Abstract

We propose and fabricate a scheme that combines a two-dimensional (2D) grating coupler and a delay interferometer (DI) in a loop configuration. According to the polarization states, the 2D grating coupler first splits the input signals into two paths, which copropagate in the loop and share a common DI, and then combines the two paths together to the same input port. The proposed device is polarization insensitive and can be used for polarization division multiplexed (PDM) signal processing. For demonstration, the PDM non return-to-zero differential-phase-shift-keying signals can be demodulated successfully. The bit error ratio measurements show an error free operation, reflecting the good performance and the practicability of the proposed device.

© 2013 Optical Society of America

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2012 (6)

2011 (3)

C. R. Doerr and T. F. Taunay, IEEE Photon. Technol. Lett. 23, 597 (2011).
[CrossRef]

L. Zhou, T. Ye, and J. Chen, Opt. Express 19, 8023 (2011).

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

2010 (2)

2008 (1)

2007 (1)

2006 (1)

Y. Yu, X. Zhang, and D. Huang, IEEE Photon. Technol. Lett. 18, 2356 (2006).
[CrossRef]

2003 (1)

D. Taillaert, C. Harold, P. I. Borel, L. H. Frandsen, R. M. De La Rue, and R. Baets, IEEE Photon. Technol. Lett. 15, 1249 (2003).
[CrossRef]

1992 (1)

S. G. Evangelides, L. F. Mollenauer, J. P. Gordon, and N. S. Bergano, J. Lightwave Technol. 10, 28 (1992).
[CrossRef]

Ang, K. W.

Baets, R.

W. Bogaerts, D. Taillaert, P. Dumon, D. Van Thourhout, and R. Baets, Opt. Express 15, 1567 (2007).
[CrossRef]

D. Taillaert, C. Harold, P. I. Borel, L. H. Frandsen, R. M. De La Rue, and R. Baets, IEEE Photon. Technol. Lett. 15, 1249 (2003).
[CrossRef]

Bergano, N. S.

S. G. Evangelides, L. F. Mollenauer, J. P. Gordon, and N. S. Bergano, J. Lightwave Technol. 10, 28 (1992).
[CrossRef]

Bogaerts, W.

Bogoni, A.

Borel, P. I.

D. Taillaert, C. Harold, P. I. Borel, L. H. Frandsen, R. M. De La Rue, and R. Baets, IEEE Photon. Technol. Lett. 15, 1249 (2003).
[CrossRef]

Buhl, L.

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

Chandrasekhar, S.

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

C. R. Doerr, P. J. Winzer, Y. K. Chen, S. Chandrasekhar, M. S. Rasras, L. Chen, T. Y. Liow, K. W. Ang, and G. Q. Lo, J. Lightwave Technol. 28, 520 (2010).
[CrossRef]

Chen, J.

L. Zhou, T. Ye, and J. Chen, Opt. Express 19, 8023 (2011).

Chen, L.

Chen, Y. K.

Chen, Z.

Chralyvy, A.

A. Chralyvy, in ECOC, Vienna, Austria, 2009, paper 1.0.2.

De La Rue, R. M.

D. Taillaert, C. Harold, P. I. Borel, L. H. Frandsen, R. M. De La Rue, and R. Baets, IEEE Photon. Technol. Lett. 15, 1249 (2003).
[CrossRef]

Ding, Y.

Doerr, C. R.

C. R. Doerr and T. F. Taunay, IEEE Photon. Technol. Lett. 23, 597 (2011).
[CrossRef]

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

C. R. Doerr, P. J. Winzer, Y. K. Chen, S. Chandrasekhar, M. S. Rasras, L. Chen, T. Y. Liow, K. W. Ang, and G. Q. Lo, J. Lightwave Technol. 28, 520 (2010).
[CrossRef]

Dumon, P.

Evangelides, S. G.

S. G. Evangelides, L. F. Mollenauer, J. P. Gordon, and N. S. Bergano, J. Lightwave Technol. 10, 28 (1992).
[CrossRef]

Frandsen, L. H.

D. Taillaert, C. Harold, P. I. Borel, L. H. Frandsen, R. M. De La Rue, and R. Baets, IEEE Photon. Technol. Lett. 15, 1249 (2003).
[CrossRef]

Fukuda, H.

Fukuyama, H.

Gordon, J. P.

S. G. Evangelides, L. F. Mollenauer, J. P. Gordon, and N. S. Bergano, J. Lightwave Technol. 10, 28 (1992).
[CrossRef]

Harold, C.

D. Taillaert, C. Harold, P. I. Borel, L. H. Frandsen, R. M. De La Rue, and R. Baets, IEEE Photon. Technol. Lett. 15, 1249 (2003).
[CrossRef]

Hashimoto, T.

Houtsma, V.

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

Hu, S.

W. Wu, Y. Yu, S. Hu, B. Zou, and X. Zhang, IEEE Photon. Technol. Lett. 24, 1606 (2012).
[CrossRef]

Hu, T.

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

Huang, D.

Itabashi, S.-i.

Jiang, H.

Kasahara, R.

Liow, T. Y.

Liu, L.

Lo, G. Q.

Luo, B.

Mollenauer, L. F.

S. G. Evangelides, L. F. Mollenauer, J. P. Gordon, and N. S. Bergano, J. Lightwave Technol. 10, 28 (1992).
[CrossRef]

Murata, K.

Nakajima, F.

Nakanishi, Y.

Nasu, Y.

Neilson, D.

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

Nosaka, H.

Ou, H.

Pan, W.

