Abstract

Commonly, fringe-projection photogrammetry involves two independent stages: system calibration and measurement. The measurement accuracy largely depends on the calibration procedure. However, the results of system calibration may be unstable in different occasions. In this Letter, we propose a robust self-calibration 3D shape measurement in fringe-projection photogrammetry by combining control and measurement points. The control points with known 3D coordinates are provided on the checkerboard, and the measurement points are identified by absolute phase information in the deformed fringes. The introduction of control points in the nonlinear collinearity equations can be regarded as invariant in the optimization procedure, which enhances the measurement robustness. Compared to the binocular model in fringe-projection technique, moreover, multiple-view ray intersection is utilized to reflect the advantage of photogrammetry in the fringe-projection 3D measurement.

© 2013 Optical Society of America

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  1. T. Luhmann, ISPRS J. Photogramm. Remote Sens. 65, 558 (2010).
    [CrossRef]
  2. W. Schreiber and G. Notni, Opt. Eng. 39, 159 (2000).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  6. Y. Yin, X. Peng, A. Li, X. Liu, and B. Z. Gao, Opt. Lett. 37, 542 (2012).
    [CrossRef]
  7. Z. Zhang, IEEE Trans. Pattern Anal. Machine Intell. 22, 1330 (2000).
    [CrossRef]
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    [CrossRef]
  9. K. B. Atkinson, Close Range Photogrammetry and Machine Vision (Whittles, 1996).
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  11. S. Zhang and S. T. Yau, Opt. Express 14, 2644 (2006).
    [CrossRef]
  12. X. Su and W. Chen, Opt. Laser Eng. 42, 245 (2004).
    [CrossRef]
  13. C. Bräuer-Burchardt, Proc. SPIE 5962, 59620J (2005).
    [CrossRef]
  14. M. I. A. Lourakis and A. A. Argyros, ACM Trans. Math. Softw. 36, 1 (2009).
    [CrossRef]

2012

2010

T. Luhmann, ISPRS J. Photogramm. Remote Sens. 65, 558 (2010).
[CrossRef]

C. Bräuer-Burchardt, M. Möller, C. Munkelt, P. Kühmstedt, and G. Notni, Proc. SPIE 7830, 783019 (2010).
[CrossRef]

2009

M. I. A. Lourakis and A. A. Argyros, ACM Trans. Math. Softw. 36, 1 (2009).
[CrossRef]

2006

S. Zhang and S. T. Yau, Opt. Express 14, 2644 (2006).
[CrossRef]

S. Zhang and P. S. Huang, Opt. Eng. 45, 083601 (2006).
[CrossRef]

2005

C. Bräuer-Burchardt, Proc. SPIE 5962, 59620J (2005).
[CrossRef]

2004

X. Su and W. Chen, Opt. Laser Eng. 42, 245 (2004).
[CrossRef]

R. Legarda-Saenz, T. Bothe, and W. P. Jüptner, Opt. Eng. 43, 464 (2004).
[CrossRef]

2000

Z. Zhang, IEEE Trans. Pattern Anal. Machine Intell. 22, 1330 (2000).
[CrossRef]

W. Schreiber and G. Notni, Opt. Eng. 39, 159 (2000).
[CrossRef]

C. Reich, R. Ritter, and J. Thesing, Opt. Eng. 39, 224(2000).
[CrossRef]

Argyros, A. A.

M. I. A. Lourakis and A. A. Argyros, ACM Trans. Math. Softw. 36, 1 (2009).
[CrossRef]

Atkinson, K. B.

K. B. Atkinson, Close Range Photogrammetry and Machine Vision (Whittles, 1996).

Bothe, T.

R. Legarda-Saenz, T. Bothe, and W. P. Jüptner, Opt. Eng. 43, 464 (2004).
[CrossRef]

Bräuer-Burchardt, C.

C. Bräuer-Burchardt, M. Möller, C. Munkelt, P. Kühmstedt, and G. Notni, Proc. SPIE 7830, 783019 (2010).
[CrossRef]

C. Bräuer-Burchardt, Proc. SPIE 5962, 59620J (2005).
[CrossRef]

Chen, W.

X. Su and W. Chen, Opt. Laser Eng. 42, 245 (2004).
[CrossRef]

Gao, B. Z.

Huang, P. S.

S. Zhang and P. S. Huang, Opt. Eng. 45, 083601 (2006).
[CrossRef]

Jüptner, W. P.

R. Legarda-Saenz, T. Bothe, and W. P. Jüptner, Opt. Eng. 43, 464 (2004).
[CrossRef]

Kühmstedt, P.

C. Bräuer-Burchardt, M. Möller, C. Munkelt, P. Kühmstedt, and G. Notni, Proc. SPIE 7830, 783019 (2010).
[CrossRef]

Legarda-Saenz, R.

