossRef]

Choi, H.-Y.

B.-H. Cheong, O. N. Prudnikov, E.-H. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, and S. T. Shin, Appl. Phys. Lett. 94, 213104 (2009).
[CrossRef]

E.-H. Cho, H.-S. Kim, B.-H. Cheong, O. Prudnikov, W. Xianyua, J.-S. Sohn, D.-J. Ma, H.-Y. Choi, N.-C. Park, and Y.-P. Park, Opt. Express 17, 8621 (2009).
[CrossRef]

Chou, C. P.

C.-J. Ting, F.-Y. Chang, C.-F. Chen, and C. P. Chou, J. Micromech. Microeng. 18, 075001 (2008).
[CrossRef]

Chou, S. Y.

Cummings, D. R. S.

Hane, K.

Y. Kanamori, M. Shimono, and K. Hane, IEEE Photon. Technol. Lett. 18, 2126 (2006).
[CrossRef]

Hu, J.

Kanamori, Y.

Y. Kanamori, M. Shimono, and K. Hane, IEEE Photon. Technol. Lett. 18, 2126 (2006).
[CrossRef]

Kim, H.-S.

B.-H. Cheong, O. N. Prudnikov, E.-H. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, and S. T. Shin, Appl. Phys. Lett. 94, 213104 (2009).
[CrossRef]

E.-H. Cho, H.-S. Kim, B.-H. Cheong, O. Prudnikov, W. Xianyua, J.-S. Sohn, D.-J. Ma, H.-Y. Choi, N.-C. Park, and Y.-P. Park, Opt. Express 17, 8621 (2009).
[CrossRef]

Kim, S.-H.

Kinoshita, S.

S. Kinoshita and S. Yoshioka, ChemPhysChem 6, 1442 (2005).
[CrossRef]

Lee, H.-S.

Lee, K.-D.

Lee, S.-S.

Li, W.-D.

Liu, W.

Lo, Y.-L.

N. Nguyen-Huu, Y.-L. Lo, and Y.-B. Chen, Opt. Commun. 284, 2473 (2011).
[CrossRef]

Lochbihler, H.

Ma, D.-J.

Nguyen-Huu, N.

N. Nguyen-Huu, Y.-L. Lo, and Y.-B. Chen, Opt. Commun. 284, 2473 (2011).
[CrossRef]

Palik, E. D.

E. D. Palik, Handbook of Optical Constants of Solids Part II (Academic, 1985).

Park, N.-C.

Park, Y.-P.

Prudnikov, O.

Prudnikov, O. N.

B.-H. Cheong, O. N. Prudnikov, E.-H. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, and S. T. Shin, Appl. Phys. Lett. 94, 213104 (2009).
[CrossRef]

Shimono, M.

Y. Kanamori, M. Shimono, and K. Hane, IEEE Photon. Technol. Lett. 18, 2126 (2006).
[CrossRef]

Shin, S. T.

B.-H. Cheong, O. N. Prudnikov, E.-H. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, and S. T. Shin, Appl. Phys. Lett. 94, 213104 (2009).
[CrossRef]

Sohn, J.-S.

Ting, C.-J.

C.-J. Ting, F.-Y. Chang, C.-F. Chen, and C. P. Chou, J. Micromech. Microeng. 18, 075001 (2008).
[CrossRef]

Xianyua, W.

Ye, Y.

Y. Ye, H. Zhang, Y. Zhou, and L. Chen, Opt. Commun. 283, 613 (2010).
[CrossRef]

Y. Ye, Y. Zhou, and L. Chen, Appl. Opt. 48, 5035 (2009).
[CrossRef]

Yoon, Y.-T.

Yoshioka, S.

S. Kinoshita and S. Yoshioka, ChemPhysChem 6, 1442 (2005).
[CrossRef]

Yu, J.

B.-H. Cheong, O. N. Prudnikov, E.-H. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, and S. T. Shin, Appl. Phys. Lett. 94, 213104 (2009).
[CrossRef]

Zhang, H.

Y. Ye, H. Zhang, Y. Zhou, and L. Chen, Opt. Commun. 283, 613 (2010).
[CrossRef]

Zhou, Y.

Y. Ye, H. Zhang, Y. Zhou, and L. Chen, Opt. Commun. 283, 613 (2010).
[CrossRef]

Y. Ye, Y. Zhou, and L. Chen, Appl. Opt. 48, 5035 (2009).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. Lett. (1)

B.-H. Cheong, O. N. Prudnikov, E.-H. Cho, H.-S. Kim, J. Yu, Y.-S. Cho, H.-Y. Choi, and S. T. Shin, Appl. Phys. Lett. 94, 213104 (2009).
[CrossRef]

ChemPhysChem (1)

S. Kinoshita and S. Yoshioka, ChemPhysChem 6, 1442 (2005).
[CrossRef]

IEEE Photon. Technol. Lett. (1)

Y. Kanamori, M. Shimono, and K. Hane, IEEE Photon. Technol. Lett. 18, 2126 (2006).
[CrossRef]

J. Micromech. Microeng. (1)

C.-J. Ting, F.-Y. Chang, C.-F. Chen, and C. P. Chou, J. Micromech. Microeng. 18, 075001 (2008).
[CrossRef]

Opt. Commun. (2)

N. Nguyen-Huu, Y.-L. Lo, and Y.-B. Chen, Opt. Commun. 284, 2473 (2011).
[CrossRef]

Y. Ye, H. Zhang, Y. Zhou, and L. Chen, Opt. Commun. 283, 613 (2010).
[CrossRef]

Opt. Express (5)

Opt. Lett. (1)

Other (1)

E. D. Palik, Handbook of Optical Constants of Solids Part II (Academic, 1985).

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Figures (6)

Fig. 1.
Fig. 1.

2D periodic SWG consisting of a metallic hole array and a nanodot array on top: (a) sketch and (b) SEM image of metalized grating (inset shows top view) before embedding into a dielectric.

Fig. 2.
Fig. 2.

Measured reflectance of grating with aluminum coating for different angles of incidence Θ and for (a) frontside and (b) backside illumination.

Fig. 3.
Fig. 3.

Calculated reflectance of grating with aluminum coating for different angles of incidence Θ and for (a) frontside and (b) backside illumination. The inset illustrates the optical constants of aluminum.

Fig. 4.
Fig. 4.

Measured (a) and calculated (b) transmittance as a function of wavelength for grating from Figs. 2 and 3 for different angle Θ.

Fig. 5.
Fig. 5.

Power losses evaluated from reflectance and transmittance measurements at angle Θ=8° (a) compared with numerical data (b).

Fig. 6.
Fig. 6.

Evaluated color values from measured reflectance (a) and transmittance data (b) as functions of angle Θ plotted into the CIE-1931 chromaticity diagram. The insets represent the visual impression of the proposed color filter.

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