Abstract
Heterogeneous III–V/Si integration with a compact optical vertical interconnect access is fabricated and the light coupling efficiency between the III–V/Si waveguide and the silicon nanophotonic waveguide is characterized. The III–V semiconductor material is directly bonded to the silicon-on-insulator (SOI) substrate and etched to form the III–V/Si waveguide for a higher light confinement in the active region. The compact optical vertical interconnect access is formed through tapering a III–V and an SOI layer in the same direction. The measured III–V/Si waveguide has a light coupling efficiency above to the silicon photonic layer with the tapering structure. This heterogeneous and light coupling structure can provide an efficient platform for photonic systems on chip, including passive and active devices.
© 2013 Optical Society of America
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