Peucheret, C.

Pu, M.

Rasras, M. S.

Saida, T.

Sano, K.

Sauer, N.

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

Seoane, J.

Shinojima, H.

Taillaert, D.

W. Bogaerts, D. Taillaert, P. Dumon, D. Van Thourhout, and R. Baets, Opt. Express 15, 1567 (2007).
[CrossRef]

D. Taillaert, C. Harold, P. I. Borel, L. H. Frandsen, R. M. De La Rue, and R. Baets, IEEE Photon. Technol. Lett. 15, 1249 (2003).
[CrossRef]

Taunay, T. F.

C. R. Doerr and T. F. Taunay, IEEE Photon. Technol. Lett. 23, 597 (2011).
[CrossRef]

Tsuchizawa, T.

Tsunashima, S.

Van Thourhout, D.

Watanabe, T.

Weimann, N.

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

Willner, A.

Winzer, P. J.

P. J. Winzer, J. Lightwave Technol. 30, 3824 (2012).
[CrossRef]

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

C. R. Doerr, P. J. Winzer, Y. K. Chen, S. Chandrasekhar, M. S. Rasras, L. Chen, T. Y. Liow, K. W. Ang, and G. Q. Lo, J. Lightwave Technol. 28, 520 (2010).
[CrossRef]

Wu, W.

W. Wu, Y. Yu, S. Hu, B. Zou, and X. Zhang, IEEE Photon. Technol. Lett. 24, 1606 (2012).
[CrossRef]

Wu, X.

Xiang, L.

Xu, J.

Xu, Y.

Yamada, K.

Yamada, T.

Yan, L.

Yao, X.

Ye, J.

Ye, T.

L. Zhou, T. Ye, and J. Chen, Opt. Express 19, 8023 (2011).

Yi, A.

Yu, Y.

L. Xiang, Y. Xu, Y. Yu, and X. Zhang, J. Lightwave Technol. 30, 1595 (2012).
[CrossRef]

W. Wu, Y. Yu, S. Hu, B. Zou, and X. Zhang, IEEE Photon. Technol. Lett. 24, 1606 (2012).
[CrossRef]

Y. Yu, X. Zhang, and D. Huang, IEEE Photon. Technol. Lett. 18, 2356 (2006).
[CrossRef]

Zhang, L.

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

Zhang, X.

W. Wu, Y. Yu, S. Hu, B. Zou, and X. Zhang, IEEE Photon. Technol. Lett. 24, 1606 (2012).
[CrossRef]

L. Xiang, Y. Xu, Y. Yu, and X. Zhang, J. Lightwave Technol. 30, 1595 (2012).
[CrossRef]

Y. Ding, C. Peucheret, M. Pu, B. Zsigri, J. Seoane, L. Liu, J. Xu, H. Ou, X. Zhang, and D. Huang, Opt. Express 18, 21121 (2010).
[CrossRef]

Y. Yu, X. Zhang, and D. Huang, IEEE Photon. Technol. Lett. 18, 2356 (2006).
[CrossRef]

Zhou, L.

L. Zhou, T. Ye, and J. Chen, Opt. Express 19, 8023 (2011).

Zou, B.

W. Wu, Y. Yu, S. Hu, B. Zou, and X. Zhang, IEEE Photon. Technol. Lett. 24, 1606 (2012).
[CrossRef]

Zsigri, B.

IEEE Photon. Technol. Lett. (5)

C. R. Doerr, L. Zhang, P. J. Winzer, N. Weimann, V. Houtsma, T. Hu, N. Sauer, L. Buhl, D. Neilson, and S. Chandrasekhar, IEEE Photon. Technol. Lett. 23, 694 (2011).
[CrossRef]

W. Wu, Y. Yu, S. Hu, B. Zou, and X. Zhang, IEEE Photon. Technol. Lett. 24, 1606 (2012).
[CrossRef]

D. Taillaert, C. Harold, P. I. Borel, L. H. Frandsen, R. M. De La Rue, and R. Baets, IEEE Photon. Technol. Lett. 15, 1249 (2003).
[CrossRef]

C. R. Doerr and T. F. Taunay, IEEE Photon. Technol. Lett. 23, 597 (2011).
[CrossRef]

Y. Yu, X. Zhang, and D. Huang, IEEE Photon. Technol. Lett. 18, 2356 (2006).
[CrossRef]

J. Lightwave Technol. (5)

Opt. Express (5)

Opt. Lett. (1)

Other (1)

A. Chralyvy, in ECOC, Vienna, Austria, 2009, paper 1.0.2.

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Figures (8)

Fig. 1.
Fig. 1.

Principle of the proposed device.

Fig. 2.
Fig. 2.

Simulation results of three different input polarization signals coupled into the 2D grating coupler.

Fig. 3.
Fig. 3.

Layout of the fabricated device and the close up of the 2D grating coupler. Inset: (a) SEM top view of the 2D grating coupler and (b) SEM image of some of the holes.

Fig. 4.
Fig. 4.

(a) Simulated and (b) measured transmission spectra of the designed and fabricated device in two polarizations.

Fig. 5.
Fig. 5.

Experimental setup. CSA, communication signal analyzer; OSA, optical spectrum analyzer.

Fig. 6.
Fig. 6.

Measured spectra of the conversion.

Fig. 7.
Fig. 7.

Eye diagrams of (a) PDM NRZ-DPSK, (b) PDM PRZ, (c) X-pol PRZ, and (d) Y-pol PRZ.

Fig. 8.
Fig. 8.

Measured BER results.

Metrics