Abstract

The recently proposed dithering techniques could substantially improve measurement quality when fringes are wide, but offer limited improvement when fringes are narrow. This Letter presents a genetic algorithm to optimize the dithering technique for sinusoidal structured pattern representation. We believe both simulation and experimental results show that this proposed algorithm can substantially improve fringe quality for both narrow and wide fringe patterns.

© 2013 Optical Society of America

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References

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2012 (3)

W. Lohry and S. Zhang, Opt. Laser Eng. 50, 917 (2012).
[CrossRef]

A. Chatterjee, B. Tudu, and K. C. Paul, J. Visual Commun. Image Represent. 23, 1245 (2012).
[CrossRef]

Y. Wang and S. Zhang, Appl. Opt. 51, 6631 (2012).
[CrossRef]

2010 (5)

2001 (1)

2000 (2)

T. D. Kite, B. L. Evans, and A. C. Bovik, IEEE Int. Conf. Image Process. 9, 909 (2000).

T. Mantere and J. Alander, Proc. SPIE 4179, 297(2000).
[CrossRef]

1994 (1)

W. Purgathofer, R. Tobler, and M. Geiler, IEEE Int. Conf. Image Process. 2, 1032 (1994).

1973 (1)

B. Bayer, IEEE Int. Conf. Commun. 1, 11 (1973).

1964 (1)

T. L. Schuchman, IEEE Trans. Commun. Technol. 12, 162 (1964).
[CrossRef]

Ajubi, G. A.

Alander, J.

T. Mantere and J. Alander, Proc. SPIE 4179, 297(2000).
[CrossRef]

Ayubi, J. A.

Bayer, B.

B. Bayer, IEEE Int. Conf. Commun. 1, 11 (1973).

Bovik, A. C.

T. D. Kite, B. L. Evans, and A. C. Bovik, IEEE Int. Conf. Image Process. 9, 909 (2000).

Chatterjee, A.

A. Chatterjee, B. Tudu, and K. C. Paul, J. Visual Commun. Image Represent. 23, 1245 (2012).
[CrossRef]

Evans, B. L.

T. D. Kite, B. L. Evans, and A. C. Bovik, IEEE Int. Conf. Image Process. 9, 909 (2000).

Ferrari, J. A.

Floyd, R. W.

R. W. Floyd, Proceedings of Society Information Display (Lewis Winner, 1976), Vol. 17.

Geiler, M.

W. Purgathofer, R. Tobler, and M. Geiler, IEEE Int. Conf. Image Process. 2, 1032 (1994).

Kite, T. D.

T. D. Kite, B. L. Evans, and A. C. Bovik, IEEE Int. Conf. Image Process. 9, 909 (2000).

Lohry, W.

W. Lohry and S. Zhang, Opt. Laser Eng. 50, 917 (2012).
[CrossRef]

Mantere, T.

T. Mantere and J. Alander, Proc. SPIE 4179, 297(2000).
[CrossRef]

Martino, J. M. D.

Oliver, J.

Paul, K. C.

A. Chatterjee, B. Tudu, and K. C. Paul, J. Visual Commun. Image Represent. 23, 1245 (2012).
[CrossRef]

Purgathofer, W.

W. Purgathofer, R. Tobler, and M. Geiler, IEEE Int. Conf. Image Process. 2, 1032 (1994).

Schuchman, T. L.

T. L. Schuchman, IEEE Trans. Commun. Technol. 12, 162 (1964).
[CrossRef]

Spears, W. M.

W. M. Spears, Proceedings of Foundations Genetic Algorithms (1992), Vol. 2, p. 221.

Su, X.

Tobler, R.

W. Purgathofer, R. Tobler, and M. Geiler, IEEE Int. Conf. Image Process. 2, 1032 (1994).

Tudu, B.

A. Chatterjee, B. Tudu, and K. C. Paul, J. Visual Commun. Image Represent. 23, 1245 (2012).
[CrossRef]

van der Weide, D.

Wang, Y.

Whitley, D.

D. Whitley, Proceedings of the Third International Conference on Genetic Algorithms (M. Kaufmann, 1989), p. 116.

Xian, T.

Zhang, S.

Appl. Opt. (2)

IEEE Int. Conf. Commun. (1)

B. Bayer, IEEE Int. Conf. Commun. 1, 11 (1973).

IEEE Int. Conf. Image Process. (2)

T. D. Kite, B. L. Evans, and A. C. Bovik, IEEE Int. Conf. Image Process. 9, 909 (2000).

W. Purgathofer, R. Tobler, and M. Geiler, IEEE Int. Conf. Image Process. 2, 1032 (1994).

IEEE Trans. Commun. Technol. (1)

T. L. Schuchman, IEEE Trans. Commun. Technol. 12, 162 (1964).
[CrossRef]

J. Visual Commun. Image Represent. (1)

A. Chatterjee, B. Tudu, and K. C. Paul, J. Visual Commun. Image Represent. 23, 1245 (2012).
[CrossRef]

Opt. Express (1)

Opt. Laser Eng. (2)

S. Zhang, Opt. Laser Eng. 48, 149 (2010).
[CrossRef]

W. Lohry and S. Zhang, Opt. Laser Eng. 50, 917 (2012).
[CrossRef]

Opt. Lett. (3)

Proc. SPIE (1)

T. Mantere and J. Alander, Proc. SPIE 4179, 297(2000).
[CrossRef]

Other (3)

R. W. Floyd, Proceedings of Society Information Display (Lewis Winner, 1976), Vol. 17.

D. Whitley, Proceedings of the Third International Conference on Genetic Algorithms (M. Kaufmann, 1989), p. 116.

W. M. Spears, Proceedings of Foundations Genetic Algorithms (1992), Vol. 2, p. 221.

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Figures (4)

Fig. 1.
Fig. 1.

Crossover example. (a) Ideal pattern, (b) parent 1, (c) parent 2, (d) crossover from (b) to (c).

Fig. 2.
Fig. 2.

Patterns with different techniques: (a) ideal sinusoidal, (b) Bayer dithering, (c) error-diffusion dithering, (d) genetic optimized, (e) cross sections, and (f) cross sections of intensity difference maps.

Fig. 3.
Fig. 3.

Results with different dithering techniques. (a) and (b) Simulation results; (c) and (d) experimental results.

Fig. 4.
Fig. 4.

Measurement results of 3D statue using different techniques. (a) Photo of the object. (b) One of the squared binary patterns. (c)–(f) 3D results using the squared binary, the Bayer dithered, the error-diffusion dithered, and the genetic optimized dithered patterns.

Equations (2)

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f˜(i,j)=f(i,j)+k,lSh(k,l)e(ik,jl).
116[*7351].

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