R. Legarda-Saenz, T. Bothe, and W. P. Jüptner, Opt. Eng. 43, 464 (2004).
[CrossRef]

Li, A.

Liu, X.

Lourakis, M. I. A.

M. I. A. Lourakis and A. A. Argyros, ACM Trans. Math. Softw. 36, 1 (2009).
[CrossRef]

Luhmann, T.

T. Luhmann, ISPRS J. Photogramm. Remote Sens. 65, 558 (2010).
[CrossRef]

Madsen, K.

K. Madsen, H. B. Nielsen, and O. Tingleff, Methods for Non-Linear Least Squares Problems, 2nd ed. (Technical University of Denmark, 2004).

Möller, M.

C. Bräuer-Burchardt, M. Möller, C. Munkelt, P. Kühmstedt, and G. Notni, Proc. SPIE 7830, 783019 (2010).
[CrossRef]

Munkelt, C.

C. Bräuer-Burchardt, M. Möller, C. Munkelt, P. Kühmstedt, and G. Notni, Proc. SPIE 7830, 783019 (2010).
[CrossRef]

Nielsen, H. B.

K. Madsen, H. B. Nielsen, and O. Tingleff, Methods for Non-Linear Least Squares Problems, 2nd ed. (Technical University of Denmark, 2004).

Notni, G.

C. Bräuer-Burchardt, M. Möller, C. Munkelt, P. Kühmstedt, and G. Notni, Proc. SPIE 7830, 783019 (2010).
[CrossRef]

W. Schreiber and G. Notni, Opt. Eng. 39, 159 (2000).
[CrossRef]

Peng, X.

Reich, C.

C. Reich, R. Ritter, and J. Thesing, Opt. Eng. 39, 224(2000).
[CrossRef]

Ritter, R.

C. Reich, R. Ritter, and J. Thesing, Opt. Eng. 39, 224(2000).
[CrossRef]

Schreiber, W.

W. Schreiber and G. Notni, Opt. Eng. 39, 159 (2000).
[CrossRef]

Su, X.

X. Su and W. Chen, Opt. Laser Eng. 42, 245 (2004).
[CrossRef]

Thesing, J.

C. Reich, R. Ritter, and J. Thesing, Opt. Eng. 39, 224(2000).
[CrossRef]

Tingleff, O.

K. Madsen, H. B. Nielsen, and O. Tingleff, Methods for Non-Linear Least Squares Problems, 2nd ed. (Technical University of Denmark, 2004).

Yau, S. T.

Yin, Y.

Zhang, S.

S. Zhang and P. S. Huang, Opt. Eng. 45, 083601 (2006).
[CrossRef]

S. Zhang and S. T. Yau, Opt. Express 14, 2644 (2006).
[CrossRef]

Zhang, Z.

Z. Zhang, IEEE Trans. Pattern Anal. Machine Intell. 22, 1330 (2000).
[CrossRef]

ACM Trans. Math. Softw.

M. I. A. Lourakis and A. A. Argyros, ACM Trans. Math. Softw. 36, 1 (2009).
[CrossRef]

IEEE Trans. Pattern Anal. Machine Intell.

Z. Zhang, IEEE Trans. Pattern Anal. Machine Intell. 22, 1330 (2000).
[CrossRef]

ISPRS J. Photogramm. Remote Sens.

T. Luhmann, ISPRS J. Photogramm. Remote Sens. 65, 558 (2010).
[CrossRef]

Opt. Eng.

W. Schreiber and G. Notni, Opt. Eng. 39, 159 (2000).
[CrossRef]

C. Reich, R. Ritter, and J. Thesing, Opt. Eng. 39, 224(2000).
[CrossRef]

S. Zhang and P. S. Huang, Opt. Eng. 45, 083601 (2006).
[CrossRef]

R. Legarda-Saenz, T. Bothe, and W. P. Jüptner, Opt. Eng. 43, 464 (2004).
[CrossRef]

Opt. Express

Opt. Laser Eng.

X. Su and W. Chen, Opt. Laser Eng. 42, 245 (2004).
[CrossRef]

Opt. Lett.

Proc. SPIE

C. Bräuer-Burchardt, Proc. SPIE 5962, 59620J (2005).
[CrossRef]

C. Bräuer-Burchardt, M. Möller, C. Munkelt, P. Kühmstedt, and G. Notni, Proc. SPIE 7830, 783019 (2010).
[CrossRef]

Other

K. B. Atkinson, Close Range Photogrammetry and Machine Vision (Whittles, 1996).

K. Madsen, H. B. Nielsen, and O. Tingleff, Methods for Non-Linear Least Squares Problems, 2nd ed. (Technical University of Denmark, 2004).

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